SUPSiC-GC3M0032120D

Part #SUPSiC-GC3M0032120D
Download 
SUPSiC-GC3M0032120D
GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
N Ch  
l E
 
hancement Mode  
Features  
V

DS  

I

D  

R

DS(on)  

1200 V  
63 A  
•
•
•
•
High blocking voltage with low on-resistance  
High-speed switching with low capacitances  
Fast intrinsic diode with low reverse recovery (Q

rr

)  
Halogen free, RoHS compliant  
@
25˚C  
32 m
Ω  
Benefits  
•
•
•
•
•
Reduce switching losses and minimize gate ringing  
Higher system efficiency  
Reduce cooling requirements  
Increase power density  
Increase system switching frequency  
Applications  
TO-247-3  
•
•
•
•
Solar inverters  
EV motor drive  
High voltage DC/DC converters  
Switched mode power supplies  
Package  
Part Number  
Package  
TO-247-3  
GC3M0032120D  
Maximum Ratings
(T

C

= 25 ˚C unless otherwise specified)  
Symbol  
Parameter  
Drain – Source Voltage  
Value  
Unit  
Test Conditions  
V

GS

= 0
V
,
I

D

= 100 μA  
Note  
1200  
-8/+19  
-4/+15  
63  
V
V
V
V

DSmax  

V

GSmax  

V

GSop  

Gate – Source Voltage (dynamic)  
Gate – Source Voltage (static)  
AC (f >1 Hz)  
Note 1  
Note 2  
Static  
V

GS

= 15
V
,
 
T

C

= 25˚C  
V

GS

= 15
V
,
 
T

C

= 100˚C  
Continuous Drain Current  
Pulsed Drain Current  
A
A
Fig. 19  
I

D  

48  
120  
283  
Pulse width t

P

limited by T

jmax  

I

D(pulse)  

P

D  

Power Dissipation  
W
˚C  
˚C  
T

C

=25˚C, T
 
= 175 ˚C  
Fig. 20  
J
-40 to  
+175  
Operating Junction and Storage Temperature  
Solder Temperature  
T ,
 
T

stg  

J
260  
1.6mm (0.063”) from case for 10s  
M3 or 6-32 screw  
T

L  

1
8.8  
Nm  
lbf-in  
Mounting Torque  
M

d  

Note (1):
 
When using MOSFET Body Diode V

GSmax

= -4V/+19V  
Note (2):
 
MOSFET can also safely operate at 0/+15 V  
GC3M0032120D Rev.
 
2, 10-2019  
1
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Electrical Characteristics
 
(T

C

= 25˚C unless otherwise specified)  
Symbol  
Parameter  
Min.  
1200  
1.8  
Typ.  
Max. Unit  
Test Conditions  
V

GS

= 0
V
,
I

D

= 100 μA  
Note  
V

(BR)DSS  

Drain-Source Breakdown Voltage  
V
V
2.5  
2.0  
1
3.6  
V

DS

= V

GS

, I

D

= 11.5 mA  
V

GS(th)  

Gate Threshold Voltage  
Fig. 11  
V
V

DS

= V

GS

, I

D

= 11.5 mA, T

J

= 175ºC  
V

DS

= 1200
V
,
V

GS

= 0 V  
I

DSS  

I

GSS  

Zero Gate Voltage Drain Current  
Gate-Source Leakage Current  
50  
250  
43  
μA  
nA  
10  
V

GS

= 15
V
,
V

DS

= 0 V  
23  
32  
V

GS

= 15
V
,
I

D

= 40 A  
Fig. 4,  
5, 6  
R

DS(on)  

Drain-Source On-State Resistance  
Transconductance  
m
Ω  
57.6  
27  
V

GS

= 15
V
,
I

D

= 40 A, T

J

= 175ºC  
V

DS

= 20
V
,
I

DS

= 40 A  
g

fs  

S
Fig. 7  
22  
V

DS

= 20
V
,
I

DS

= 40 A, T

J

= 175ºC  
C

iss  

Input Capacitance  
Output Capacitance  
3357  
129  
V

GS

= 0
V
,
V

DS

= 1000 V  
Fig. 17,  
18  
C

oss  

pF  
f = 100 kHz  
C

rss  

E

oss  

E

ON  

Reverse Transfer Capacitance  
C

oss

Stored Energy  
8
AC  
V
= 25 mV  
76  
μJ  
Fig. 16  
Fig. 26  
Turn-On Switching Energy (SiC Diode FWD)  
1.94  
V

DS

= 800
V
,
V

GS

= -4 V/+15
V
,
I

D

= 40 A,  
R

G(ext)

= 5Ω, L= 157 μH, Tj = 175
ºC  
mJ  
E

OFF  

E

ON  

Turn Off Switching Energy (SiC Diode FWD)  
Turn-On Switching Energy (Body Diode FWD)  
Turn Off Switching Energy (Body Diode FWD)  
0.79  
3.10  
0.72  
V

DS

= 800
V
,
V

GS

= -4 V/+15
V
,
I

D

= 40 A,  

G(ext)

= 5Ω, L= 157 μH, Tj = 175
ºC  
mJ  
ns  
Fig. 26  
Fig. 27  
R
E

OFF  

t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Rise Time  
107  
22  
V

DD

= 800
V
,
V

GS

= -4 V/15 V  

G(ext)

= 5 Ω,
I

D

= 40 A,
 
L= 157  
Timing relative to V

DS

, Inductive
 
load  
R
Turn-Off Delay Time  
Fall Time  
39  
19  
,
R

G(int)  

Q

gs  

Q

gd  

Q

g  

Internal Gate Resistance  
Gate to Source Charge  
Gate to Drain Charge  
Total Gate Charge  
1.7  
35  
Ω
f = 1 MHz
 
V

AC

= 25 mV  
V

DS

= 800
V
,
V

GS

= -4 V/15 V  
I

D

= 40 A  
Per IEC60747-8-4 pg 21  
40  
nC  
Fig. 12  
114  
GC3M0032120D Rev.
 
2, 10-2019  
2
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
(T
= 25˚C unless otherwise specified)  
Reverse Diode Characteristics  
C
Symbol  
Parameter  
Typ.  
4.6  
Max.  
Unit  
Test Conditions  
Note  
V
V

GS

= -4
V
,
I

SD

= 20 A, T
 
= 25 °C  
J
Fig. 8,  
9, 10  
V

SD  

Diode Forward Voltage  
4.2  
V
A
V

GS

= -4
V
,
I

SD

= 20 A, T
 
= 175 °C  
J
I

S  

I

S, pulse  

t

rr  

Continuous Diode Forward Current  
Diode pulse Current  
62  
Note 1  
Note 1  
V

GS

= -4
V
,
T

C

= 25˚C  
120  
A
V

GS

= -4
V
,
 
p
ulse width t

P

limited by T

jmax  

Reverse Recover time  
69  
848  
19  
ns  
nC  
A
V

GS

= -4
V
,
I

SD

= 40 A, V

R

= 800 V  
Q

rr  

Reverse Recovery Charge  
Peak Reverse Recovery Current  
Note 1  
dif/dt = 1500 A/µs, T
 
= 175 °C  
J
I

rrm  

Thermal Characteristics  
Symbol  
R

θ
JC  

Parameter  
Typ.  
0.45  
40  
Unit  
Test Conditions  
Note  
Thermal Resistance from Junction to Case  
°C/W  
Fig. 21  
R

θ
JA  

Thermal Resistance From Junction to Ambient  
GC3M0032120D Rev.
 
2, 10-2019  
3
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
120  
100  
80  
60  
40  
20  
0
120  
100  
80  
60  
40  
20  
0
V

GS

= 15V  
V

GS

= 13V  
V

GS

= 15V  
Conditions:  
T

J

= -40 °C  
tp = < 200 µs  
Conditions:  
T

J

= 25 °C  
tp = < 200 µs  
V

GS

= 13V  
V

GS

= 11V  
V

GS

= 11V  
V

GS

= 9V  
V

GS

= 9V  
V

GS

= 7V  
V

GS

= 7V  
0.0  
2.0  
4.0  
6.0  
8.0  
10.0  
12.0  
0.0  
2.0  
4.0  
6.0  
8.0  
10.0  
12.0  
Drain-Source Voltage, V

DS

(V)  
Drain-Source Voltage, V

DS

(V)  
Figure 1. Output Characteristics T

J

= -40 ºC  
Figure 2. Output Characteristics T

J

= 25 ºC  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
120  
100  
80  
60  
40  
20  
0
Conditions:  
T

J

= 175 °C  
tp = < 200 µs  
V

GS

= 15V  
V

GS

= 13V  
Conditions:  
I

DS

= 40 A  
V

GS

= 15 V  
t

p

< 200 µs  
V

GS

= 11V  
V

GS

= 9V  
V

GS

= 7V  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
140  
160  
180  
0.0  
2.0  
4.0  
6.0  
8.0  
10.0  
12.0  
Junction Temperature, T

J

(°C)  
Drain-Source Voltage, V

DS

(V)  
Figure 3.
Output Characteristics T

J

= 175 ºC  
Figure 4. Normalized On-Resistance vs. Temperature  
80  
70  
60  
50  
40  
30  
20  
10  
0
90  
Conditions:  
Conditions:  
V

GS

= 15 V  
I

DS

= 40 A  
80  
70  
60  
50  
40  
30  
20  
10  
0
t

p

< 200 µs  
t

p

< 200 µs  
T

J

= 175 °C  
V

GS

= 11 V  
T

J

= -40 °C  
T

J

= 25 °C  
V

GS

= 13 V  
V

GS

= 15 V  
-40  
-5  
30  
65  
100  
135  
170  
0
20  
40  
60  
80  
100  
120  
140  
160  
Junction Temperature, T

J

(°C)  
Drain-Source Current, I

DS

(A)  
Figure 5. On-Resistance vs. Drain Current  
For Various Temperatures  
Figure 6. On-Resistance vs. Temperature  
For Various Gate Voltage  
GC3M0032120D Rev.
 
2, 10-2019  
4
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
160  
140  
120  
100  
80  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
Conditions:  
V

DS

= 20 V  
tp < 200 µs  
0
V

GS

= -4 V  
T

J

= 175 °C  
T

J

= 25 °C  
-20  
-40  
-60  
-80  
-100  
-120  
V

GS

= 0 V  
V

GS

= -2 V  
T

J

= -40 °C  
60  
40  
20  
Conditions:  
T

J

= -40°C  
t

p

< 200 µs  
0
0
2
4
6
8
10  
12  
14  
Drain-Source Voltage V

DS

(V)  
Gate-Source Voltage, V

GS

(V)  
Figure 7. Transfer Characteristic for  
Various Junction Temperatures  
Figure 8. Body Diode Characteristic at -40 ºC  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
-10  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
0
0
V

GS

= -4 V  
V

GS

= -4 V  
-20  
-40  
-60  
-80  
-100  
-120  
-20  
-40  
-60  
-80  
-100  
-120  
V

GS

= 0 V  
V

GS

= 0 V  
V

GS

= -2 V  
V

GS

= -2 V  
Conditions:  
T

J

= 25°C  
Conditions:  
T

J

= 175°C  
t

p

< 200 µs  
t

p

< 200 µs  
Drain-Source Voltage V

DS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 9. Body Diode Characteristic at 25 ºC  
Figure 10. Body Diode Characteristic at 175 ºC  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
16  
Conditions:  

DS

= 40 A  
I

GS

= 50 mA  
V

DS

= 800 V  
T

J

= 25 °C  
Conditons  
V

GS

= V

DS  

I

DS

= 11.5 mA  
I
12  
8
4
0
-4  
-40  
-5  
30  
65  
100  
135  
170  
0
20  
40  
60  
80  
100  
120  
Junction Temperature T

J

(°C)  
Gate Charge, Q

G

(nC)  
Figure 11. Threshold Voltage vs. Temperature  
Figure 12. Gate Charge Characteristics  
GC3M0032120D Rev.
 
2, 10-2019  
5
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
-10  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
-10  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
0
0
-20  
-40  
-60  
-80  
-100  
-120  
-20  
-40  
-60  
-80  
-100  
-120  
V

GS

= 0 V  
V

GS

= 0 V  
V

GS

= 5 V  
V

GS

= 5 V  
V

GS

= 10 V  
V

GS

= 10 V  
V

GS

= 15 V  
V

GS

= 15 V  
Conditions:  
T

J

= -40 °C  
t

p

< 200 µs  
Conditions:  
T

J

= 25 °C  
t

p

< 200 µs  
Drain-Source Voltage V

DS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 13. 3rd Quadrant Characteristic at -40 ºC  
Figure 14. 3rd Quadrant Characteristic at 25 ºC  
120  
-10  
-9  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
0
V

GS

= 0 V  
100  
80  
60  
40  
20  
0
-20  
-40  
-60  
-80  
-100  
-120  
V

GS

= 5 V  
V

GS

= 10 V  
V

GS

= 15 V  
Conditions:  
T

J

= 175 °C  

p

< 200 µs  
t
0
200  
400  
600  
800  
1000  
1200  
Drain to Source Voltage, V

DS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 15. 3rd Quadrant Characteristic at 175 ºC  
Figure 16. Output Capacitor Stored Energy  
10000  
10000  
1000  
100  
10  
Conditions:  
T

J

= 25 °C  
V

AC

= 25 mV  
f = 100 kHz  
C

iss  

C

iss  

Conditions:  
T

J

= 25 °C  
V

AC

= 25 mV  
f = 100 kHz  
1000  
100  
10  
C

oss  

C

oss  

C

rss  

C

rss  

1
1
0
50  
100  
Drain-Source Voltage, V

DS

(V)  
150  
200  
0
200  
400  
600  
800  
1000  
1200  
Drain-Source Voltage, V

DS

(V)  
Figure 17. Capacitances vs. Drain-Source  
Voltage (0 – 200V)  
Figure 18. Capacitances vs. Drain-Source  
Voltage (0 – 1200V)  
GC3M0032120D Rev.
 
2, 10-2019  
6
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
80  
70  
60  
50  
40  
30  
20  
10  
0
350  
300  
250  
200  
150  
100  
50  
Conditions:  
T

J

≤ 175
°C  
Conditions:  
T

J

≤ 175
°C  
0
-55  
-30  
-5  
20  
45  
70  
95  
120  
145  
170  
-55  
-30  
-5  
20  
45  
70  
95  
120  
145  
170  
Case Temperature, T

C

(°C)  
Case Temperature, T

C

(°C)  
Figure 19. Continuous Drain Current Derating vs.  
Case Temperature  
Figure 20. Maximum Power Dissipation Derating vs.  
Case Temperature  
100.00  
1
Limited by R

DS On  

10 µs  
100 µs  
0.5  
0.3  
10.00  
1.00  
0.10  
0.01  
1 ms  
100 ms  
100E-3  
10E-3  
1E-3  
0.1  
0.05  
0.02  
0.01  
Conditions:  

C

= 25 °C  
D = 0,  
SinglePulse  
T
0.1  
1
10  
100  
1000  
1E-6  
10E-6  
100E-6  
1E-3  
Time, t

p

(s)  
10E-3  
100E-3  
1
Drain-Source Voltage, V

DS

(V)  
Figure 21. Transient Thermal Impedance  
(Junction – Case)  
Figure 22. Safe Operating Area  
5
4
3
2
1
0
5
4
3
2
1
Conditions:  
T

J

= 25 °C  
V

DD

= 600 V  
R

G(ext)

= 5
Ω  
V

GS

= -4V/+15V  
FWD = GC3M0032120D  
L = 65.7
μ
H  
Conditions:  
T

J

= 25 °C  
V

DD

= 800 V  
R

G(ext)

= 5
Ω  
V

GS

= -4V/+15V  
FWD = GC3M0032120D  
E

Total  

E

Total  

L = 157
μ
H  
E

On  

E

On  

E

Off  

E

Off  

0
0
0
10  
20  
30  
40  
50  
60  
10  
20  
30  
40  
50  
60  
70  
Drain to Source Current, I

DS

(A)  
Drain to Source Current, I

DS

(A)  
Figure 23. Clamped Inductive Switching Energy vs.  
Drain Current (V

DD

= 600V)  
Figure 24. Clamped Inductive Switching Energy vs.  
Drain Current (V

DD

= 800V)  
GC3M0032120D Rev.
 
2, 10-2019  
7
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
6
5
4
3
2
1
0
6
5
4
3
2
1
0
Conditions:  
T

J

= 25 °C  
V

DD

= 800 V  
I

DS

= 40 A  
V

GS

= -4V/+15 V  
FWD GC3M0032120D  
L = 157
μ
H  
Conditions:  
I

DS

= 40 A  
V

DD

= 800 V  
R

G(ext)

= 5
Ω  
V

GS

= -4V/+15 V  
L = 157
μ
H  
FWD = GC3M0032120D  
FWD = GC4D20120A  
E

Total  

E

Total  

E

On  

E

On  

E

Total

with diode  
E

On

with diode  
E

Off

with diode  
E

Off  

E

Off  

0
5
10  
15  
20  
25  
0
25  
50  
75  
100  
125  
150  
175  
200  
External Gate Resistor RG(ext) (Ohms)  
Junction Temperature, T

J

(°C)  
Figure 26. Clamped Inductive Switching Energy vs.  
Temperature  
Figure 25. Clamped Inductive Switching Energy vs. R

G(ext)  

200  
150  
100  
50  
Conditions:  
T

J

= 25 °C  
V

DD

= 800 V  
t

d(on)  

I

DS

= 40 A  

GS

= -4V/+15 V  
FWD = GC3M0032120D  
V
t

d(off)  

t

r  

t

f  

0
0
5
10  
15  
20  
25  
External Gate Resistor RG(ext) (Ohms)  
Figure 27. Switching Times vs. R

G(ext)  

Figure 28. Switching Times Definition  
GC3M0032120D Rev.
 
2, 10-2019  
8
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Test Circuit Schematic  
R

G  

Q

1  

L
GC3M0032120D  
V

GS

= – 4 V  
KS  
V

DC  

C

DC  

Q

2  

R

G  

D.U.T  
GC3M0032120D  
KS  
Figure 29. Clamped Inductive Switching  
Waveform Test Circuit  
Note (3): Turn-off and Turn-on switching energy and timing values measured using SiC MOSFET Body Diode as shown above.  
GC3M0032120D Rev.
 
2, 10-2019  
9
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0032120D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Package Dimensions  
Inches  
Millimeters  
Min  
POS  
Package TO-247-3  
Min  
.190  
.090  
.075  
.042  
.075  
.075  
.113  
.113  
.022  
.819  
.640  
.037  
.620  
.516  
.145  
.039  
.487  
Max  
.205  
.100  
.085  
.052  
.095  
.085  
.133  
.123  
.027  
.831  
.695  
.049  
.635  
.557  
.201  
.075  
.529  
Max  
5.21  
2.54  
2.16  
1.33  
2.41  
2.16  
3.38  
3.13  
0.68  
21.10  
17.65  
1.25  
16.13  
14.15  
5.10  
1.90  
13.43  
A
A1  
A2  
b
4.83  
2.29  
1.91  
1.07  
1.91  
1.91  
2.87  
2.87  
0.55  
20.80  
16.25  
0.95  
15.75  
13.10  
3.68  
1.00  
12.38  
b1  
b2  
b3  
b4  
c
D
D1  
D2  
E
E1  
E2  
E3  
E4  
e
.214 BSC  
3
5.44 BSC  
N
3
L
.780  
.800  
.173  
.144  
.236  
.248  
11˚  
11˚  
8˚  
19.81  
4.10  
3.51  
5.49  
6.04  
9˚  
20.32  
4.40  
3.65  
6.00  
6.30  
11˚  
11˚  
8˚  
Pinout Information:  
T
U
L1  
ØP  
Q
.161  
.138  
.216  
.238  
9˚  
•ꢀ
Pin 1 = Gate  
•ꢀ
Pin 2, 4 = Drain  
•ꢀ
Pin 3 = Source  
S
V
W
T
U
9˚  
9˚  
V
2˚  
2˚  
W
2˚  
8˚  
2˚  
8˚  
Recommended Solder Pad Layout  
TO-247-3  
GC3M0032120D Rev.
 
2, 10-2019  
10  
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©