PIP-PIP8205-Z6
| Part # | PIP-PIP8205-Z6 |
| Download | PIP-PIP8205-Z6 |
PIP8205
20V N-Channel MOSFET
General Features
BV
DSS
20V
Test Conditions
I
D
R
DS(ON),max.m
R
DS(ON),typ.m
V
GS
=10V, I
D
=5.0A
V
GS
=4.5V, I
D
=4.5A
V
GS
=2.5V, I
D
=3.0A
20
22
28
16
18
22
‹
‹
Proprietary New Trench
T
e
chnology
Low Gate Charge Minimize Switching
Loss
7A
‹
Fast Recovery Body Diode
Applications
‹
‹
‹
High efficiency DC/DC Converters
Motor Bridge Switch
Oring FET/Load Switching
TSSOP-8
Ordering Information
SOT-23-6
Marking
8205
Part Number
PIP8205-S8
PIP8205-Z6
Package
TSSOP-8
SOT-23-6
Brand
8205
TSSOP-8 & SOT-23-6 Definition and Inner Circuit
Absolute Maximum Ratings
T
C
=25 unless
otherwise specified
Symbol
V
DSS
V
GSS
I
D
Parameter
8205
Unit
Drain-to-Source Voltage
[1]
Gate-to-Source Voltage
20
±12
7.0
28
V
Continuous Drain Current
T
A
=25
Pulsed Drain Current at V
GS
=10V
Power Dissipation
T
A
=25
A
I
DM
Pd
1.5
W
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10
seconds, Package Body for 10 seconds
T
L
T
PAK
300
260
T
J
& T
STG
Operating and Storage Temperature Range
-55 to 150
Caution: Stresses greater than those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device.
Thermal Characteristics
Symbol
Parameter
8205
Unit
R
θJA
Thermal Resistance, Junction-to-Ambient
110
/W
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 1 / 9
Rev. A.2018
PIP8205
Electrical Characteristics
OFF Characteristics
T
J
=25 unless
otherwise specified
Symbol
Parameter
Min. Typ. Max. Unit
Test Conditions
BV
DSS
Drain-to-Source Breakdown Voltage
20
—
—
—
—
1
V
V
GS
=0V, I
D
=250uA
V
DS
=20V, V
GS
=0V
V
DS
=16V, V
GS
=0V,
T
J
=125
I
DSS
Drain-to-Source Leakage Current
Gate-to-Source Leakage Current
uA
—
—
100
—
—
—
—
+100
-100
V
GS
=+12V, V
DS
=0V
V
GS
=-12V, V
DS
=0V
I
GSS
nA
ON Characteristics
Symbol
T
J
=25
unless otherwise specified
Parameter
Min. Typ. Max. Unit
Test Conditions
—
—
—
16
18
22
20
22
28
V
GS
=10V, I
D
=5.0A
V
GS
=4.5V, I
D
=4.5A
V
GS
=2.5V, I
D
=3.0A
Static Drain-to-Source
On-Resistance
R
DS(ON)
mΩ
V
V
GS(TH)
Gate Threshold Voltage
0.5
—
1.0
V
DS
=V
GS
, I
D
=250uA
Dynamic Characteristics
Essentially independent of operating temperature
Symbol
Parameter
Min. Typ. Max. Unit
Test Conditions
C
iss
Input Capacitance
—
—
—
—
—
—
900
100
220
12
—
—
—
—
—
—
V
GS
=0V,
V
DS
=10V,
f=1.0MH
Z
C
rss
Reverse Transfer Capacitance
Output Capacitance
pF
nC
C
oss
Q
g
Total Gate Charge
V
DD
=10V,
I
D
=6A,
Vgs=4.5V
Q
gs
Q
gd
Gate-to-Source Charge
Gate-to-Drain (Miller) Charge
2.3
1
Resistive Switching Characteristics
Essentially independent of operating temperature
Symbol
Parameter
Min. Typ. Max. Unit
Test Conditions
t
d(ON)
Turn-on Delay Time
—
—
—
—
10
11
35
30
—
—
—
—
V
DD
=10V
V
GS
= 4.5V
I
D
=6A,
t
t
t
rise
Rise Time
nS
d(OFF)
fall
Turn-Off Delay Time
Fall Time
R
G
=6.0
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 2 / 9
Rev. A.2018
PIP8205
Source-Drain Body Diode Characteristics
T
J
=25
unless otherwise specified
Symbol
Parameter
Min
Typ. Max. Unit
Test Conditions
I
SD
Continuous Source Current
—
—
—
—
7
Integral PN-diode in
MOSFET
A
V
I
SM
Pulsed Source Current
Diode Forward Voltage
—
—
28
V
SD
1.2
I
S
=6A, V
GS
=0V
Note:
[1] T
J
=+25 to
+150
[2] Silicon limited current only.
[3] Package limited current.
[4] Repetitive rating; pulse width limited by maximum junction temperature.
[5] Pulse width≤380µs; duty cycle≤2%.
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 3 / 9
Rev. A.2018
PIP8205
Typical Characteristics
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Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 4 / 9
Rev. A.2018
PIP8205
Typical Characteristics
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 5 / 9
Rev. A.2018
PIP8205
Typical Characteristics
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Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 6 / 9
Rev. A.2018
PIP8205
Test Circuits and
Waveforms
Fig. 1.1 Peak Diode Recovery dv/dt Test Circuit
Fig. 1.2 Peak Diode Recovery dv/dt Waveforms
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 7 / 9
Rev. A.2018
PIP8205
Test Circuits and
Waveforms
(Cont.)
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 8 / 9
Rev. A.2018
PIP8205
Disclaimers:
Perfect Intelligent Power Semiconductor Co., Ltd (PIP) reserves the right to make changes without notice in order to improve
reliability, function or design and to discontinue any product or service without notice. Customers should obtain the latest
relevant information before orders and should verify that such information is current and complete. All products are sold subject
to PIP’s terms and conditions supplied at the time of order acknowledgement.
Perfect Intelligent Power Semiconductor Co., Ltd warrants performance of its hardware products to the specifications at the time
of sale, Testing, reliability and quality control are used to the extent PIP deems necessary to support this warrantee. Except where
agreed upon by contractual agreement, testing of all parameters of each product is not necessarily performed.
Perfect Intelligent Power Semiconductor Co., Ltd does not assume any liability arising from the use of any product or circuit
designs described herein. Customers are responsible for their products and applications using PIP’s components. To minimize
risk, customers must provide adequate design and operating safeguards.
Perfect Intelligent Power Semiconductor Co., Ltd does not warrant or convey any license either expressed or implied under its
patent rights, nor the rights of others. Reproduction of information in PIP’s data sheets or data books is permissible only if
reproduction is without modification or alteration. Reproduction of this information with any alteration is an unfair and deceptive
business practice. Perfect Intelligent Power Semiconductor Co., Ltd is not responsible or liable for such altered documentation.
Resale of PIP’s products with statements different from or beyond the parameters stated by Perfect Intelligent Power
Semiconductor Co., Ltd for that product or service voids all express or implied warrantees for the associated PIP’s product or
service and is unfair and deceptive business practice. Perfect Intelligent Power Semiconductor Co., Ltd is not responsible or liable
for any such statements.
Life Support
Policy:
Perfect Intelligent Power Semiconductor Co., Ltd’s products are not authorized for use as critical components in life support
devices or systems without the expressed written approval of Perfect Intelligent Power Semiconductor Co., Ltd.
As used herein:
1. Life support devices or systems are devices or systems which:
a. are intended for surgical implant into the human body,
b. support or sustain life,
c. whose failure to perform when properly used in accordance with instructions
for used provided in the labeling, can be reasonably expected to result in significant
injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
©2018 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.
Page 9 / 9
Rev. A.2018
