Vishay-Intertech-SI5457DC-T1-GE3

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Vishay-Intertech-SI5457DC-T1-GE3
Si5457DC  
Vishay Siliconix  
P-Channel 20 V (D-S) MOSFET  
FEATURES  
• TrenchFET

®

power MOSFET  
1206-8 ChipFET

®

S
in
g
le  
D
8
D
7
D
6
• 100 % R

g

tested  
S
5
• Material categorization:
 
for definitions of compliance please see  
1
D
2
D
3
D
4
G
1
APPLICATIONS  
Top View  
Bottom View  
• Portable devices
  
– Load switch
  
S
Marking code:
BT  
– Charger switch
  
– Battery switch
  
– DC/DC converter  
PRODUCT SUMMARY  
V

DS

(V)  
G
-20  
0.036  
0.041  
0.056  
12.5  
R

DS(on)

max. (
) at V

GS

= -4.5 V  
R

DS(on)

max. (
) at V

GS

= -3.6 V  
R

DS(on)

max. (
) at V

GS

= -2.5 V  
Q

g

typ. (nC)  

D

(A)

a  

Configuration  
D
P-Channel MOSFET  
I
-6  
Single  
ORDERING INFORMATION  
Package  
1206-8 ChipFET  
Lead (Pb)-free and halogen-free  
Si5457DC-T1-GE3  
ABSOLUTE MAXIMUM RATINGS
(T

A

= 25 °C, unless otherwise noted)  
PARAMETER  
SYMBOL  
LIMIT  
-20  
UNIT  
Drain-source voltage  
Gate-source voltage  
V

DS  

V
V

GS  

12  
T

C

= 25 °C  
T

C

= 70 °C  
T

A

= 25 °C  
T

A

= 70 °C  
-6

a  

-6

a  

-6

a, b, c  

-5.2

b, c  

-20  
Continuous drain current (T

J

= 150 °C)  
I

D  

A
Pulsed drain current  
I

DM  

I

S  

T

C

= 25 °C  
T

A

= 25 °C  
-4.8  
-1.9

b, c  

Continuous source-drain diode current  
T

C

= 25 °C  

C

= 70 °C  
5.7  
T
3
Maximum power dissipation  
P

D  

W
T

A

= 25 °C  
T

A

= 70 °C  
2.3

b, c  

1.2

b, c  

-55 to +150  
260  
Operating junction and storage temperature range  
Soldering recommendations (peak temperature)

d, e  

T

J

, T

stg  

°C  
THERMAL RESISTANCE RATINGS  
PARAMETER  
Maximum junction-to-ambient

b, f  

SYMBOL  
R

thJA  

TYPICAL  
MAXIMUM  
UNIT  
t
5 s  
Steady state  
45  
18  
55  
22  
°C/W  
Maximum junction-to-foot (drain)  
R

thJF  

Notes  
a. Package
 
limited  
b. Surface
 
mounted on 1″ x 1″ FR4 board  
c. t
 
= 5 s  
d.

). The 1206-8 ChipFET is a leadless package. The end of the lead terminal is exposed copper  
(not plated) as a result of the singulation process in manufacturing. A solder fillet at the exposed copper tip cannot be guaranteed and is not  
required to ensure adequate bottom side solder interconnection  
e. Rework
 
conditions: manual soldering with a soldering iron is not recommended for leadless components  
f. Maximum
 
under steady state conditions is 95 °C/W  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
1
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Si5457DC  
Vishay Siliconix  
SPECIFICATIONS
(T

J

= 25 °C, unless otherwise noted)  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
Static  
Drain-source breakdown voltage  
V

DS  

V

DS

/T

J  

V

GS(th)

/T

J  

V

GS(th)  

V

GS

= 0 V, I

D

= -250 μA  
I

D

= -250 μA  
-20  
–
–
–
V
V

DS

temperature coefficient  
–
-14  
mV/°C  
V

GS(th)

temperature coefficient  
Gate-source threshold voltage  
Gate-source leakage  
–
3.2  
–
V

DS

= V

GS

, I

D

= -250 μA  
-0.6  
–
-1.4  
100  
-1  
V
I

GSS  

V

DS

= 0 V, V

GS  

=
12 V  
–
–
–
nA  
V

DS

= -20 V, V

GS

= 0 V  
V

DS

= -20 V, V

GS

= 0 V, T

J

= 85 °C  
V

DS

-5 V, V

GS

= -4.5 V  
–
–
Zero gate voltage drain current  
On-state drain current

a  

I

DSS  

μA  
A
–
-5  
I

D(on)  

-20  
–
–
–
V

GS

= -4.5 V, I

D

= -4.9 A  
0.030  
0.034  
0.046  
16  
0.036  
0.041  
0.056  
–
Drain-source on-state resistance

a  

R

DS(on)  

g

fs  

V

GS

= -3.6 V, I

D

= -4.6 A  
–
V

GS

= -2.5 V, I

D

= -2 A  
–
Forward transconductance

a  

Dynamic

b  

V

DS

= -10 V, I

D

= -4.9 A  
–
S
Input capacitance  
C

iss  

C

oss  

C

rss  

–
–
1000  
225  
195  
25  
–
–
Output capacitance  
Reverse transfer capacitance  
V

DS

= -10 V, V

GS

= 0 V, f = 1 MHz  
V

DS

= -10 V, V

GS

= -10 V, I

D

= -6.5 A  
V

DS

= -10 V, V

GS

= -4.5 V, I

D

= -6.5 A  
f = 1 MHz  
pF  
–
–
–
38  
19  
–
Total gate charge  
Q

g  

–
12.5  
2
nC  
Gate-source charge  
Gate-drain charge  
Q

gs  

Q

gd  

R

g  

–
–
4
–
Gate resistance  
0.9  
–
4.6  
25  
9.2  
50  
40  
60  
25  
20  
20  
55  
25  
Turn-on delay time  
t

d(on)  

t

r  

t

d(off)  

t

f  

t

d(on)  

t

r  

t

d(off)  

t

f  

Rise time  
–
20  
V

DD

= -10 V, R

L

= 1.9
  
I

D

-5.2 A, V

GEN

= -4.5 V, R

g

= 1
  
Turn-off delay time  
–
30  
Fall time  
–
12  
ns  
Turn-on delay time  
–
10  
Rise time  
–
10  
V

DD

= -10 V, R

L

= -1.9
  
I

D

-5.2 A, V

GEN

= -10 V, R

g

= 1
  
Turn-off delay time  
–
27  
Fall time  
–
12  
Drain-Source Body Diode Characteristics  
Continuous source-drain diode current  
Pulse diode forward current  
Body diode voltage  
I

S  

I

SM  

V

SD  

t

rr  

T

C

= 25 °C  
–
–
–
–
–
–
–
–
–
-6  
-20  
-1.2  
40  
20  
–
A
I

S

= -5.2 A, V

GS

= 0 V  
-0.8  
20  
10  
10  
10  
V
Body diode reverse recovery time  
Body diode reverse recovery charge  
Reverse recovery fall time  
Reverse recovery rise time  
ns  
nC  
Q

rr  

t

a  

I

F

= -5.2 A, di/dt = 100 A/μs,  
TJ = 25 °C  
ns  
t

b  

–
Notes  
a. Pulse
 
test; pulse width
300 μs, duty cycle
2%  
b. Guaranteed
 
by design, not subject to production testing  
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation  
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum  
rating conditions for extended periods may affect device reliability.  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
2
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Si5457DC  
Vishay Siliconix  
TYPICAL CHARACTERISTICS
(25 °C, unless otherwise noted)  
20  
5
4
3
2
1
0
V
= 5 V thru 3 V  
GS  
V
= 2.5 V  
GS  
16  
12  
8
V
= 2 V  
GS  
T
= 25 °C  
C
4
T
= 125 °C  
1.0  
C
V
= 1.5 V  
GS  
T
= – 55 °C  
C
0
0
0
0
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
20  
30  
0
0.5  
1.5  
2.0  
V

D
S

– Drain-to-
S
ource Voltage (V)  
V

GS

–
G
ate-to-
S
ource Voltage (V)  
Output Characteristics  
Transfer Characteristics  
0.08  
0.06  
0.04  
0.02  
0
1800  
1500  
1200  
900  
600  
300  
0
V
= 2.5 V  
GS  
C
i
ss  
V
= 3.6 V  
GS  
V
= 4.5 V  
C
GS  
o
ss  
C
r
ss  
4
8
12  
16  
0
3
6
9
12  
V

D
S

– Drain-to-
S
ource Voltage (V)  
I

D

– Drain Current (A)  
On Resistance vs. Drain Current  
Capacitance  
10  
8
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I
= 6.5 A  
D
V
= 4.5 V; 3.6 V; I
 
= 4.9 A  
D
GS  
V
= 10 V  
D
S  
6
V
= 5 V  
D
S  
V
= 2.5 V; I
 
= 2 A  
D
GS  
V
= 16 V  
D
S  
4
2
0
5
10  
15  
20  
25  
– 50
 
– 25  
0
25  
50  
75  
100 125 150  
T

J

– Junction Temperature (°C)  
Q

g

– Total
G
ate Charge (nC)  
Gate Charge  
On-Resistance vs. Junction Temperature  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
3
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Si5457DC  
Vishay Siliconix  
TYPICAL CHARACTERISTICS
(25 °C, unless otherwise noted)  
0.12  
0.10  
0.08  
0.06  
0.04  
0.02  
0
100  
I
= 4.9 A  
D
T
= 150 °C  
J
10  
T
= 125 °C  
J
T
= 25 °C  
J
1
T
= 25 °C  
J
0.1  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0
1
2
3
4
5
V

S
D

–
S
ource-to-Drain Voltage (V)  
V

GS

–
G
ate-to-
S
ource Voltage (V)  
Forward Diode Voltage vs. Temperature  
On-Resistance vs. Gate-to-Source Voltage  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
50  
40  
I
= 250 μA  
D
30  
20  
10  
0
10  
– 50
 
– 25  
0
25  
50  
75  
100 125 150  
-3  
-2  
-1  
10  
10  
1
10  
100  
600  
Time (s)  
T

J

– Temperature (°C)  
Threshold Voltage  
Single Pulse Power  
100  
Limited by R  
*
D
S
(on)  
10  
1
1 m
s
 
10 m
s  
100 m
s  
1
s  
10
s  
0.1  
DC  
T
= 25 °C  
A
S
ingle Pul
s
e  
BVD
SS
Limited  
0.01  
0.1  
1
10  
100  
V

D
S

– Drain-to-
S
ource Voltage (V)  
* V

GS

> minimum V

GS

at which R

D
S
(on)

i
s s
pecified  
Safe Operating Area, Junction-to-Ambient  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
4
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Si5457DC  
Vishay Siliconix  
TYPICAL CHARACTERISTICS
(25 °C, unless otherwise noted)  
6
5
4
3
2
1
0
12  
9
Package Limited  
6
3
0
25  
50  
75  
100  
125  
150  
0
25  
50  
75  
100  
125  
150  
T

C

– Ca
s
e Temperature (°C)  
T
C
– Case
T
e
mperature (°C)  
Current Derating

a  

Power Derating  
Note  
a. The
 
power dissipation P

D

is based on T

J

max. = 150 °C, using junction-to-case thermal resistance, and is more useful in settling the upper  
dissipation limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the  
package limit  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
5
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Si5457DC  
Vishay Siliconix  
TYPICAL CHARACTERISTICS
(25 °C, unless otherwise noted)  
2
1
D
u
ty Cycle = 0.5  
0.2  
0.1  
Notes:  
P
DM  
0.1  
0.05  
t
1
t
2
t
t
0.02  
1
2
1. D
u
ty Cycle, D =  
2. Per Unit Base = R  
= 95 °C/W  
thJA  
(t)  
3. T  
– T
 
= P  
Z
JM  
A
DM thJA  
Single P
u
lse  
4. S
u
rface Mo
u
nted  
0.01  
-4  
-3  
-2  
-1  
10  
10  
10  
10  
1
10  
100  
600  
Sq
u
are Wave P
u
lse D
u
ration (s)  
Normalized Thermal Transient Impedance, Junction-to-Ambient  
2
1
D
u
ty Cycle = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
Single P
u
lse  
0.01  
-4  
-3  
-2  
-1  
10  
10  
10  
10  
1
10  
Sq
u
are Wave P
u
lse D
u
ration (s)  
Normalized Thermal Transient Impedance, Junction-to-Foot  
S10-2011-Rev. A, 06-Sep-10  
Document Number: 67013  
6
For technical questions, contact:

THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT  
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH
A
T

Package Information  
Vishay Siliconix  
1206-8 ChipFET
R
 
4
L
D
8
1
7
2
6
3
5
4
5
4
6
3
7
2
8
1
4
E
1
E
x
S
e
b
c
Backside View  
2X 0.10/0.13 R  
A
DETAIL X  
NOTES:  
1. All
 
dimensions are in millimeaters.  
2. Mold
 
gate burrs shall not exceed 0.13 mm per side.  
3. Leadframe
 
to molded body offset is horizontal and vertical shall not exceed  
0.08 mm.  
4. Dimensions
 
exclusive of mold gate burrs.  
5. No
 
mold flash allowed on the top and bottom lead surface.  
MILLIMETERS  
INCHES  
Min Nom Max  
Dim  
A
b
c
c1  
D
E
E

1  

e
Min  
1.00  
0.25  
0.1  
Nom  
−
Max  
1.10  
0.039  
0.010  
0.004  
0
−
0.012  
0.006  
−
0.043  
0.014  
0.008  
0.0015  
0.122  
0.078  
0.067  
0.30  
0.35  
0.15  
0.20  
0
−
0.038  
3.10  
2.95  
1.825  
1.55  
3.05  
0.116  
0.072  
0.061  
0.120  
0.075  
0.065  
0.0256 BSC  
−
1.90  
1.975  
1.70  
1.65  
0.65 BSC  
−
0.28  
0.42  
0.0
1
1  
0.017  
L
0.55 BSC  
5
_
Nom  
0.022 BSC  
5
_
Nom  
S
ECN: C-03528—Rev.
 
F
,
1
9-Jan-04  
DWG: 5547  
Document Number:
 
71151  
15-Jan-04  
1

AN811  
Vishay Siliconix  
Single-Channel 1206-8 ChipFET
r
Power MOSFET Recommended  
Pad Pattern and Thermal Performance  
INTRODUCTION  
New Vishay Siliconix ChipFE
T
s
i
n the leadless 1206-8  
package feature the same outline as popular 1206-8 resistors  
and capacitors but provide all the performance of true power  
semiconductor devices. The 1206-8 ChipFET has the same  
footprint as the body of the LITTLE FOOT
R
TSOP-6, and can  
be thought of as a leadless TSOP-6 for purposes of visualizing  
board area, but its thermal performance bears comparison  
with the much larger SO-8.  
80 mil  
68 mil  
This technical note discusses the single-channel ChipFET  
1206-8 pin-out, package outline, pad patterns, evaluation  
board layout, and thermal performance.  
28 mil  
26 mil  
PIN-OUT  
FIGURE 2.
Footprint With Copper Spreading  

Figure 1

shows the pin-out description and Pin 1 identification  
for the single-channel 1206-8 ChipFET device. The pin-out is  
similar to the TSOP-6 configuration, with two additional drain  
pins to enhance power dissipation and thermal performance.  
The legs of the device are very short, again helping to reduce  
the thermal path to the external heatsink/pcb and allowing a  
larger die to be fitted in the device if necessary.  
The pad pattern with copper spreading shown in Figure 2  
improves the thermal area of the drain connections (pins  
1,2,3,6.7,8) while remaining within the confines of the basic  
footprint. The drain
 
copper area is 0.0054 sq. in. or  
3.51 sq. mm). This will assist the power dissipation path away  
from the device (through the copper leadframe) and into the  
board and exterior chassis (if applicable) for the single device.  
The addition of a further copper area and/or the addition of vias  
to other board layers will enhance the performance still further.  
An example of this method is implemented on the  
Vishay Siliconix
 
Evaluation Board described in the next  
section

).  
Single 1206-8 ChipFE
T  
1
D
D
D
D
D
D
G
THE VISHAY SILICONIX EVALUATION  
BOARD FOR THE SINGLE 1206-8  
S
Bottom View  
The ChipFET 1206-08 evaluation board measures 0.6 in by  
0.5 in. Its copper pad pattern consists of an increased pad area  
around the six drain leads on the top-side—approximately  
0.0482 sq. in. 31.1 sq. mm—and vias added through to the  
underside of the board, again with a maximized copper pad  
area of approximately the board-size dimensions. The outer  
package outline is for the 8-pin DI
P
,
w
hich will allow test  
sockets to be used to assist in testing.  
FIGURE 1.  
For package dimensions see the 1206-8 ChipFET package  
outline drawing (

).  
BASIC PAD PATTERNS  
The basic pad layout with dimensions is shown in Application  
Note 826,
Recommended Minimum Pad Patterns With Outline  
The thermal performance of the 1206-8 on this board has been  
measured with the results following on the next page. The  
testing included comparison with the minimum recommended  
footprint on the evaluation board-size pcb and the industry  
standard one-inch square FR4 pcb with copper on both sides  
of the board.  
Drawing  
Access  
for  
Vishay Siliconix  
MOSFE
T
s,  
(

). This is sufficient for low  
power dissipation MOSFET applications, but power  
semiconductor performance requires a greater copper pad  
area, particularly for the drain leads.  
Document Number:
 
71126  
12-Dec-03  
1
 

AN811  
Vishay Siliconix  
Front of Board  
Back of Board  
ChipFET
r
 
vishay.com  
FIGURE 3.  
The results show that a major reduction can be made in the  
thermal resistance by increasing the copper drain area. In this  
example, a 45
_
C/W reduction was achieved without having to  
increase the size of the board. If increasing board size is an  
option, a further 33
_
C/W reduction was obtained by  
maximizing the copper from the drain on the larger 1” square  
pcb.  
THERMAL PERFORMANCE  
Junction-to-Foot Thermal Resistance  
(the Package Performance)  
Thermal performance for the 1206-8 ChipFET measured as  
junction-to-foot thermal resistance is 15
_
C/W typical, 20
_
C/W  
maximum for the single device. The “foot” is the drain lead of  
the device as it connects with the body. This is identical to the  
SO-8 package R

Q

jf

performance, a feat made possible by  
shortening the leads to the point where they become only a  
small part of the total footprint area.  
160  
120  
Single EVB  
Min. Footprint  
Junction-to-Ambient Thermal Resistance  
(dependent on pcb size)  
80  
40  
The typical R

Q

ja

for the single-channel 1206-8 ChipFET is  
80
_
C/W steady state, compared with 68
_
C/W for the SO-8.  
Maximum ratings are 95
_
C/W for the 1206-8 versus 80
_
C/W  
for the SO-8.  
1” Square PCB  
Testing  
0
To aid comparison further,

illustrates ChipFET 1206-8  
thermal performance on two different board sizes and three  
different pad patterns. The results display the thermal  
performance out to steady state and produce a graphic  
account of how an increased copper pad area for the drain  
connections can enhance thermal performance. The  
measured steady state values of R

Q

ja

for the single 1206-8  
ChipFET are :  
-5  
-4  
-3  
-2  
-1  
10  
10  
10  
10  
10  
Time (Secs)  
1
10  
100  
1000  
FIGURE 4.
Single 1206
−
8 ChipFET  
SUMMARY  
The thermal results for the single-channel 1206-8 ChipFET  
package display similar power dissipation performance to the  
SO-8 with a footprint reduction of 80%. Careful design of the  
package has allowed for this performance to be achieved. The  
short leads allow the die size to be maximized and thermal  
resistance to be reduced within the confines of the TSOP-6  
body size.  
1) Minimum recommended pad pattern (see
 
156
_
C/W  

Figure 2

) on the evaluation board size of  
0.5 in x 0.6 in.  
2) The evaluation board with the pad pattern
 
111
_
C/W  
ASSOCIATED DOCUMENT  
3) Industry standard 1” square pcb with  
maximum copper both sides.  
78
_
C/W  
1206-8 ChipFET Dual Thermal performance, AN812  
Document Number:
 
71126  
12-Dec-03  
2
 

Application Note 826  
Vishay Siliconix  
RECOMMENDED MINIMUM
P
A
DS FOR 1206-8 ChipFET

®  

0.093  
(2.357)  
0.026  
0.016  
0.010  
(0.650)  
(0.406)  
(0.244)  
Recommended Minimum Pads  
Dimensions in Inches/(mm)  
Return to Index  
2
Document Number: 72593  
Revision: 21-Jan-08  

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