onsemi-NVTFS4C13NWFTAG

Part #onsemi-NVTFS4C13NWFTAG
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onsemi-NVTFS4C13NWFTAG
NVTFS4C13N  

MOSFET

– Powe
r
,
S
ingle  
N-Channel,
m
8FL  
30
V
,
9
.4 m
W
, 40 A  
Features  
•
Low R  
to Minimize Conduction Losses  
DS(on)  
•
Low Capacitance to Minimize Driver Losses  
•
Optimized Gate Charge to Minimize Switching Losses  
•
NVTFS4C13NWF
−
Wettable Flanks Product  
•
NVT Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC
−
Q101  
Qualified and PPAP Capable  
V
R
MAX  
I MAX  
D
(BR)DSS  
DS(ON)  
9.4 m
W
@ 10 V  
14 m
W
@ 4.5 V  
30 V  
40 A  
•
These Devices are Pb
−
Free, Halogen Free/BFR Free and are RoHS  
Compliant  
D (5,6)  
MAXIMUM RATINGS
(T =
 
25
°
C unless otherwise stated)  
J
Parameter  
Drain
−
to
−
Source Voltage  
Symbol Value Unit  
V
30  
20  
14  
V
V
A
DSS  
G (4)  
Gate
−
to
−
Source Voltage  
V
GS  
Continuous Drain  
Current R  
T =
 
25
°
C  
I
D
A
S (1,2,3)  
N
−
CHANNEL MOSFET  
q
JA  
T =
 
100
°
C  
A
10  
T =
 
25
°
C  
P
3.0  
1.5  
40  
W
Power Dissipation R  
q
A
D
JA  
MARKING DIAGRAM  
T =
 
100
°
C  
A
Steady  
State  
1
Continuous Drain  
T
C
= 25
°
C  
I
D
1
S
S
S
G
D
D
D
D
Current R  
q
JC  
XXXX  
AYWW
G  
G
WDFN8  
(
m
8FL)  
CASE 511AB  
T
C
= 100
°
C  
28  
A
Power Dissipation  
T
= 25
°
C  
P
D
26  
13  
W
C
R
q
JC  
T
C
= 100
°
C  
Pulsed Drain Current  
T =
 
25
°
C, t
 
= 10
m
s  
I
DM  
152  
A
A
p
4C13  
= Specific Device Code for  
NVMTS4C13N  
Operating Junction and Storage
T
e
mperature  
T ,  
−
55 to  
+175  
°
C  
J
stg  
T
13WF =
 
Specific Device Code of  
NVTFS4C13NWF  
A
Source Current (Body Diode)  
I
S
24  
10  
A
= Assembly Location  
=
Y
e
ar  
= Work Week  
Single Pulse Drain
−
to
−
Source Avalanche Energy  
E
AS  
mJ  
Y
(T =
 
25
°
C, I
 
= 14 A
 
, L = 0.1 mH)  
J
L
pk  
WW  
G
Lead
T
e
mperature for Soldering Purposes  
(1/8
″
from case for 10 s)  
T
L
260  
°
C  
= Pb
−
Free Package  
(Note: Microdot may be in either location)  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
ORDERING INFORMATION  
this data sheet.  
THERMAL RESISTANCE MAXIMUM RATINGS  
Parameter  
Symbol  
Value  
Unit  
Junction
−
to
−
Case
−
Steady State (Drain)  
R
5.8  
q
JC  
°
C/W  
Junction
−
to
−
Ambient – Steady State  
R
50  
q
JA  
1. The
 
entire application environment impacts the thermal resistance values  
shown, they are not constants and are only valid for the particular conditions  
noted.  
2
2. Surface
−
mounted on FR4 board using a 650 mm
 
2 oz. Cu pad.  
3. Assumes
 
heat
−
sink sufficiently large to maintain constant case temperature  
independent of device power.  
4. Continuous
 
DC current rating. Maximum current for pulses as long as  
1 second is higher but is dependent on pulse duration and duty cycle.  
©
Semiconductor Components Industries, LLC, 2017  
1
Publication Order Number:  
August, 2019
−
Rev. 2  
NVTFS4C13N/D  
 

NVTFS4C13N  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise specified)  
J
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Drain
−
to
−
Source Breakdown Voltage  
V
V
GS  
= 0
V
, I
 
=
2
50
m
A  
30  
V
(BR)DSS  
D
Drain
−
to
−
Source Breakdown Voltage  
T
e
mperature Coefficient  
V
/
14.9  
(BR)DSS  
mV/
°
C  
T
J
Zero Gate Voltage Drain Current  
I
V
= 0
V
,  
= 24 V  
T =
 
25
°
C  
1.0  
10  
DSS  
GS  
DS  
J
V
m
A  
T =
 
125
°
C  
J
Gate
−
to
−
Source Leakage Current  
ON CHARACTERISTICS

Gate Threshold Voltage  
I
V
= 0
V
, V  
=
GS  
20 V  
100  
nA  
GSS  
DS  
V
V
= V
 
, I
 
= 250
m
A  
1.3  
2.1  
V
GS(TH)  
GS  
DS  
D
Negative Threshold
T
e
mperature Coefficient  
Drain
−
to
−
Source On Resistance  
V
/T  
4.8  
7.5  
11.2  
40  
mV/
°
C  
GS(TH)  
J
R
V
= 10 V  
I
I
= 30 A  
= 12 A  
9.4  
14  
DS(on)  
GS  
D
m
W  
V
GS  
= 4.5 V  
D
Forward Transconductance  
Gate Resistance  
g
FS  
V
= 1.5
V
, I
 
=
1
5 A  
S
DS  
D
R
T =
 
25
°
C  
A
1.0  
W
G
CHARGES AND CAPACITANCES  
Input Capacitance  
C
770  
443  
127  
0.165  
7.8  
ISS  
Output Capacitance  
C
V
= 0
V
, f = 1
M
Hz, V
 
= 15 V  
pF  
nC  
OSS  
RSS  
GS  
DS  
Reverse Transfer Capacitance  
Capacitance Ratio  
C
C
/C  
V
GS  
= 0
V
, V
 
=
1
5
V
, f = 1
M
Hz  
RSS ISS  
DS  
T
o
tal Gate Charge  
Q
G(TOT)  
Threshold Gate Charge  
Gate
−
to
−
Source Charge  
Gate
−
to
−
Drain Charge  
Gate Plateau Voltage  
T
o
tal Gate Charge  
Q
1.4  
G(TH)  
Q
2.9  
V
= 4.5
V
, V
 
=
1
5 V; I
 
= 30 A  
GS  
GD  
GP  
GS  
DS  
D
Q
V
3.7  
3.6  
V
Q
V
= 10
V
, V
 
=
1
5 V; I
 
= 30 A  
15.2  
nC  
G(TOT)  
GS  
DS  
D
SWITCHING CHARACTERISTICS

Turn
−
On Delay Time  
Rise Time  
t
9
d(ON)  
t
r
35  
13  
5
V
= 4.5
V
, V
 
=
1
5
V
,  
DS  
GS  
D
ns  
ns  
V
I
= 15 A, R
 
= 3.0
W  
G
Turn
−
Off Delay Time  
Fall Time  
t
d(OFF)  
t
f
Turn
−
On Delay Time  
Rise Time  
t
6.0  
26  
16  
3.0  
d(ON)  
t
r
V
= 10
V
, V
 
=
1
5
V
,  
DS  
GS  
I
D
= 15 A, R
 
= 3.0
W  
G
Turn
−
Off Delay Time  
Fall Time  
t
d(OFF)  
t
f
DRAIN
−
SOURCE DIODE CHARACTERISTICS  
Forward Diode Voltage  
V
SD  
T =
 
25
°
C  
0.82  
0.69  
23.4  
12.1  
11.3  
9.7  
1.1  
J
V
S
= 0
V
,  
= 30 A  
GS  
I
T =
 
125
°
C  
J
Reverse Recovery Time  
Charge Time  
t
RR  
t
a
ns  
V
= 0
V
,
d
IS/dt = 100 A/
m
s,  
GS  
I
S
= 30 A  
Discharge Time  
t
b
Reverse Recovery Charge  
Q
nC  
RR  
5. Pulse
 
T
e
st: pulse width
v
300
m
s, duty cycle
v
2%.  
6. Switching
 
characteristics are independent of operating junction temperatures.  
2
 

NVTFS4C13N  
TYPICAL CHARACTERISTICS  
70  
70  
60  
50  
40  
30  
20  
10  
0
10 V  
6.5 V  
V
DS  
= 5 V  
4.5 V  
60  
50  
40  
30  
20  
10  
0
4.2 V  
4 V  
3.8 V  
3.6 V  
3.4 V  
3.2 V  
T =
 
125
°
C  
J
3.0 V  
2.8 V  
T =
 
25
°
C  
J
T =
 
−
55
°
C  
J
T =
 
25
°
C  
J
0
1
2
3
4
5
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
V
DS  
, DRAIN
−
TO
−
SOURCE VOLTAGE (V)  
V
GS  
, GATE
−
TO
−
SOURCE VOLTAGE (V)  
Figure 1. On
−
Region Characteristics  
Figure 2. Transfer Characteristics  
0.015  
0.014  
0.013  
0.012  
0.011  
0.010  
0.009  
0.008  
0.007  
0.006  
0.022  
0.020  
0.018  
0.016  
0.014  
0.012  
0.010  
0.008  
0.006  
I
D
= 30 A  
T =
 
25
°
C  
J
V
= 4.5 V  
GS  
V
= 10 V  
GS  
3.0  
4.0  
5.0  
6.0  
7.0  
8.0  
9.0  
10  
10  
20  
30  
40  
50  
60  
70  
V
GS  
, GATE
−
TO
−
SOURCE VOLTAGE (V)  
I ,
 
DRAIN CURRENT (A)  
D
Figure 3. On
−
Resistance vs. V

GS  

Figure 4. On
−
Resistance vs. Drain Current and  
Gate Voltage  
10000  
1000  
100  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I
V
= 30 A  
V
GS  
= 0 V  
D
= 10 V  
GS  
T =
 
150
°
C  
J
T =
 
125
°
C  
J
T =
 
85
°
C  
J
10  
−
50
−
25  
0
25  
50  
75  
100 125 150 175  
5
10  
15  
20  
25  
30  
T , JUNCTION TEMPERATURE (
°
C)  
J
V
, DRAIN
−
TO
−
SOURCE VOLTAGE (V)  
DS  
Figure 5. On
−
Resistance Variation with  
Figure 6. Drain
−
to
−
Source Leakage Current  
Temperature  
vs. Voltage  
3

NVTFS4C13N  
TYPICAL CHARACTERISTICS  
1000  
900  
800  
700  
600  
500  
400  
300  
200  
100  
0
11  
V
= 0 V  
GS  
10  
9
8
7
6
5
4
3
2
1
0
Q
T
T =
 
25
°
C  
J
C
iss  
C
oss  
Q
gd  
T =
 
25
°
C  
J
Q
gs  
V
V
= 15 V  
= 10 V  
C
DD  
rss  
GS  
I
D
= 30 A  
0
5
10  
15  
20  
25  
30  
0
2
4
6
8
10  
12  
14  
16  
V
DS  
, DRAIN
−
TO
−
SOURCE VOLTAGE (V)  
Q ,
 
TOTAL GATE CHARGE (nC)  
g
Figure 7. Capacitance Variation  
Figure 8. Gate
−
to
−
Source and  
Drain
−
to
−
Source Voltage vs. Total Charge  
1000  
100  
10  
30  
25  
20  
15  
10  
5
V =
 
0 V  
GS  
V
= 15 V  
= 15 A  
= 10 V  
DD  
I
D
V
GS  
T =
 
25
°
C  
J
t
r
t
d(off)  
T =
 
125
°
C  
J
t
d(on)  
t
f
1
0
1
10  
R ,
 
GATE RESISTANCE (
W
)  
100  
0.4  
0.5  
0.6  
0.7  
0.8  
0.9  
1.0  
V
SD  
, SOURCE
−
TO
−
DRAIN VOLTAGE (V)  
G
Figure 9. Resistive Switching Time Variation  
vs. Gate Resistance  
Figure 10. Diode Forward Voltage vs. Current  
100  
10  
1
10
m
s  
100
m
s  
1 ms  
V
GS  
= 10 V  
T
= 25
°
C  
C
dc  
2
650 mm
 
2 oz Cu Pad  
10 ms  
0.1  
R
Limit  
DS(on)  
Thermal Limit  
Package Limit  
0.01  
0.1  
1
10  
100  
V
DS  
, DRAIN
−
TO
−
SOURCE VOLTAGE (V)  
Figure 11. Maximum Rated Forward Biased  
Safe Operating Area  
4

NVTFS4C13N  
TYPICAL CHARACTERISTICS  
100  
10  
Duty Cycle = 50%  
20%  
10%  
5%  
2%  
1
1%  
0.1  
0.01  
Single Pulse  
0.000001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
PULSE TIME (sec)  
Figure 12. Thermal Response  
100  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
T
= 25
°
C  
J(initial)  
10  
T
= 125
°
C  
1.0E
−
05  
J(initial)  
1
1.0E
−
06  
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65 70  
(A)  
1.0E
−
04  
1.E
−
03  
I
D
T ,
 
TIME IN AVALANCHE (s)  
AV  
Figure 13. G

FS

vs. I

D  

Figure 14. Avalanche Characteristics  
ORDERING INFORMATION  
Device  
†
Package  
Shipping  
NVTFS4C13NTAG  
WDFN8  
1500 /
T
a
pe & Reel  
1500 /
T
a
pe & Reel  
5000 /
T
a
pe & Reel  
5000 /
T
a
pe & Reel  
(Pb
−
Free)  
NVTFS4C13NWFTAG  
NVTFS4C13NTWG  
WDFN8  
(Pb
−
Free)  
WDFN8  
(Pb
−
Free)  
NVTFS4C13NWFTWG  
WDFN8  
(Pb
−
Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
5

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
WDFN8 3.3×3.3, 0.65P  
CASE 511AB  
ISSUE D  
1
DATE 23 APR 2012  
SCALE 2:1  
2X  
NOTES:  
0.20  
C
1. DIMENSIONING
 
AND TOLERANCING PER ASME Y14.5M, 1994.  
2. CONTROLLING
 
DIMENSION: MILLIMETERS.  
3. DIMENSION
 
D1 AND E1 DO NOT INCLUDE MOLD FLASH  
PROTRUSIONS OR GATE BURRS.  
D
A
B
E
2X  
D1  
MILLIMETERS  
INCHES  
NOM  
0.030  
−−−  
0.012  
0.20  
C
8
1
7
6
5
4
DIM  
A
A1  
b
c
MIN  
0.70  
0.00  
0.23  
0.15  
NOM  
0.75  
−−−  
0.30  
0.20  
MAX  
MIN  
MAX  
0.031  
0.002  
0.016  
0.010  
0.80  
0.05  
0.40  
0.25  
0.028  
0.000  
0.009  
0.006  
4X  
q
E1  
0.008  
D
3.30 BSC  
3.05  
2.11  
3.30 BSC  
3.05  
1.60  
0.30  
0.65 BSC  
0.41  
0.80  
0.43  
0.130 BSC  
0.120  
0.083  
0.130 BSC  
0.120  
0.063  
0.012  
0.026 BSC  
0.016  
0.032  
0.017  
0.005  
0.059  
−−−  
D1  
D2  
E
E1  
E2  
E3  
e
G
K
L
L1  
M
2.95  
1.98  
3.15  
2.24  
0.116  
0.078  
0.124  
0.088  
c
2
3
A1  
TOP VIEW  
2.95  
1.47  
0.23  
3.15  
1.73  
0.40  
0.116  
0.058  
0.009  
0.124  
0.068  
0.016  
0.10  
0.10  
C
C
A
C
6X  
e
0.012  
0.026  
0.012  
0.002  
0.055  
0
0.020  
0.037  
0.022  
0.008  
0.063  
0.30  
0.65  
0.30  
0.06  
1.40  
0
0.51  
0.95  
0.56  
0.20  
1.60  
SEATING  
PLANE  
0.13  
1.50  
−−−  
DETAIL A  
SIDE VIEW  
DETAIL A  
q
12  
12  
_
_
_
_

8X

b  
0.10  
0.05  
C
C
A
B
SOLDERING FOOTPRINT*  
8X  
e/2  
0.42  
0.65  
4X  
L
4X  
0.66  
PITCH  
1
8
4
5
PACKAGE  
OUTLINE  
K
E2  
M
E3  
3.60  
L1  
D2  
G
2.30  
BOTTOM VIEW  
0.57  
0.47  
0.75  
GENERIC  
MARKING DIAGRAM*  
2.37  
3.46  
1
XXXXX  
DIMENSION: MILLIMETERS  
AYWW
G  
*For additional information on our Pb
−
Free strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting
T
e
chniques Reference Manual, SOLDERRM/D.  
G
XXXXX =
 
Specific Device Code  
A
Y
= Assembly Location  
=
Y
e
ar  
WW  
G
= Work Week  
= Pb
−
Free Package  
*This information is generic. Please refer  
to device data sheet for actual part  
marking.  
Pb
−
Free indicator, “G” or microdot “
G
”,  
may or may not be present.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON30561E  
WDFN8 3.3X3.3, 0.65P  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

onsemi
,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “
onsemi
” or its affiliates  
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onsemi
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.
onsemi
reserves the right to make changes at any time to any  
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−
is” and
onsemi
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onsemi
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onsemi
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vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts.
onsemi
does not convey any license  
under any of its intellectual property rights nor the rights of others.
onsemi
products are not designed, intended, or authorized for use as a critical component in life support systems  
or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should  
Buyer purchase or use
onsemi
products for any such unintended or unauthorized application, Buyer shall indemnify and hold
onsemi
and its officers, employees, subsidiaries, affiliates,  
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death  
associated with such unintended or unauthorized use, even if such claim alleges that
onsemi
was negligent regarding the design or manufacture of the part.
onsemi
is an Equal  
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
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