Samwin-SWF7N65D

Part #Samwin-SWF7N65D
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Samwin-SWF7N65D
SW7N65D  
N-channel Enhanced mode TO-220/TO-251/TO-251N/TO-251U/TO-252/TO-  
220F/TO-220SF/TO-262N/DFN5*6/TO-220FT MOSFET  
Features  
TO-220  
TO-251  
TO-251N  
TO-251U  
TO-252  
BV

DSS

: 650V  
I

D

: 7A  
⚫
High ruggedness  
⚫
Low R

DS(ON)

(Typ 1.1
Ω)  
@V

GS

=10V  
⚫
Low Gate Charge (Typ 30nC)  
⚫
Improved dv/dt Capability  
⚫
100% Avalanche Tested  
⚫
Application:Charger,LED,  
PC Power  
R

DS(ON)

: 1.1Ω  
1
1
1
1
1
2
2
2
2
2
3
3
3
3
3
D
TO-220FT  
TO-262N  
DFN5*6  
TO-220SF  
TO-220F  
G
1
2
3
4
8
7
6
5
S
1
1
1
1
2
2
2
2
3
3
3
3
TO-220(F/SF)&TO-251(N)&TO-252&TO-262N
:
1. Gate
 
2. Drain
 
3. Source  
DFN5*6
:
4. Gate
 
5,6,7,8. Drain
 
1,2,3,4. Source  
General Description  
This power MOSFET is produced with advanced technology of SAMWIN.  
This technology enable the power MOSFET to have better characteristics, including fast  
switching time, low on resistance, low gate charge and especially excellent avalanche  
characteristics.  
Order Codes  
Item  
1
2
3
4
5
6
7
8
Sales Type  
SW P 7N65D  
SW I 7N65D  
SW N 7N65D  
SW UI 7N65D  
SW D 7N65D  
SW F 7N65D  
SW MN 7N65D  
SW J 7N65D  
SW HA 7N65D  
SW Y 7N65D  
Marking  
Package  
TO-220  
TO-251  
TO-251N  
TO-251U  
TO-252  
TO-220F  
TO-220SF  
TO-262N  
DFN5*6  
Packaging  
TUBE  
TUBE  
TUBE  
TUBE  
REEL  
TUBE  
TUBE  
TUBE  
REEL  
TUBE  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
SW7N65D  
9
10  
TO-220FT  
Absolute maximum ratings  
Value  
Symbol  
Parameter  
Unit  
TO251/TO251 TO25 TO220F/TO22
 
TO262 DFN5*  
TO220  
N/TO251U  
2
0SF/TO220FT  
N
6
V

DSS  

I

D  

Drain to source voltage  
650  
7*  
V
A
Continuous drain current (@T

C

=25

o

C)  
Continuous drain current (@T

C

=100

o

C)  
4.4*  
28  
A
I

DM  

V

GS  

E

AS  

Drain current pulsed  
(note 1)  
A
Gate to source voltage  
±
30  
430  
40  
V
Single pulsed avalanche energy  
Repetitive avalanche energy  
Peak diode recovery dv/dt  
Total power dissipation (@T

C

=25

o

C)  
Total power dissipation (@T

a

=25

o

C)  
Derating factor above 25

o

C  
(note 2)  
mJ  
mJ  
V/ns  
W
E

AR  

dv/dt  
(note 1)  
(note 3)  
5
208.3  
1.67  
173.6  
1.39  
27.8  
186.6  
1.5  
P

D  

2.4  
W
0.22  
0.02 W/

o

C  
Operating junction temperature & storage  
temperature  
Maximum lead temperature for soldering  
T

STG

, T

J  

T

L  

-55 ~ + 150  
300  

o

C  

o

C  
purpose, 1/8 from case for 5 seconds.  
*. Drain current is limited by junction temperature.  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
1/8  

SW7N65D  
Thermal characteristics  
Value  
TO220F/TO220 TO2 DFN5*  
Symbol  
Parameter  
Unit  
TO251/TO251  
N/TO251U  
TO220  
TO252  
SF/TO220FT 62N  
6
R

thjc  

R

thja  

Thermal resistance, Junction to case  
Thermal resistance, Junction to ambient  
0.6  
60  
0.72  
82  
4.5  
50  
0.67  

o

C/W  
61 51.4

o

C/W  
Note: R

thja

is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is d  
efined as the solder mounting surface of the drain pins. R

thjc

is guaranteed by design while R

thca

is determined by the user’s  
board design.  
DFN5*6 R

thja

:
51.4

o

C/W on a 1 in

2

pad of 2oz copper.  
Electrical characteristic
( T

J

= 25

o

C unless otherwise specified )  
Symbol  
Parameter  
Test conditions  
Min.  
Typ.  
Max. Unit  
Off characteristics  
BV

DSS  

Drain to source breakdown voltage  
V

GS

=0V, I

D

=250uA  
650  
V
ΔBV

DSS

Breakdown voltage temperature  
I

D

=250uA, referenced to 25

o

C  
0.51  
V/

o

C  
/ ΔT

J  

coefficient  
V

DS

=650V, V

GS

=0V  
V

DS

=520V, T

J

=125

o

C  
V

GS

=30V, V

DS

=0V  
1
uA  
uA  
nA  
I

DSS  

Drain to source leakage current  
Gate to source leakage current, forward  
Gate to source leakage current, reverse  
50  
100  
I

GSS  

V

GS

=-30V, V

DS

=0V  
-100  
nA  
On characteristics  
V

GS(TH)  

R

DS(ON)  

G

fs  

Gate threshold voltage  
V

DS

=V

GS

, I

D

=250uA  
2.5  
4.5  
1.4  
V
Ω
Ω
S
V

GS

=10V, I

D

= 3.5A, T

J

=25

o

C  
V

GS

=10V, I

D

= 3.5A, T

J

=125

o

C  
V

DS

=30 V, I

D

=3.5A  
1.1  
2.4  
6.3  
Drain to source on state resistance  
Forward transconductance  
Dynamic characteristics  
C

iss  

C

oss  

C

rss  

t

d(on)  

t

r  

Input capacitance  
1230  
108  
16  
Output capacitance  
Reverse transfer capacitance  
Turn on delay time  
Rising time  
V

GS

=0V, V

DS

=25V, f=1MHz  
pF  
ns  
16  
V

DS

=350V, I

D

=7A, R

G

=25Ω  
36  
t

d(off)  

t

f  

Turn off delay time  
Fall time  
(note 4,5)  
83  
40  
Q

g  

Total gate charge  
Gate-source charge  
Gate-drain charge  
Gate resistance  
30  
V

DS

=520V, V

GS

=10V, I

D

=7A  
(note 4,5)  
Q

gs  

Q

gd  

R

g  

5
nC  
15  
V

DS

=0V, Scan F mode  
1.7  
Ω
Source to drain diode ratings characteristics  
Symbol  
I

S  

I

SM  

V

SD  

t

rr  

Parameter  
Continuous source current  
Pulsed source current  
Diode forward voltage drop.  
Reverse recovery time  
Test conditions  
Integral reverse p-n Junction  
Min.  
Typ.  
Max. Unit  
7
28  
1.4  
A
A
V
diode in the MOSFET  
I

S

=7A, V

GS

=0V  
I

S

=7A, V

GS

=0V,  
436  
3.6  
ns  
uC  
Q

rr  

Reverse recovery charge  
dI

F

/dt=100A/us  
※
. Notes  
1.  
2.  
3.  
4.  
5.  
Repeatitive rating : pulse width limited by junction temperature.  
L = 17.5mH, I

AS

= 7A, V

DD

= 50V, R

G

=25Ω, Starting T

J

= 25

o

C  
I

SD

≤ 7A, di/dt = 100A/us, V

DD

≤ BV

DSS

, Staring T

J

=25

o

C  
Pulse Test : Pulse Width ≤ 300us, duty cycle ≤ 2%.  
Essentially independent of operating temperature.  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
2/8  

SW7N65D  
Fig. 1. On-state characteristics  
Fig. 2. Transfer Characteristics  
Fig. 4. On-state current vs. diode  
forward voltage  
Fig. 3. On-resistance variation vs.  
drain current and gate voltage  
Fig. 6. On resistance variation  
vs. junction temperature  
Fig 5. Breakdown Voltage Variation  
vs. Junction Temperature  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
3/8  

SW7N65D  
Fig. 7. Gate charge characteristics  
Fig. 8. Capacitance Characteristics  
Fig. 10. Maximum safe operating area  
(TO-251/TO-251N/TO-251U/TO-252)  
Fig. 9. Maximum safe operating area(TO-220)  
Fig. 11. Maximum safe operating area  
(TO-220F/TO-220SF/TO-220FT)  
Fig. 12. Maximum safe operating area(TO-262N)  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
4/8  

SW7N65D  
Fig. 13. Maximum safe operating area(DFN5*6)  
Fig. 14. Transient thermal response curve(TO-220)  
Fig. 15. Transient thermal response curve
 
(TO-251/TO-251N/TO-251U/TO-252)  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
5/8  

SW7N65D  
Fig. 16. Transient thermal response curve(TO-220F/TO-220SF/TO-220FT)  
Fig. 17. Transient thermal response curve(TO-262N)  
Fig. 18. Transient thermal response curve(DFN5*6)  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
6/8  

SW7N65D  
Fig. 19. Gate charge test circuit & waveform  
Fig. 20. Switching time test circuit & waveform  
V

DS  

90%  
R

L  

V

DS  

R

GS  

V

DD  

10%  
10%  
t

d(on)  

V

IN  

t

f  

t

d(off)  

10V

IN  

DUT  
t

r  

t

ON  

t

OFF  

Fig. 21. Unclamped Inductive switching test circuit & waveform  
Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
7/8  

SW7N65D  
Fig. 22. Peak diode recovery dv/dt test circuit & waveform  
DUT  
10V  
+
–
V

GS

(DRIVER)  
V

DS  

L
di/dt  
I

S  

I

S

(DUT)  
I

RRM  

V

DS  

R

G  

Diode reverse current  
V

DD  

Diode recovery dv/dt  
Same type  
as DUT  
10V

GS  

V

DD  

V

DS

(DUT)  
V

F  

*. dv/dt controlled by RG  
*. Is controlled by pulse period  
Body diode forward voltage drop  
DISCLAIMER  
* All the data & curve in this document was tested in SEMIPOWER TESTING & APPLICATION CENTER.  
* This product has passed the PCT,TC,HTRB,HTGB,HAST,PC and Solderdunk reliability testing.  
* Qualification standards can also be found on the Web
site (

)  
* Suggestions for improvement are appreciated, Please
send your suggestions to

Copyright@ Semipower Technology Co., Ltd. All rights reserved.  
May. 2022. Rev. 11.0  
8/8