VBsemi-Elec-2SK3706-VB

Part #VBsemi-Elec-2SK3706-VB
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VBsemi-Elec-2SK3706-VB
2SK3706  
N-Channel 100-V (D-S) MOSFET  
FEATURES  
PRODUCT SUMMARY  
V

DS

(V)  
• Isolated
 
Package  
100  
• High Voltage Isolation = 2.5 kV

RMS

(t = 60 s;  
f = 60 Hz)  
• Sink
 
to Lead Creepage Distance = 4.8 mm  
• 175
 
°C Operating Temperature  
• Dynamic
 
dV/dt Rating  
R

DS(on)

(
Ω
)  
Q

g

(Max.) (nC)  
V

GS

= 10 V  
0.086  
RoHS  
72  
11  
COMPLIANT  
Q
Q

gs

(nC)  

gd

(nC)  
32  
• Low
 
Thermal Resistance  
• Lead
 
(Pb)-free Available  
Configuration  
Single  
D
TO-220 FULLPAK  
G
S
S
D
G
N
-Channel MOSFET  
ABSOLUTE MAXIMUM RATINGS
T

C

= 25 °C, unless otherwise noted  
PARAMETER  
SYMBOL  
LIMIT  
UNIT  
Drain-Source Voltage  
Gate-Source Voltage  
V

DS  

100  
V
V

GS  

20  
T

C

= 25 °C  
18  
Continuous Drain Current  
V

GS

at 10 V  
I

D  

T

C

=
1
0
0
°
C  
12  
A
Pulsed Drain Current

a  

I

DM  

68  
0.32  
720  
Linear Derating Factor  
W/°C  
mJ  
A
Single Pulse Avalanche Energy

b  

Repetitive Avalanche Current

a  

Repetitive Avalanche Energy

a  

E

AS  

I

AR  

17  
E

AR  

4.8  
mJ  
W
Maximum Power Dissipation  
T

C

= 25 °C  
P

D  

48  
Peak Diode Recovery dV/dt

c  

dV/dt  
T

J

, T

stg  

5.5  
V/ns  
Operating Junction and Storage Temperature Range  
Soldering Recommendations (Peak Temperature)  
– 55 to + 175  
300

d  

10  
°C  
for 10 s  
lbf · in  
N · m  
Mounting Torque  
6-32 or M3 screw  
1.1  
Notes  
a. Repetitive
 
rating; pulse width limited by maximum junction temperature (see fig. 11).  
b. V

DD

= 25 V, starting T

J

= 25 °C, L = 3.7 mH, R

G

= 25
Ω
, I

AS

= 17 A (see fig. 12).  
c. I

SD

≤
17 A, dI/dt
≤
200 A/µs, V

DD

≤
V

DS

, T

J

≤
175 °C.  
d. 1.6
 
mm from case.  
服务热线:400-655-8788  
1

2SK3706  
THERMAL RESISTANCE RATINGS  
PARAMETER  
SYMBOL  
TYP.  
MAX.  
65  
UNIT  
Maximum Junction-to-Ambient  
Maximum Junction-to-Case (Drain)  
R

thJA  

R

thJC  

–
–
°C/W  
3.1  
SPECIFICATIONS
T

J

= 25 °C, unless otherwise noted  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
Static  
Drain-Source Breakdown Voltage  
V

DS

Temperature Coefficient  
Gate-Source Threshold Voltage  
Gate-Source Leakage  
V

DS  

Δ
V

DS

/T

J  

V

GS(th)  

I

GSS  

V

GS

= 0 V, I

D

= 250 µA  
Reference to 25 °C, I

D

= 1 mA  
V

DS

= V

GS

, I

D

= 250 µA  
100  
–
–
V
V/°C  
V
–
0.13  
–
1.0  
–
–
–
–
3.0  
100  
25  
250  
V

GS  

V

DS

= 100 V, V

GS

= 0 V  

DS

= 80 V, V

GS

= 0 V, T

J

= 150 °C  
V

GS

= 10 V  
I

D

= 10 A

b  

=
20 V  
–
–
–
nA  
Zero Gate Voltage Drain Current  
I

DSS  

µA  
V
Drain-Source On-State Resistance  
Forward Transconductance  
Dynamic  
R

DS(on)  

g

fs  

Ω
–
0.086  
–
–
–
V

DS

= 50 V, I

D

= 10 A

b  

9.1  
S
Input Capacitance  
C

iss  

C

oss  

C

rss  

C
–
–
–
–
–
–
–
–
–
–
–
1700  
560  
120  
12  
–
–
–
V

GS

= 0 V,  
V

DS

= 25 V,  
f = 1.0 MHz, see fig. 5  
Output Capacitance  
Reverse Transfer Capacitance  
Drain to Sink Capacitance  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Turn-On Delay Time  
Rise Time  
pF  
nC  
ns  
–
f = 1.0 MHz  
–
Q

g  

72  
11  
32  
–
I

D

= 17 A, V

DS

= 80 V,  
Q

gs  

Q

gd  

t

d(on)  

t

r  

V

GS

= 10 V  
–
see fig. 6 and 13

b  

–
11  
44  
53  
43  
V

DD

= 50 V, I

D

= 17 A,  
R

G

= 9.1
Ω

,

R

D

= 2.9
Ω
,  
see fig. 10

b  

–
Turn-Off Delay Time  
Fall Time  
t

d(off)  

t

f  

–
–
D
Between lead,  
Internal Drain Inductance  
Internal Source Inductance  
L

D  

L

S  

–
–
4.5  
7.5  
–
–
6 mm (0.25″) from  
package and center of  
die contact  
nH  
G
S
Drain-Source Body Diode Characteristics  
MOSFET symbol  
showing the  
integral reverse  
p – n junction diode  
D
Continuous Source-Drain Diode Current  
I

S  

–
–
–
–
17  
68  
A
G
Pulsed Diode Forward Current

a  

I

SM  

S
Body Diode Voltage  
V

SD  

t

rr  

T

J

= 25 °C, I

S

= 17 A, V

GS

= 0 V

b  

–
–
–
–
2.5  
360  
2.6  
V
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
Forward Turn-On Time  
180  
1.3  
ns  
µC  
T

J

= 25 °C, I

F

= 17 A, dI/dt = 100 A/µs

b  

Q

rr  

t

on  

Intrinsic turn-on time is negligible (turn-on is dominated by L

S

and L

D

)  
Notes  
a. Repetitive
 
rating; pulse width limited by maximum junction temperature (see fig. 11).  
b. Pulse
 
width
≤
300 µs; duty cycle
≤
2 %.  
服务热线:400-655-8788  
2

2SK3706  
TYPICAL CHARACTERISTICS
25 °C, unless otherwise noted  
Fig. 1 – Typical Output Characteristics, T

C

= 25 °C  
Fig. 3 – Typical Transfer Characteristics  
Fig. 2 – Typical Output Characteristics, T

C

= 175 °C  
Fig. 4 – Normalized On-Resistance vs. Temperature  
服务热线:400-655-8788  
3

2SK3706  
Fig. 7 – Typical Source-Drain Diode Forward Voltage  
Fig. 5 – Typical Capacitance vs. Drain-to-Source Voltage  
Fig. 8 – Maximum Safe Operating Area  
Fig. 6 – Typical Gate Charge vs. Gate-to-Source Voltage  
服务热线:400-655-8788  
4

2SK3706  
R

D  

V

DS  

V

GS  

D.U.T.  
R

G  

+
V
–
DD  
10
V  
P
u
lse
w
idth
≤
1
µ
s  
D
u
ty factor
≤
0.1
%  
Fig. 10a – Switching Time Test Circuit  
V

DS  

90
%  
10
%  
V

GS  

t

d(on)

t

r  

t

d(off)

t

f  

Fig. 9 – Maximum Drain Current vs. Case Temperature  
Fig. 10b – Switching Time Waveforms  
Fig. 11 – Maximum Effective Transient Thermal Impedance, Junction-to-Case  
L
V

DS  

V

DS  

V
ary t

p

to o
b
tain  
re
qu
ired I

AS  

t

p  

V

DD  

D.U.T  
R

G  

+
–
V

DD  

V

DS  

I

AS  

10
V  
0.01
Ω
 
Fig. 12a – Unclamped Inductive Test Circuit  
服务热线:400-655-8788  
t

p  

I

AS  

Fig. 12b – Unclamped Inductive Waveforms  
5

2SK3706  
Fig. 12c – Maximum Avalanche Energy vs. Drain Current  
C
u
rrent reg
u
lator  
Same type as D.U.T.  
50 k
Ω
 
Q

G  

10
V  
12
V
 
0.2
µ
F  
0.3
µ
F  
Q

GS  

Q

GD  

+
V

DS  

D.U.T.  
–
V

G  

V

GS  

3 mA  
Charge  
I

G  

I

D  

C
u
rrent sampling resistors  
Fig. 13b – Gate Charge Test Circuit  
Fig. 13a – Basic Gate Charge Waveform  
服务热线:400-655-8788  
6

2SK3706  
Peak Diode Recovery dV/dt Test Circuit  
+
Circ
u
it layo
u
t considerations  
•
Lo
w
stray ind
u
ctance  
•
Gro
u
nd plane  
D.U.T.  
•
Lo
w
leakage ind
u
ctance  
c
u
rrent transformer  
–
+
–
–
+
R

G  

•
d
V
/dt controlled
b
y R

G  

+
–
•
Dri
v
er same type as D.U.T.  
•
I

SD

controlled
b
y d
u
ty factor “D”  
•
D.U.T. – de
v
ice
u
nder test  
V

DD  

Dri
v
er gate dri
v
e  
P.
W
.  
P.
W
.  
Period  
Period  
D =  
V
= 10
V
*  
GS  
D.U.T. I
 
w
a
v
eform  
SD  
Re
v
erse  
reco
v
ery  
c
u
rrent  
Body diode for
w
ard  
c
u
rrent  
dI/dt  
D.U.T.
V w
a
v
eform  
DS  
Diode reco
v
ery  
d
V
/dt  
V
DD  
Re-applied  
v
oltage  
Body diode for
w
ard drop  
Ripple
≤
5
%  
Ind
u
ctor c
u
rrent  
I
SD  
*
V

GS

= 5
V
for logic le
v
el de
v
ices  
Fig.14 – For N-Channel  
服务热线:400-655-8788  
7

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