STMicroelectronics-STD25NF10LT4
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STD25NF10L
N-CHANNEL 100V – 0.030
Ω
– 25A DPAK
LOW GATE CHARGE STripFET™ II POWER MOSFET
V
DSS
R
I
D
TYPE
DS(on)
STD25NF10L
100 V
< 0.035
Ω
25 A
■
■
■
■
■
■
TYPICAL R
(on) = 0.030
Ω
DS
EXCEPTIONAL dv/dt CAPABILITY
100% AVALANCHE TESTED
LOW THRESHOLD DEVICE
LOGIC LEVEL DEVICE
3
1
SURFACE-MOUNTING DPAK (TO-252)
POWER PACKAGE IN TAPE & REEL
(SUFFIX “T4″)
DPAK
TO-252
(Suffix “T4”)
DESCRIPTION
This MOSFET series realized with STMicroelectronics
unique STripFET process has specifically been designed
to minimize input capacitance and gate charge. It is
therefore suitable as primary switch in advanced high-
efficiency, high-frequency isolated DC-DC converters for
T
e
lecom and Computer applications. It is also intended
for any applications with low gate drive requirements
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■
HIGH-EFFICIENCY DC-DC CONVERTERS
■
UPS AND MOTOR CONTROL
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
100
100
± 16
25
Unit
V
V
Drain-source Voltage (V
= 0)
DS
GS
V
Drain-gate Voltage (R
= 20 k
Ω
)
V
DGR
GS
V
GS
Gate- source Voltage
V
I (*)
D
Drain Current (continuous) at T
= 25°C
A
C
I
D
Drain Current (continuous) at T
= 100°C
25
A
C
I
(
•
)
Drain Current (pulsed)
100
100
0.67
20
A
DM
P
T
o
tal Dissipation at T
= 25°C
W
tot
C
Derating Factor
W/°C
V/ns
mJ
(1)
(2)
Peak Diode Recovery voltage slope
Single Pulse Avalanche Energy
Storage
T
e
mperature
dv/dt
E
450
AS
T
stg
-55 to 175
°C
T
Max. Operating Junction
T
e
mperature
j
(
•
)
Pulse width limited by safe operating area.
(1) I
≤
25A, di/dt
≤
300A/µs, V
≤
V
, T
≤
T
SD
DD
(BR)DSS j
JMAX
o
(*) Current Limited by Package
(2) Starting T
= 25
C, I
= 12.5A, V
= 50V
j
D
DD
February 2003
1/9
STD25NF10L
THERMAL DATA
Rthj-case
Rthj-pcb
Thermal Resistance Junction-case
Thermal Resistance Junction-pcb
Maximum Lead
T
e
mperature For Soldering Purpose
Max
Max
1.5
50
275
°C/W
°C/W
°C
(#)
T
l
(#)
2
When Mounted on 1 inch
FR-4 board, 2 oz of Cu.
ELECTRICAL CHARACTERISTICS
(T
= 25 °C UNLESS OTHERWISE SPECIFIED)
CASE
OFF
Symbol
Parameter
Drain-source
Test Conditions
Min.
Typ.
Max.
Unit
I
= 250 µA, V
= 0
100
V
V
D
GS
(BR)DSS
Breakdown Voltage
V
= Max Rating
= Max Rating
T =
125°C
Zero Gate Voltage
1
10
µA
µA
I
I
DS
DSS
Drain Current (V
= 0)
V
DS
GS
C
Gate-body Leakage
V
GS
= ± 16 V
±100
nA
GSS
Current (V
= 0)
DS
(*
)
ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
V
GS(th)
V
= V
I
= 250 µA
Gate Threshold Voltage
1
2.5
V
DS
GS
D
V
V
= 10 V
= 4.5 V
I
I
= 12.5 A
= 12.5 A
Static Drain-source On
Resistance
0.030
0.035
0.035
0.040
Ω
Ω
R
GS
D
D
DS(on)
GS
DYNAMIC
Symbol
Parameter
Test Conditions
= 15 V
= 12.5 A
Min.
Typ.
Max.
Unit
(*)
V
I
D
g
fs
Forward Transconductance
24
S
DS
V
DS
= 25V
f = 1 MHz
V =
0
GS
C
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
1710
250
110
pF
pF
pF
iss
C
oss
C
rss
2/9
STD25NF10L
ELECTRICAL CHARACTERISTICS
(continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
= 50 V
= 12.5 A
Min.
Typ.
Max.
Unit
V
R
I
D
Turn-on Delay Time
Rise Time
20
40
ns
ns
t
DD
d(on)
= 4.7
Ω
V
GS
= 5 V
t
r
G
(Resistive Load, Figure 3)
Q
V
= 80 V I
= 25 A V
= 5 V
T
o
tal Gate Charge
Gate-Source Charge
Gate-Drain Charge
38
8.5
21
52
nC
nC
nC
g
DD
D
GS
Q
gs
Q
gd
SWITCHING OFF
Symbol
Parameter
Test Conditions
= 50 V
= 12.5 A
Min.
Min.
Typ.
Max.
Unit
V
R
I
D
Turn-off Delay Time
Fall Time
58
20
ns
ns
t
DD
d(off)
= 4.7
Ω,
V
= 5 V
GS
t
G
f
(Resistive Load, Figure 3)
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Typ.
Max.
Unit
I
Source-drain Current
Source-drain Current (pulsed)
25
100
A
A
SD
( )
•
I
SDM
(*)
I
I
= 25 A
V
= 0
GS
V
Forward On Voltage
1.5
V
SD
SD
SD
t
= 25 A
= 50 V
di/dt = 100A/µs
T =
150°C
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
88
317
7.2
ns
nC
A
rr
Q
V
rr
DD
j
I
(see test circuit, Figure 5)
RRM
(*)
(
Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
•
)
Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/9
STD25NF10L
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STD25NF10L
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized Breakdown Voltage vs Temperature
.
.
5/9
STD25NF10L
Fig. 1:
Unclamped Inductive Load Test Circuit
Fig. 2:
Unclamped Inductive Waveform
Fig. 3:
Switching Times Test Circuits For Resistive
Fig. 4:
Gate Charge test Circuit
Load
Fig. 5:
Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/9
STD25NF10L
TO-252 (DPAK) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
2.2
TYP.
MAX.
2.4
MIN.
0.086
0.035
0.001
0.025
0.204
0.017
0.019
0.236
0.252
0.173
0.368
MAX.
0.094
0.043
0.009
0.035
0.212
0.023
0.023
0.244
0.260
0.181
0.397
A
A1
A2
B
0.9
1.1
0.03
0.64
5.2
0.23
0.9
B2
C
5.4
0.45
0.48
6
0.6
C2
D
0.6
6.2
E
6.4
6.6
G
4.4
4.6
H
9.35
10.1
L2
L4
0.8
0.031
0.6
1
0.023
0.039
H
DETAIL “A”
D
L2
DETAIL “A”
L4
0068772-B
7/9
STD25NF10L
8/9
STD25NF10L
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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2002 STMicroelectronics – All Rights Reserved
All other names are the property of their respective owners.
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