PIP-PTA26N65

Part #PIP-PTA26N65
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PIP-PTA26N65
PTA26N65  
650V N-Channel MOSFET  
General Features  
BV

DSS  

650V  
R

DS(ON),typ.  

280mΩ  
I

D  

‹
‹
‹
‹
Advanced Planar Process  
26A  
R

DS(ON),typ.

=280 mΩ@V

GS

=10V  
Low Gate Charge Minimize Switching Loss  
Rugged Poly silicon Gate Structure  
Applications  
‹
‹
‹
BLDC Motor Driver  
Electric Welder  
High Efficiency SMPS  
G
D
S
Ordering Information  
Part Number  
Package  
Brand  
TO-220F Package  
PTA26N65  
TO-220F  
Absolute Maximum Ratings  
T

C

=25  
unless otherwise specified  
Symbol  
V

DSS  

V

GSS  

Parameter  
PTA26N65  
Unit  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
Continuous Drain Current  
650  
±30  
26  
V
A
I

D  

Continuous Drain Current @ Tc=100  
Pulsed Drain Current at V

GS

=10V

[2,4]  

Single Pulse Avalanche Energy  
Peak Diode Recovery dv/dt

[3]  

Power Dissipation  
17  
I

DM  

104  
1000  
5.0  
E

AS  

dv/dt  
mJ  
V/ns  
W
82  
P

D  

Derating Factor above 25  
0.66  
W/  
Maximum Temperature for Soldering  
Leads at 0.063in (1.6mm) from Case for 10  
seconds, Package Body for 10 seconds  
T

L  

T

PAK  

300  
260  
T

J

& T

STG  

Operating and Storage Temperature Range  
-55 to 150  
Caution: Stresses greater than those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device.  
Thermal Characteristics  
Symbol  
Parameter  
PTA26N65  
Unit  
R

θJC  

Thermal Resistance, Junction-to-Case  
1.52  
/W  
R

θJA  

Thermal Resistance, Junction-to-Ambient  
100  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 1 / 9  
Rev. A.2019  

PTA26N65  
Electrical Characteristics  
OFF Characteristics
 
T

J

=25 unless
 
otherwise specified  
Symbol  
Parameter  
Min. Typ. Max. Unit  
Test Conditions  
BV

DSS  

Drain-to-Source Breakdown Voltage  
650  
—  
—  
V
V

GS

=0V, I

D

=250uA  
—  
—  
—  
—  
—  
—  
—  
—  
1
V

DS

=650V, V

GS

=0V  
I

DSS  

Drain-to-Source Leakage Current  
Gate-to-Source Leakage Current  
uA  
V

DS

=520V, V

GS

=0V,  
T

J

=125  
125  
+100  
-100  
V

GS

=+30V, V

DS

=0V  
V

GS

=-30V, V

DS

=0V  
I

GSS  

nA  
ON Characteristics  
Symbol  
T

J

=25  
unless otherwise specified  
Parameter  
Min. Typ. Max. Unit  
Test Conditions  
Static Drain-to-Source  
On-Resistance  
R

DS(ON)  

V

GS(TH)  

—  
2.0  
—  
280  
—  
380  
4.0  
—  
mΩ  
V
V

GS

=10V, I

D

=13A  
Gate Threshold Voltage  
V

DS

=V

GS

, I

D

=250uA  
g
FS  
Forward Transconductance  
32  
S
V
DS
=25V, I
 
=13A  
D
Dynamic Characteristics  
Essentially independent of operating temperature  
Symbol  
Parameter  
Min. Typ. Max. Unit  
Test Conditions  
C

iss  

Input Capacitance  
—  
—  
—  
—  
—  
—  
4.20  
0.20  
1.40  
78  
—  
—  
—  
—  
—  
—  
V

GS

=0V,  
V

DS

=25V,  
f=1.0MH

Z  

C

rss  

C

oss  

Q

g  

Reverse Transfer Capacitance  
Output Capacitance  
nF  
nC  
Total Gate Charge  
V

DD

=325V,  
I

D

=26A, V

GS

=0 to 10V  
Q

gs  

Q

gd  

Gate-to-Source Charge  
Gate-to-Drain (Miller) Charge  
21  
20  
Resistive Switching Characteristics  
Essentially independent of operating temperature  
Symbol  
Parameter  
Min. Typ. Max. Unit  
Test Conditions  
t
d(ON)  
Turn-on Delay Time  
—  
—  
—  
—  
30  
60  
55  
65  
—  
—  
—  
—  
V

DD

=325V,  
I

D

=13A,  
V

GS

= 10V  
t
t
t
rise  
Rise Time  
nS  
d(OFF)  
fall  
Turn-Off Delay Time  
Fall Time  
R
G
=10Ω  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 2 / 9  
Rev. A.2019  

PTA26N65  
Source-Drain Body Diode Characteristics  
T

J

=25  
unless otherwise specified  
Symbol  
I

SD  

Parameter  
Continuous Source Current

[2]  

Pulsed Source Current

[2]  

Min  
Typ. Max. Unit  
Test Conditions  
—  
—  
—  
—  
26  
Integral PN-diode in  
MOSFET  
A
I

SM  

104  
V

SD  

trr  
Diode Forward Voltage  
Reverse recovery time  
Reverse recovery charge  
—  
—  
—  
—  
1.5  
—  
V
I

S

=26A, V

GS

=0V  
600  
5.5  
ns  
uC  
V

GS

=0V ,I
F
=26A,  
di
F
/dt=100A/µs  
Qrr  
—  
Note:  
[1] T

J

=+25 to
 
+150  
[2] Silicon limited current only.  
[3] Package limited current.  
[4] Repetitive rating; pulse width limited by maximum junction temperature.  
[5] Pulse width≤380ꢀs; duty cycle≤2%.  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 3 / 9  
Rev. A.2019  

PTA26N65  
Typical Characteristics  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 4 / 9  
Rev. A.2019  

PTA26N65  
Typical Characteristics
(Cont.)  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 5 / 9  
Rev. A.2019  

PTA26N65  
Typical Characteristics
(Cont.)  
Vdd=325
V
,
I
d=26A  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 6 / 9  
Rev. A.2019  

PTA26N65  
Test Circuits and
Waveforms  
Fig. 1.1 Peak Diode Recovery dv/dt Test Circuit  
Fig. 1.2 Peak Diode Recovery dv/dt Waveforms  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 7 / 9  
Rev. A.2019  

PTA26N65  
Test Circuits and
Waveforms
(Cont.)  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 8 / 9  
Rev. A.2019  

PTA26N65  
Disclaimers:  
Perfect Intelligent Power Semiconductor Co., Ltd (PIP) reserves the right to make changes without notice in order to improve  
reliability, function or design and to discontinue any product or service without notice. Customers should obtain the latest  
relevant information before orders and should verify that such information is current and complete. All products are sold subject  
to PIP’s terms and conditions supplied at the time of order acknowledgement.  
Perfect Intelligent Power Semiconductor Co., Ltd warrants performance of its hardware products to the specifications at the time  
of sale, Testing, reliability and quality control are used to the extent PIP deems necessary to support this warrantee. Except where  
agreed upon by contractual agreement, testing of all parameters of each product is not necessarily performed.  
Perfect Intelligent Power Semiconductor Co., Ltd does not assume any liability arising from the use of any product or circuit  
designs described herein. Customers are responsible for their products and applications using PIP’s components. To minimize  
risk, customers must provide adequate design and operating safeguards.  
Perfect Intelligent Power Semiconductor Co., Ltd does not warrant or convey any license either expressed or implied under its  
patent rights, nor the rights of others. Reproduction of information in PIP’s data sheets or data books is permissible only if  
reproduction is without modification or alteration. Reproduction of this information with any alteration is an unfair and deceptive  
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Semiconductor Co., Ltd for that product or service voids all express or implied warrantees for the associated PIP’s product or  
service and is unfair and deceptive business practice. Perfect Intelligent Power Semiconductor Co., Ltd is not responsible or liable  
for any such statements.  
Life Support
Policy:  
Perfect Intelligent Power Semiconductor Co., Ltd’s products are not authorized for use as critical components in life support  
devices or systems without the expressed written approval of Perfect Intelligent Power Semiconductor Co., Ltd.  
As used herein:  
1. Life support devices or systems are devices or systems which:  
a. are intended for surgical implant into the human body,  
b. support or sustain life,  
c. whose failure to perform when properly used in accordance with instructions  
for used provided in the labeling, can be reasonably expected to result in significant  
injury to the user.  
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably  
expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.  
©2019 Perfect Intelligent Power Semiconductor Co., Ltd. All rights reserved. Information and data in this document are owned by PIP  
Semiconductors and may not be edited, reproduced, or redistributed in any way without written consent from PI
P
.  
Page 9 / 9  
Rev. A.2019