PUOLOP-PTD4N60

Part #PUOLOP-PTD4N60
Download 
PUOLOP-PTD4N60
PTD4N60  
N-Channel MOSFET  
Features  
{
2. Drain  
Symbol  
■
R  
(Max 2.5
Ω
)@V =10V  
DS(on)  
GS  
●
■
Gate Charge (Typical 15nC)  
◀
■
Improved dv/dt Capability, High Ruggedness  
■
100% Avalanche
T
e
sted  
▲
●
●
1. Gate  
{
■
Maximum Junction
T
e
mperature Range (150°C)  
3. Source  
{
TO-252(D-PAK)  
2
1
3
Absolute Maximum Ratings  
Symbol  
Parameter  
Value  
600  
Units  
V

DSS  

Drain to Source Voltage  
V
A
Continuous Drain Current(@T

C

= 25
°C)  
2.8  
I

D  

Continuous Drain Current(@T

C

= 100
°C)  
Drain Current Pulsed  
1.8  
A
A
V
I

DM  

(Note 1)  
11.2  
V

GS  

Gate to Source Voltage  
±
30  
218  
E

AS  

E

AR  

Single Pulsed Avalanche Energy  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
(Note 2)  
(Note 1)  
(Note 3)  
mJ  
mJ  
4.9  
dv/dt  
4.5  
V/ns  
W
T
o
tal Power Dissipation(@T

C

= 25 °C)  
49  
P

D  

Derating Factor above 25 °C  
0.39  
W/°C  
°C  
T

ST
G
,

T

J  

Operating Junction
T
e
mperature & Storage
T
e
mperature  
– 55 ~ 150  
Maximum Lead
T
e
mperature for soldering purpose,  
1/8 from Case for 5 seconds.  
T

L  

300  
°C  
Thermal Characteristics  
Value  
Symbol  
Parameter  
Units  
Min.  
Typ.  
Max.  
2.56  
50  
R

θ
JC  

R

θ
JA  

R

θ
JA  

Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient*  
Thermal Resistance, Junction-to-Ambient  
–
–
–
–
–
–
°C/W  
°C/W  
°C/W  
110  
* When mounted on the minimum pad size recommended (PCB Mount)  
– 1 –  
2012-7-8  

PTD4N60  
Electrical Characteristics
 

( T

C

= 25 °C unless otherwise noted )  
Symbol  
Off Characteristics  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
BV

DSS  

V

GS

= 0V, I

D

= 250uA  
I

D

= 250uA, referenced to 25 °C  
Drain-Source Breakdown Voltage  
600  
–
–
–
–
V
Δ
BV

DSS  

/
Breakdown Voltage
T
e
mperature  
coefficient  
0.6  
V/°C  
Δ
T

J  

V

DS

= 600V, V

GS

= 0V  
–
–
–
–
–
–
–
–
10  
uA  
uA  
nA  
nA  
I

DSS  

Drain-Source Leakage Current  
V

DS

= 480V, T

C

= 125 °C  
100  
100  
-100  
V
V

GS

= 30V,
 
V

DS

= 0V  

GS

= -30V,
 
V

DS

= 0V  
Gate-Source Leakage, Forward  
Gate-source Leakage, Reverse  
I

GSS  

On Characteristics  
V

GS(th)  

V

DS

= V

GS

, I

D

= 250uA  
V

GS

=10
V
,
I

D

= 1.4A  
Gate Threshold Voltage  
2.0  
–
–
4.0  
2.5  
V
Static Drain-Source On-state Resis-  
tance  
R

DS(ON)  

2.0  
Ω
Dynamic Characteristics  
C

iss  

Input Capacitance  
–
–
–
545  
60  
8
710  
80  
pF  
C

oss  

C

rss  

Output Capacitance  
V

GS

=0 V, V

DS

=25
V
, f =
1
MHz  
Reverse Transfer Capacitance  
11  
Dynamic Characteristics  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-on Delay Time  
Rise Time  
–
–
–
–
–
–
10  
35  
45  
40  
15  
2.8  
30  
80  
100  
90  
20  
–
V

DD

=300V, I

D

=4.0A, R

G

=25
Ω  
(Note 4, 5)  
ns  
Turn-off Delay Time  
Fall Time  
Q

g  

T
o
tal Gate Charge  
Gate-Source Charge  
V

DS

=480V, V

GS

=10
V
,
I

D

=4.0A  
(Note 4, 5)  
Q

gs  

nC  
Q

gd  

Gate-Drain Charge(Miller Charge)  
–
6.2  
–
Source-Drain Diode Ratings and Characteristics  
Symbol  
I

S  

Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
2.8  
Unit.  
Continuous Source Current  
Pulsed Source Current  
Diode Forward Voltage  
Integral Reverse p-n Junction  
Diode in the MOSFET  
–
–
–
–
–
–
A
I

SM  

11.2  
1.4  
V

SD  

I

S

=2.8A, V

GS

=0V  
V
t

rr  

Reverse Recovery Time  
–
–
300  
2.2  
–
–
ns  
uC  
I

S

=4.0A, V

GS

=0V, dI

F

/dt=100A/us  
Q

rr  

Reverse Recovery Charge  
※
NOTES  
1. Repeativity rating : pulse width limited by junction temperature  
2. L = 25mH, I

AS

=4.0A, V

DD

= 50V, R

G

= 25
Ω
, Starting T

J

=
25°C  
3. I

SD

≤
4.0A, di/dt
≤
200A/us, V

DD

≤
BV

DSS

, Starting
 
T

J

=
25°C  
4. Pulse
T
e
st : Pulse Width
≤
300us, Duty Cycle
≤
2%  
5. Essentially independent of operating temperature.  
– 2 –  
2012-7-8  

PTD4N60  
Typical Characteristics  
V

G
S  

15.0 V  
10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
5.5 V  
1
10  
Top :  
10

1  

Botto
m
:
5
.0
 
V  
0
10  
150

o

C  
10

0  

25

o

C  
-1  
10  
-55

o

C  
※
N
otes :  
1. V

D
S

=
4
0V  
2. 250µ s Pulse Test  
※
N
otes :  
1. 250µ s Pulse Test  
2. T

C

=
2
5
℃  
-1  
10  
-1  
10  
10

0  

10

1  

2
4
6
8
10  
V

G
S

,
G
ate-Source Voltage [V]  
V

D
S

,
D
rain-Source Voltage [V]  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
12  
10  
8
10

1  

V

G
S

= 10V  
V

G
S

= 20V  
6
10

0  

4
150
℃
 
25
℃  
※
N
otes :  
1. V

G
S

=
0
V  
2
2. 250µ s Pulse Test  
※
N
ote : T = 25
℃  
J
-1  
0
10  
0
2
4
6
8
10  
12  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
I

D

,
D
rain Current [A]  
V

S
D

,
S
ource-Drain voltage [V]  
Figure 3. On-Resistance Variation
 
vs  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
1000  
500  
0
12  
10  
8
C

iss

=
C

gs

+
C

gd

(C

ds

= shorted)  
C

o
ss

=
C

ds

+
C

gd  

rss

=
C

gd  

V

D
S

= 120V  
C
V

D
S

= 300V  
V

D
S

= 480V  
C
iss  
6
C
oss  
4
※
N
otes :  
1. V

G
S

= 0 V  
2. f = 1 MHz  
C
rss  
2
※
Note : I

D

= 4.0 A  
0
-1  
10  
10

0  

10

1  

0
4
8
12  
16  
20  
Q

G

, Total Gate Charge [nC]  
V

D
S

,
D
rain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
– 3 –  
2012-7-8  

PTD4N60  
Typical Characteristics
 
(Continued)  
1.2  
1.1  
1.0  
0.9  
0.8  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
※
N
otes :  
1. V

G
S

= 0 V  
2. I

D

=
2
50 µ A  
※
N
otes :  
1. V
 
= 10 V  
2. I

D

G

=

S

2
.0 A  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
T,
J
unction Temperature [

o

C
]  
T,
J
unction Temperature [

o

C
]  
J
J
Figure 7. Breakdown Voltage Variation  
vs Temperature  
Figure 8. On-Resistance Variation  
vs Temperature  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs Case Temperature  
Figure 11. Transient Thermal Response Curve  
– 4 –  
2012-7-8  

PTD4N60  
Gate Charge Test Circuit & Waveform  
V
GS  
Same Type  
as DUT  
50K
Ω
 
Q
g
12V  
200nF  
10V  
300nF  
V
DS  
V
GS  
Q
gs  
Q
gd  
DUT  
3
m
A  
Cha
r
ge  
Resistive Switching Test Circuit & Waveforms  
R
L
V
DS  
90%  
V
DS  
V
DD  
V
GS  
R
G
V

1
0%  

GS  
DUT  
10V  
t
d
(
o
n
)  
t
r
t
d
(
o
ff)  
t
f
t

o
n  

t

o
f
f  

Unclamped Inductive Switching Test Circuit & Waveforms  
BV  
DSS  
—- ——————–  
L
1
E
E =
 
L
I  
2
2
AS  
AS  
V
DS  
BV
–
V  
DSS DD  
BV  
DSS  
I
I

D  

AS  
R
G
V
DD  
I

D

(
t)  
V
DD  
V
(
t)  
DS  
DUT  
10V  
t

p  

t

p  

T
i
m
e  
– 5 –  
2012-7-8  

PTD4N60  
Peak Diode Recovery dv/dt Test Circuit & Waveforms  
+
D
U
T
V
D
S
_
I
S
D
L
D
r
i v  
e
r
R
G
S
a
m
a
e
T
U
y
/
p
T
e
V
s
D
D
D
V
G
S
•
•
d
I
v
d
t
c
o
t
n
t
r
l
o
e
l
l
e
d
b
y
R
s
G
c
o
n
r
o
l
d
b
y
p
u
l
e
p
e
r
i
o
d
S
D
G
–
a
–
t
e
P
–
u
l
s
e
–
W
i
d
–
t
h
–
V
r
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
–
i
–
–
D
=
G
S
G
a
t
e
P
u
l
s
e
P
e
r
o
d
1
0
V
(
D
i
v
e
r
)
I
,
B
o
d
y
D
i
o
d
e
F
o
r
w
a
r
d
C
u
r
r
e
n
t
F
M
I
S
D
d
i
/
d
r
t
(
D
U
T
S
)
I
R
M
B
o
d
y
D
i
o
d
e
c
R
e
v
r
e
r
s
e
C
u
r
e
n
t
V
D
(
D
U
T
)
B
o
d
y
S
D
i
o
d
e
R
e
o
v
e
y
d
v
/
d
t
V
V
D
D
D
B
o
d
y
D
i
o
d
e
F
o
r
w
a
r
d
V
o
l
t
a
g
e
D
r
o
p
– 6 –  
2012-7-8