STMicroelectronics-STF3LN80K5

Part #STMicroelectronics-STF3LN80K5
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STMicroelectronics-STF3LN80K5
STF3LN80K5  
N-
channel 800 V, 2.75 Ω typ., 2 A MDmesh™ K5  
Power MOSFET in a TO-220FP package  
Datasheet – production data  
Features  
Order code  
V

DS  

R

DS(on)

max  
I

D  

STF3LN80K5  
800 V  
3.25 Ω  
2 A  
Industry’s lowest R

DS(on)

x area  
Industry’s best FoM (figure of merit)  
Ultra-low gate charge  
100% avalanche tested  
Zener-protected  
TO-220FP  
Applications  
Switching applications  
Figure 1: Internal schematic diagram  
D(2)  
Description  
This very high voltage N-channel Power  
MOSFET is designed using MDmesh™ K5  
technology based on an innovative proprietary  
vertical structure. The result is a dramatic  
reduction in on-resistance and ultra-low gate  
charge for applications requiring superior power  
density and high efficiency.  
G(1)  
S(3)  
AM15572v1_no_tab  
Table 1: Device summary  
Order code  
Marking  
Package  
Packing  
STF3LN80K5  
3LN80K5  
TO-220FP  
Tube  
July 2016  
DocID027715 Rev 2  
1/13  
This is information on a product in full production.  

STF3LN80K5  
Electrical ratings  
1
Electrical ratings  
Table 2: Absolute maximum ratings  
Symbol  
Parameter  
Value  
± 30  
2
Unit  
V
V

GS  

Gate-source voltage  
Drain current (continuous) at T

C

= 25 °C  
Drain current (continuous) at T

C

= 100 °C  
Drain current (pulsed)  
A
1.25  
8
A
A
P

TOT  

V

ISO  

Total dissipation at T

C

= 25 °C  
20  
W
Insulation withstand voltage (RMS) from all three leads to external  
heat sink (t = 1 s; T

C

= 25 °C)  
2500  
V
dv/d

Peak diode recovery voltage slope  
dv/d

MOSFET dv/dt ruggedness  
4.5  
50  
V/ns  
T

stg  

T

j  

Storage temperature range  
– 55 to 150  
°C  
Operating junction temperature range  
Notes:  

(1)

Limited by maximum junction temperature.  

(2)

Pulse width limited by safe operating area.  
(3)  
I
≤ 2 A, di/dt ≤ 100 A/µs; V

DSpeak

< V

(BR)DSS

, V

DD

= 640 V  
SD  
(4)  
V
≤ 640 V.  
DS  
Table 3: Thermal data  
Parameter  
Symbol  
R

thj-case  

R

thj-amb  

Value  
6.25  
Unit  
Thermal resistance junction-case  
Thermal resistance junction-ambient  
°C/W  
°C/W  
62.5  
Table 4: Avalanche characteristics  
Parameter  
Symbol  
I

AR  

Value Unit  
Avalanche current, repetitive or not repetitive (pulse width limited by T

jmax  

)
0.7  
A
E

AS  

Single pulse avalanche energy (starting T

j

= 25°C, I

D

= I

AR

; V

DD

= 50 V)  
155  
mJ  
DocID027715 Rev 2  
3/13  
 
 
 
 
 

Electrical characteristics  
STF3LN80K5  
2
Electrical characteristics  
(T

C

= 25 °C unless otherwise specified)  
Table 5: On /off states  
Symbol  
Parameter  
Test conditions  
I

D

= 1 mA, V

GS

= 0 V  
V

DS

= 800 V, V

GS

= 0 V  
Min. Typ. Max. Unit  
Drain-source breakdown  
voltage  
V

(BR)DSS  

800  
V
1
µA  
µA  
Zero gate voltage  
drain current  
I

DSS  

V

DS

= 800 V, V

GS

= 0 V,  
T

C

= 125

50  
Gate body leakage  
current  
I

GSS  

V

GS

= ± 20 V, V

GS

= 0 V  
V

DS

= V

GS

, I

D

= 100 µA  
V

GS

= 10 V, I

D

= 1 A  
±10  
5
µA  
V
V

GS(th)  

R

DS(on)  

Gate threshold voltage  
3
4
Static drain-source  
on-resistance  
2.75 3.25  
Ω
Notes:  

(1)

Defined by design, not subject to production test.  
Table 6: Dynamic  
Test conditions  
Symbol  
C

iss  

Parameter  
Input capacitance  
Output capacitance  
Min. Typ. Max. Unit  
–
–
102  
11  
–
–
pF  
pF  
C

oss  

V

DS

= 100 V, f = 1 MHz,  
V

GS

= 0 V  
Reverse transfer  
capacitance  
C

rss  

–
–
–
0.1  
20  
7
–
–
–
pF  
pF  
pF  
Equivalent capacitance  
time related  
V

DS

= 0 to 640 V, V

GS

= 0 V  
f = 1 MHz, I

D

= 0 A  
Equivalent capacitance  
energy related  
R

G  

Q

g  

Intrinsic gate resistance  
Total gate charge  
–
–
–
–
12  
–
–
–
–
Ω
V

DD

= 640 V, I

D

= 2 A,  
V

GS

= 10 V ( see

2.63  
0.91  
1.53  
nC  
nC  
nC  
Q

gs  

Q

gd  

Gate-source charge  
Gate-drain charge  
Notes:  

(1)

Time related is defined as a constant equivalent capacitance giving the same charging time as C

oss

when V

DS  

increases from 0 to 80% V

DSS  

(2)

Energy related is defined as a constant equivalent capacitance giving the same stored energy as C

oss

when V

DS  

increases from 0 to 80% V

DSS  

4/13  
DocID027715 Rev 2  
 
 
 
 

STF3LN80K5  
Electrical characteristics  
Min. Typ. Max. Unit  
Table 7: Switching times  
Test conditions  
Symbol  
t

d(on)  

t

r  

t

d(off)  

t

f  

Parameter  
Turn-on delay time  
Rise time  
–
–
–
–
6.2  
7
–
–
–
–
ns  
ns  
ns  
ns  
V

DD

= 400 V, I

D

= 1 A, R

G

= 4.7
Ω,  
V

GS

= 10 V ( see

Turn-off delay time  
Fall time  
30  
26  
Table 8: Source drain diode  
Test conditions  
Symbol  
Parameter  
Min. Typ. Max. Unit  
I

SD  

Source-drain current  
–
–
2
8
A
A
Source-drain current  
(pulsed)  
Forward on voltage  
I

SD

= 2 A, V

GS

= 0 V  
–
–
1.5  
V
t

rr  

Reverse recovery time  
210  
0.8  
ns  
I

SD

= 2 A, di/dt = 100 A/µs,  
Reverse recovery  
charge  
Q

rr  

V

DD

= 60 V ( see

–
µC  
Reverse recovery  
current  
I

RRM  

t

rr  

–
–
–
7.6  
345  
1.2  
A
Reverse recovery time  
ns  
µC  
I

SD

= 2 A, di/dt = 100 A/µs,  
V

DD

= 60 V, T

j

= 150 °C, (see  
Reverse recovery  
charge  
Q

rr  

Reverse recovery  
current  
I

RRM  

–
7.2  
A
Notes:  

(1)

Pulse width limited by safe operating area.  

(2)

Pulsed: pulse duration = 300 µs, duty cycle 1.5%.  
Table 9: Gate-source Zener diode  
Symbol  
Parameter  
Test conditions  
Min. Typ. Max. Unit  
30  
V

(BR)GSO

Gate-source breakdown voltage  
I

GS

= ± 1 mA, I

D

= 0 A  
–
–
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD  
performance of the device. The Zener voltage facilitates efficient and cost-effective device  
integrity protection, thus eliminating the need for additional external componentry.  
DocID027715 Rev 2  
5/13  
 
 

Electrical characteristics  
STF3LN80K5  
2.1  
2.1 Electrical characteristics (curves)  
Figure 2: Safe operating area  
Figure 3: Thermal impedance  
Figure 4: Output characteristics  
Figure 5: Transfer characteristics  
Figure 6: Gate charge vs gate-source voltage  
Figure 7: Static drain-source on-resistance  
6/13  
DocID027715 Rev 2  
 

STF3LN80K5  
Electrical characteristics  
Figure 9: Source-drain diode forward  
characteristics  
Figure 8: Capacitance variations  
Figure 10: Normalized gate threshold voltage  
vs temperature  
Figure 11: Normalized on-resistance vs  
temperature  
Figure 13: Maximum avalanche energy vs  
starting TJ  
Figure 12: Normalized V(BR)DSS vs  
temperature  
DocID027715 Rev 2  
7/13  

Test circuits  
STF3LN80K5  
3
Test circuits  
Figure 14: Test circuit for resistive load  
switching times  
Figure 15: Test circuit for gate charge  
behavior  
V

DD  

RL  
I

G

= CONST  
D.U.
T
.  
100 Ω  
V

GS  

pulse width  
+
2.7 kΩ  
V

G  

2200  
μF  
47 kΩ  
1 kΩ  
AM01469v10  
Figure 16: Test circuit for inductive load  
switching and diode recovery times  
Figure 17: Unclamped inductive load test  
circuit  
Figure 19: Switching time waveform  
Figure 18: Unclamped inductive waveform  
8/13  
DocID027715 Rev 2  

STF3LN80K5  
Package information  
4
Package information  
In order to meet environmental requirements, ST offers these devices in different grades of  
ECOPACK

®

packages, depending on their level of environmental compliance. ECOPACK

®  

specifications, grade definitions and product status are available at:

.  
ECOPACK

®

is an ST trademark.  
DocID027715 Rev 2  
9/13  

Package information  
STF3LN80K5  
4.1  
TO-220FP package information  
Figure 20: TO-220FP package outline  
10/13  
DocID027715 Rev 2  

STF3LN80K5  
Package information  
Table 10: TO-220FP package mechanical data  
mm  
Dim.  
Min.  
4.4  
Typ.  
Max.  
4.6  
A
B
2.5  
2.7  
D
2.5  
2.75  
0.7  
E
0.45  
0.75  
1.15  
1.15  
4.95  
2.4  
F
1
F1  
F2  
G
1.70  
1.70  
5.2  
G1  
H
2.7  
10  
10.4  
L2  
L3  
L4  
L5  
L6  
L7  
Dia  
16  
28.6  
9.8  
2.9  
15.9  
9
30.6  
10.6  
3.6  
16.4  
9.3  
3
3.2  
DocID027715 Rev 2  
11/13  

Revision history  
STF3LN80K5  
5
Revision history  
Table 11: Document revision history  
Changes  
Date  
Revision  
13-May-2015  
1
Initial release  
Updated title and features in cover page.  
01-Jul-2016  
2
Minor text changes.  
12/13  
DocID027715 Rev 2  

STF3LN80K5  
IMPORTANT NOTICE
–
PLEASE READ CAREFULLY  
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, and  
improvements to ST products and/or to this document at any time without notice. Purchasers should obtain the latest relevant information on ST  
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der  
acknowledgement.  
Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or the  
design of Purchasers’ products.  
No license, express or implied, to any intellectual property right is granted by ST herein.  
Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product.  
ST and the ST logo are trademarks of ST. All other product or service names are the property of their respective owners.  
Information in this document supersedes and replaces information previously supplied in any prior versions of this document.  
© 2016 STMicroelectronics
–
All rights reserved  
DocID027715 Rev 2  
13/13