STMicroelectronics-STW13NK100Z
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STW11NK100Z
STW13NK100Z
N-channel 1000V – 0.56
Ω
– 13A – TO-247
Zener – Protected SuperMESH™ PowerMOSFET
General features
V
DSS
Type
R
DS(on)
I
D
P
W
(@Tjmax)
STW13NK100Z
1000 V
< 0.70
Ω
13 A
350W
■
Extremely high dv/dt capability
■
100% avalanche tested
■
Gate charge minimized
TO-247
■
Very low intrinsic capacitances
■
Very good manufacturing repeatibility
Description
The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established
strip-based PowerMESH™ layout. In addition to
pushing on-resistance significantly down, special
care is taken to ensure a very good dv/dt
capability for the most demanding applications.
Such series complements ST full range of high
voltage MOSFETs including revolutionary
MDmesh™ products.
Internal schematic diagram
Applications
■
Switching application
Order codes
Part number
Marking
Package
Packaging
STW13NK100Z
W13NK100Z
TO-247
T
u
be
August 2006
Rev 5
1/14
14
Contents
STW13NK100Z
Contents
Electrical ratings
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Electrical characteristics
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Test circuit
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Revision history
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2/14
STW13NK100Z
Electrical ratings
1
Electrical ratings
Table 1.
Symbol
Absolute maximum ratings
Parameter
Value
Unit
V
DS
V
DGR
V
GS
I
D
Drain-source voltage (V
GS
= 0)
Drain-gate voltage (R
GS
= 20K
Ω
)
Gate-source voltage
1000
1000
30
V
V
V
Drain current (continuous) at T
C
= 25°C
Drain current (continuous) at T
C
=100°C
Drain current (pulsed)
13
A
I
D
8.2
52
A
(1)
I
DM
A
P
TOT
T
o
tal dissipation at T
C
= 25°C
Derating Factor
350
2.7
6000
4
W
W/°C
V
V
ESD (G-S)
Gate source ESD(HBM-C=100p
F
,
R
=1,5K
Ω
)
dv/dt
(2)
Peak diode recovery voltage slope
V/ns
T
J
Operating junction temperature
Storage temperature
-55 to 150
°C
T
stg
1. Pulse
width limited by safe operating area
2.
I
SD
≤
8.3 A, di/dt
≤
200A/µs, V
DD
≤
V
(BR)DSS
, T
j
≤
T
JMAX
Table 2.
Symbol
Thermal data
Parameter
Value
Unit
R
thj-case
Thermal resistance junction-case Max
0.36
50
°C/W
°C/W
R
thj-a
T
l
Thermal resistance junction-ambient Max
Maximum lead temperature for soldering
purpose
300
°C
Table 3.
Symbol
Avalanche characteristics
Parameter
Value
Unit
Avalanche current, repetitive or not-repetitive
(pulse width limited by Tj Max)
I
AR
13
A
Single pulse avalanche energy
E
AS
700
mJ
(starting Tj=25°C, Id=Iar, Vdd=50V)
3/14
Electrical ratings
STW13NK100Z
Table 4.
Symbol
Gate-source zener diode
Parameter
Test conditions
Min. Typ. Max. Unit
BV
GSO
Gate-source breakdown voltage
Igs= 1mA
(Open Drain)
30
V
1.1
Protection features of gate-to-source zener diodes
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
4/14
STW13NK100Z
Electrical characteristics
2
Electrical characteristics
(T
=25°C unless otherwise specified)
CASE
Table 5.
Symbol
On/off states
Parameter
Test conditions
I
D
= 1mA, V
GS
= 0
Min.
Typ.
Max.
Unit
Drain-source breakdown
voltage
V
(BR)DSS
1000
V
V
DS
= Max rating,
V
DS
= Max rating,
Tc = 125°C
1
µA
µA
Zero gate voltage drain
current (V
GS
= 0)
I
DSS
10
Gate body leakage current
(V
GS
= 0)
I
GSS
V
GS
=
20V
±
10
4.5
µA
V
V
GS(th)
Gate threshold voltage
V
DS
= V
GS
, I
D
= 150 µA
V
GS
= 10
V
,
I
D
= 6.5 A
3
3.75
0.56
Static drain-source on
resistance
R
DS(on)
0.70
Ω
Table 6.
Dynamic
Parameter
Symbol
Test conditions
Min.
Typ.
Max.
Unit
(1)
g
fs
Forward transconductance
V
DS
=15
V
,
I
D
= 6.5 A
Input capacitance
14
S
C
iss
C
oss
C
rss
6000
455
pF
pF
pF
Output capacitance
V
DS
=25
V
,
f
=1 MHz, V
GS
=0
Reverse transfer
capacitance
100
Equivalent output
V
GS
=0, V
DS
=0V to 800V
capacitance
(2)
C
osseq
227
pF
.
t
d(on)
t
r
t
d(off)
t
f
T
u
rn-on delay time
V
DD
=500
V
,
I
D
= 7A,
Rise time
45
35
ns
ns
ns
ns
R
G
=4.7
Ω
,
V
GS
=10V
Off-voltage rise time
Fall time
145
45
Q
g
Q
gs
Q
gd
T
o
tal gate charge
V
DD
=800
V
,
I
D
= 13A
Gate-source charge
V
GS
=10V
190
30
266
nC
nC
nC
Gate-drain charge
100
1. Pulsed:
pulse duration=300µs, duty cycle 1.5%
2. C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C
oss
when V
DS
increases from 0 to 80% V
DSS
5/14
Electrical characteristics
STW13NK100Z
Table 7.
Symbol
Source drain diode
Parameter
Test conditions
Min Typ. Max Unit
I
SD
Source-drain current
13
52
A
A
V
(1)
I
SDM
Source-drain current (pulsed)
Forward on voltage
(2)
V
SD
I
SD
=8.3A, V
GS
=0
1.6
I
SD
=13 A,
t
rr
Reverse recovery time
Reverse recovery charge
Reverse recovery current
820
12.7
31
ns
µC
A
di/dt = 100A/µs,
V
DD
=100
V
,
T
j=25°C
Q
rr
I
RRM
I
SD
=13 A,
t
rr
Reverse recovery time
Reverse recovery charge
Reverse recovery current
1050
17.8
34
ns
µC
A
di/dt = 100A/µs,
V
DD
=100
V
,
T
j=150°C
Q
rr
I
RRM
1. Pulse
width limited by safe operating area
2. Pulsed:
pulse duration=300µs, duty cycle 1.5%
6/14
STW13NK100Z
Electrical characteristics
2.1
Electrical characteristics (curves)
Figure 1.
Safe operating area
Figure 2.
Thermal impedance
Figure 3.
Output characterisics
Figure 4.
Transfer characteristics
7/14
Electrical characteristics
STW13NK100Z
Figure 5.
Transconductance
Figure 6.
Static drain-source on resistance
Figure 7.
Gate charge vs gate-source voltage
Figure 8.
Capacitance variations
Figure 9.
Normalized gate threshold voltage
Figure 10.
Normalized on resistance vs
vs temperature
temperature
8/14
STW13NK100Z
Electrical characteristics
Figure 11.
Source-drain diode forward
characteristics
Figure 12.
Normalized B
vs temperature
VDSS
Figure 13.
Maximum avalanche
energy vs temperature
9/14
Test circuit
STW13NK100Z
3
Test circuit
Figure 14.
Unclamped Inductive load test
circuit
Figure 15.
Unclamped Inductive waveform
Figure 16.
Switching times test circuit for
resistive load
Figure 17.
Gate charge test circuit
Figure 18.
Test circuit for inductive load
switching and diode recovery times
10/14
STW13NK100Z
Package mechanical data
4
Package mechanical data
In order to meet environmental requirements, ST offers these devices in ECO
P
A
CK®
packages. These packages have a Lead-free second level interconnect . The category of
second level interconnect is marked on the package and on the inner box label, in
compliance with JEDEC Standard JESD97. The maximum ratings related to soldering
conditions are also marked on the inner box label. ECO
P
ACK is an ST trademark.
11/14
Package mechanical data
STW13NK100Z
TO-247 MECHANICAL DATA
mm.
inch
TYP.
DIM.
MIN.
4.85
2.20
1.0
TYP
MAX.
5.15
MIN.
0.19
MAX.
0.20
A
A1
b
2.60
0.086
0.039
0.079
0.118
0.015
0.781
0.608
0.102
0.055
0.094
0.134
0.03
1.40
b1
b2
c
2.0
2.40
3.0
3.40
0.40
19.85
15.45
0.80
D
20.15
15.75
0.793
0.620
E
e
5.45
18.50
5.50
0.214
0.728
0.216
L
14.20
3.70
14.80
4.30
0.560
0.14
0.582
0.17
L1
L2
øP
øR
S
3.55
4.50
3.65
5.50
0.140
0.177
0.143
0.216
12/14
STW13NK100Z
Revision history
5
Revision history
Table 8.
Date
Revision history
Revision
Changes
22-Jun-2004
09-Sep-2004
28-Jan-2005
18-Sep-2005
01-Aug-2006
1
2
3
4
5
T
a
rget document
Preliminary document
Complete version with curves
Figure 12
changed
New template, no content change
13/14
STW13NK100Z
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