STMicroelectronics-STW13NK100Z

Part #STMicroelectronics-STW13NK100Z
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STMicroelectronics-STW13NK100Z
STW11NK100Z  
STW13NK100Z  
N-channel 1000V – 0.56
Ω
– 13A – TO-247  
Zener – Protected SuperMESH™ PowerMOSFET  
General features  
V

DSS  

Type  
R

DS(on)  

I

D  

P

W  

(@Tjmax)  
STW13NK100Z  
1000 V
 
< 0.70
Ω
13 A
 
350W  
■
Extremely high dv/dt capability  
■
100% avalanche tested  
■
Gate charge minimized  
TO-247  
■
Very low intrinsic capacitances  
■
Very good manufacturing repeatibility  
Description  
The SuperMESH™ series is obtained through an  
extreme optimization of ST’s well established  
strip-based PowerMESH™ layout. In addition to  
pushing on-resistance significantly down, special  
care is taken to ensure a very good dv/dt  
capability for the most demanding applications.  
Such series complements ST full range of high  
voltage MOSFETs including revolutionary  
MDmesh™ products.  
Internal schematic diagram  
Applications  
■
Switching application  
Order codes  
Part number  
Marking  
Package  
Packaging  
STW13NK100Z  
W13NK100Z  
TO-247  
T
u
be  
August 2006  
Rev 5  
1/14  
14  

STW13NK100Z  
Electrical ratings  
1
Electrical ratings  
Table 1.  
Symbol  
Absolute maximum ratings  
Parameter  
Value  
Unit  
V

DS  

V

DGR  

V

GS  

I

D  

Drain-source voltage (V

GS

= 0)  
Drain-gate voltage (R

GS

= 20K
Ω
)  
Gate-source voltage  
1000  
1000  
30  
V
V
V
Drain current (continuous) at T

C

= 25°C  
Drain current (continuous) at T

C

=100°C  
Drain current (pulsed)  
13  
A
I

D  

8.2  
52  
A
(1)  
I

DM  

A
P

TOT  

T
o
tal dissipation at T

C

= 25°C  
Derating Factor  
350  
2.7  
6000  
4
W
W/°C  
V
V

ESD (G-S)
 

Gate source ESD(HBM-C=100p
F
,
R
=1,5K
Ω
)  
dv/dt

(2)  

Peak diode recovery voltage slope  
V/ns  
T

J  

Operating junction temperature  
Storage temperature  
-55 to 150  
°C  
T

stg  

1. Pulse
 
width limited by safe operating area  
2.
I

SD

≤
8.3 A, di/dt
≤
200A/µs, V

DD

≤
V

(BR)DSS

, T

j

≤
T

JMAX  

Table 2.  
Symbol  
Thermal data  
Parameter  
Value  
Unit  
R

thj-case

Thermal resistance junction-case Max  
0.36  
50  
°C/W  
°C/W  
R

thj-a  

T

l  

Thermal resistance junction-ambient Max  
Maximum lead temperature for soldering  
purpose  
300  
°C  
Table 3.  
Symbol  
Avalanche characteristics  
Parameter  
Value  
Unit  
Avalanche current, repetitive or not-repetitive  
(pulse width limited by Tj Max)  
I

AR  

13  
A
Single pulse avalanche energy  
E

AS  

700  
mJ  
(starting Tj=25°C, Id=Iar, Vdd=50V)  
3/14  

Electrical ratings  
STW13NK100Z  
Table 4.  
Symbol  
Gate-source zener diode  
Parameter  
Test conditions  
Min. Typ. Max. Unit  
BV

GSO

Gate-source breakdown voltage
 
Igs= 1mA
 
(Open Drain)
 
30  
V
1.1  
Protection features of gate-to-source zener diodes  
The built-in back-to-back Zener diodes have specifically been designed to enhance not only  
the device’s ESD capability, but also to make them safely absorb possible voltage transients  
that may occasionally be applied from gate to source. In this respect the Zener voltage is  
appropriate to achieve an efficient and cost-effective intervention to protect the device’s  
integrity. These integrated Zener diodes thus avoid the usage of external components.  
4/14  

STW13NK100Z  
Electrical characteristics  
2
Electrical characteristics  
(T  
=25°C unless otherwise specified)  
CASE  
Table 5.  
Symbol  
On/off states  
Parameter  
Test conditions  
I

D

= 1mA, V

GS

= 0  
Min.  
Typ.  
Max.  
Unit  
Drain-source breakdown  
voltage  
V

(BR)DSS  

1000  
V
V

DS

= Max rating,  
V

DS

= Max rating,  
Tc = 125°C  
1
µA  
µA  
Zero gate voltage drain  
current (V

GS

= 0)  
I

DSS  

10  
Gate body leakage current  
(V

GS

= 0)  
I

GSS  

V

GS  

=
20V  
±
10  
4.5  
µA  
V
V

GS(th)

Gate threshold voltage  
V

DS

= V

GS

, I

D

= 150 µA  
V

GS

= 10
V
,
I

D

= 6.5 A  
3
3.75  
0.56  
Static drain-source on  
resistance  
R

DS(on)  

0.70  
Ω
Table 6.  
Dynamic  
Parameter  
Symbol  
Test conditions  
Min.  
Typ.  
Max.  
Unit  
(1)  
g

fs  

Forward transconductance
 
V

DS

=15
V
,
I

D

= 6.5 A  
Input capacitance  
14  
S
C

iss  

C

oss  

C

rss  

6000  
455  
pF  
pF  
pF  
Output capacitance  
V

DS

=25
V
,
f
=1 MHz, V

GS

=0  
Reverse transfer  
capacitance  
100  
Equivalent output  
V

GS

=0, V

DS

=0V to 800V  
capacitance  
(2)  
C

osseq  

227  
pF  
.
t

d(on)  

t

r  

t

d(off)  

t

f  

T
u
rn-on delay time  
V

DD

=500
V
,
I

D

= 7A,  
Rise time  
45  
35  
ns  
ns  
ns  
ns  
R

G

=4.7
Ω
,
V

GS

=10V  
Off-voltage rise time  
(see

)  
Fall time  
145  
45  
Q

g  

Q

gs  

Q

gd  

T
o
tal gate charge  
V

DD

=800
V
,
I

D

= 13A  
Gate-source charge  
V

GS

=10V  
190  
30  
266  
nC  
nC  
nC  
Gate-drain charge  
100  
1. Pulsed:
 
pulse duration=300µs, duty cycle 1.5%  
2. C

oss eq.

is defined as a constant equivalent capacitance giving the same charging time as C

oss

when V

DS  

increases from 0 to 80% V

DSS  

5/14  

Electrical characteristics  
STW13NK100Z  
Table 7.  
Symbol  
Source drain diode  
Parameter  
Test conditions  
Min Typ. Max Unit  
I

SD  

Source-drain current  
13  
52  
A
A
V
(1)  
I

SDM  

Source-drain current (pulsed)  
Forward on voltage  
(2)  
V

SD  

I

SD

=8.3A, V

GS

=0  
1.6  
I

SD

=13 A,  
t

rr  

Reverse recovery time  
Reverse recovery charge  
Reverse recovery current  
820  
12.7  
31  
ns  
µC  
A
di/dt = 100A/µs,  
V

DD

=100
V
,
T
j=25°C  
(see

)  
Q

rr  

I

RRM  

I

SD

=13 A,  
t

rr  

Reverse recovery time  
Reverse recovery charge  
Reverse recovery current  
1050  
17.8  
34  
ns  
µC  
A
di/dt = 100A/µs,  
V

DD

=100
V
,
T
j=150°C  
(see

)  
Q

rr  

I

RRM  

1. Pulse
 
width limited by safe operating area  
2. Pulsed:
 
pulse duration=300µs, duty cycle 1.5%  
6/14  

STW13NK100Z  
Electrical characteristics  
2.1  
Electrical characteristics (curves)  
Figure 1.
 
Safe operating area  
Figure 2.
 
Thermal impedance  
Figure 3.
 
Output characterisics  
Figure 4.
 
Transfer characteristics  
7/14  

Electrical characteristics  
STW13NK100Z  
Figure 5.
 
Transconductance  
Figure 6.
 
Static drain-source on resistance  
Figure 7.
 
Gate charge vs gate-source voltage
 
Figure 8.
 
Capacitance variations  
Figure 9.
 
Normalized gate threshold voltage
 
Figure 10.
 
Normalized on resistance vs  
vs temperature
 
temperature  
8/14  

STW13NK100Z  
Electrical characteristics  
Figure 11.
 
Source-drain diode forward  
characteristics  
Figure 12.
 
Normalized B  
vs temperature  
VDSS  
Figure 13.
 
Maximum avalanche  
energy vs temperature  
9/14  
 

Test circuit  
STW13NK100Z  
3
Test circuit  
Figure 14.
 
Unclamped Inductive load test  
circuit  
Figure 15.
 
Unclamped Inductive waveform  
Figure 16.
 
Switching times test circuit for  
resistive load  
Figure 17.
 
Gate charge test circuit  
Figure 18.
 
Test circuit for inductive load  
switching and diode recovery times  
10/14  

STW13NK100Z  
Package mechanical data  
4
Package mechanical data  
In order to meet environmental requirements, ST offers these devices in ECO
P
A
CK®  
packages. These packages have a Lead-free second level interconnect . The category of  
second level interconnect is marked on the package and on the inner box label, in  
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering  
conditions are also marked on the inner box label. ECO
P
ACK is an ST trademark.  
ECO
P
ACK specifications are available at:

11/14  

Package mechanical data  
STW13NK100Z  
TO-247 MECHANICAL DATA  
mm.  
inch  
TYP.  
DIM.  
MIN.  
4.85  
2.20  
1.0  
TYP  
MAX.  
5.15  
MIN.  
0.19  
MAX.  
0.20  
A
A1  
b
2.60  
0.086  
0.039  
0.079  
0.118  
0.015  
0.781  
0.608  
0.102  
0.055  
0.094  
0.134  
0.03  
1.40  
b1  
b2  
c
2.0  
2.40  
3.0  
3.40  
0.40  
19.85  
15.45  
0.80  
D
20.15  
15.75  
0.793  
0.620  
E
e
5.45  
18.50  
5.50  
0.214  
0.728  
0.216  
L
14.20  
3.70  
14.80  
4.30  
0.560  
0.14  
0.582  
0.17  
L1  
L2  
øP  
øR  
S
3.55  
4.50  
3.65  
5.50  
0.140  
0.177  
0.143  
0.216  
12/14  

STW13NK100Z  
Revision history  
5
Revision history  
Table 8.  
Date  
Revision history  
Revision  
Changes  
22-Jun-2004  
09-Sep-2004  
28-Jan-2005  
18-Sep-2005  
01-Aug-2006  
1
2
3
4
5
T
a
rget document  
Preliminary document  
Complete version with curves  

Figure 12

changed  
New template, no content change  
13/14  

STW13NK100Z  
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