Wild-Goose-WGF12N60SE

Part #Wild-Goose-WGF12N60SE
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Wild-Goose-WGF12N60SE
WGF12N60SE  
600V N-Channel MOSFET  
TO-220F  
WGF12N60SE  
Features:  
□
Low Intrinsic Capacitances  
□
Excellent Switching Characteristics  
□
Extended Safe Operating Area  
□
Unrivalled Gate Charge :Qg= 42nC (Typ.)  
□
V
DSS
=600V,I
D
=12A  
1.Gate (G)  
2.Drain (D)  
3.Source (S)  
□
R

DS(on)

:0.60 Ω (Max) @VG=10V  
□
100% Avalanche Tested  
Absolute Maximum Ratings
(Ta=25
℃
unless otherwise noted)  
Symbol  
Parameter  
Value  
600  
12  
Unit  
V

DSS  

Drain-Source Voltage  
Drain Current  
V
T

j

=25
℃  
I

D  

A
T

j

=100
℃  
7.9  
V

GSS  

E

AS  

Gate-Source Voltage  
±30  
870  
V
Single Pulse Avalanche Energy (note1)  
mJ  
I

AR  

P

D  

T

j  

Avalanche Current (note2)  
Power Dissipation (Tj=25
℃
)  
Junction Temperature(Max)  
Storage Temperature  
12  
70  
A
W
℃
℃
150  
T

stg  

-55~+150  
Maximum lead temperature for soldering purpose,1/8” from  
case for 5 seconds  
TL  
300  
℃
Thermal Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
2.27  
62.5  
Unit  
℃
/W  
℃
/W  
R

θJC  

R

θJA  

Thermal Resistance,Junction to Case  
Thermal Resistance,Junction to Ambient  
–
–
WildGoose Semiconductor
 
Rev. A1.0, 2018  
1

WGF12N60SE  
600V N-Channel MOSFET  
Electrical Characteristics
 
(Ta=25
℃
unless otherwise noted)  
Symbol  
Parameter  
Test Condition  
Min.  
Typ.  
Max.  
Unit  
Off Characteristics  
BV

DSS  

Drain-Source Breakdown Voltage  
I

D

=250μA
,
V

GS

=0  
600  
–
0.71  
–
–
–
V
I

D

=250μA ,Reference  
to 25
℃  
Breakdown Voltage Temperature  
Coefficient  
△
BVDSS/
△
TJ  
–
–
V/
℃  
V

DS

=600V, V

GS

=0V  
10  
I

DSS  

Zero Gate Voltage Drain Current  
μA  
nA  
V

DS

=480V, Tj=125
℃  
100  
Gate-body leakage Current,  
Forward  
Gate-body leakage Current,  
Reverse  
I

GSSF  

I

GSSR  

On Characteristics  
V

GS

=+30V, V

DS

=0V  
V

GS

=-30V, V

DS

=0V  
–
–
–
–
100  
-100  
V

GS(TH)  

R

DS(ON)  

Date Threshold Voltage  
I

D

=250μA,V

DS

=V

GS  

I

D

=6.0A,V

GS

=10V  
2
–
–
–
4
V
Ω
Static Drain-Source  
On-Resistance  
0.60  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
–
–
–
1920  
166  
18  
–
–
–
V

DS

=25V
,
V

GS

=0
,  
f=1.0MHz  
Output Capacitance  
pF  
Reverse Transfer Capacitance  
Switching Characteristics  
Td(on)  
Tr  
Turn-On Delay Time  
–
–
–
–
–
–
–
30  
80  
70  
165  
300  
165  
47  
–
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Rise Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
V

DD

=300V
,
I

D

=12A  
R

G

=25Ω (Note 3,4)  
ns  
Td(off)  
Tf  
144  
77  
Qg  
44  
V

DS

=480V,V

GS

=10V
,  
I

D

=12A (Note 3,4)  
Qgs  
Qgd  
6.7  
18.5  
nC  
–
Drain-Source Diode Characteristics and Maximum Ratings  
Is  
Max. Diode Forward Current  
Max. Pulsed Forward Current  
Diode Forward Voltage  
–
–
–
–
–
–
12  
48  
1.4  
–
A
I

SM  

V

SD  

Trr  
–
–
–
I

D

=12A  
V
I

S

=12A,V

GS

=0V  
diF/dt=100A/μs  
(Note3)  
Reverse Recovery Time  
380  
nS  
Qrr  
Reverse Recovery Charge  
–
3.5  
–
μC  
Notes : 1, L=17.1mH, IAS=12A, VDD=50V, RG=25 Ω, Starting TJ =25°C  
2, Repetitive Rating : Pulse width limited by maximum junction temperature  
3, Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2%  
4, Essentially Independent of Operating Temperature  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
2

WGF12N60SE  
600V N-Channel MOSFET  
Typical Characteristics  
V

GS  

To
p
:  
15.
0
V  
10.
0
V  
8.
0
V  
7.
0
V  
6.
0
V  
5.
5
V  
5.
0
V  
10

1  

150

o  

C
10

1

Botto
m
:
4
.5
 
V  
-55

o

C  
25

o

C  
10

0  

※
Notes :  
1. 250μ  
T

C

= 25
℃
 
10

0  

※
s
Pulse Tes
t
2
.  
Note
s
:  
1.
V

DS

=
4
0V  
μ
2.
250
s
P
uls
e
T
est  
10

-1  

10

0  

10

1  

2
4
6
8
10  
V

GS

, Gate-Source Voltage [V]  
V

DS

, Drain-Source Voltage [V]  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
1.5  
1.0  
0.5  
10

1  

V

GS

= 10V  
10

0  

150
℃
 
V

G
S

=
2
0V  
※
Notes :  
1.
V

GS

=
0
V  
μ
25  
℃
2.
250
s
P
uls
e
T
est  
※
℃
Note : T

J

= 25  
10

-1  

0.2  
0
5
10  
15  
20  
25  
30
3
5  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
I

D

, Drain Current [A]  
V

SD

, Source-Drain voltage [V]  
Figure 3. On-Resistance Variation vs  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
3500  
12  
10  
8
C

iss

= C

gs

+ C

gd

(C

ds

= shorted)  
C

oss

= C

ds

+ C  
gd  
C

rss

= C

gd  

V

DS

= 120V  
V

DS

= 300V  
3000  
2500  
2000  
1500  
1000  
500  
V

DS

= 480V  
C

iss  

C

oss  

6
※
Notes;  
4
1.
V

G
S

=
0
V  
2.
f =
1
M
Hz  
C

rss  

2
0
※
Note : I

D

= 12A  
40  
0
10

-1  

0
10  
10

1  

0
10  
20  
30  
50  
Q

G

, Total Gate Charge [nC]  
V

DS

, Drain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
3

WGF12N60SE  
600V N-Channel MOSFET  
Typical Characteristics
 
(Continued)  
1.2  
1.1  
1.0  
3.0  
2.5  
2.0  
1.5  
1.0  
※
Notes :  
0.9  
0.8  
1.
V

G
S

=
0V  
2.
I

D

=
2
50
μ
A  
※
Notes :  
1. V

GS

= 10 V  
2. I

D

= 6.0 A  
0.5  
0.0  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
T , Junction Temperature [

o

C]  
T, Junction Temperature [

o

C]  
J
J
Figure 8. On-Resistance Variation  
vs Temperature  
Figure 7. Breakdown VoltageVariation  
vs Temperature  
14  
12  
10  
8
Operatio
n
in Th
i
s
A
rea  
10

2  

is Limite
d
b
y R  
DS(on)  
10
s  
10
0
s  
10

1  

1 ms  
1
0
ms  
100 ms  
DC  
10

0  

6
4
10

-1  

10

-2  

※
Notes :  
1.
T

C

= 25
 

o  

C
2
2. T
=
1
5
0

o

C  
J
3. Singl
e
P
ulse  
0
25  
50  
75  
100  
125  
150  
10

0  

10

1  

10

2  

10

3  

℃
T

C

, Case Temperature [  
]
V

DS

, Drain-Source Voltage [V]  
Figure 10. Maximum Drain Current  
vs Case Temperature  
Figure 9-2. Maximum Safe Operating Area  
D=  
2
0 . 5
 
0.  
0
-1  
-2  
10  
10  
10  
※
No te s :  
1 . Z
 

JC

(t) =
 
2 . 4 3  
2 .
 
D

θ

u ty
 
F a c to r,
 
D = t

1

/t

2  

℃
/W M a x .  
0. 1  
3 . T  
– T  
=
P

DM

* Z
 

JC

(t)  
JM  
C
θ
0. 05  
0. 02  
0. 01  
P

DM  

t
1
t

2  

s in g le p u ls e  
-5  
-4  
-3  
-2  
-1  
0
1
10  
10  
10  
10  
10  
10  
10  
t

1

, S q uare W av e
 
P u ls e D uration [s ec ]  
Figure 11-2. Transient Thermal Response Curve  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
4

WGF12N60SE  
600V N-Channel MOSFET  
Gate Charge Test Circuit & Waveform  
V

GS  

Same Type  
50KΩ  
as DUT  
Q

g  

12V  
200nF  
10V  
300nF  
V

DS  

V

GS  

Q

gs  

Q

gd  

DUT  
3mA  
Charge  
Resistive Switching Test Circuit & Waveforms  
R

L  

V

DS  

V

DS  

90%  
V

DD  

V

GS  

R

G  

10%  
V

GS  

DUT  
10V  
t

d(on)  

t

r  

t

d(off)  

t

f  

t

off  

t

on  

Unclamped Inductive Switching Test Circuit & Waveforms  
L
BV

DSS  

2

——————–  
1
–
–
–
–  
E
=  
LI  
AS  
V

DS  

2
BV

DSS  

–
V

DD  

BV

DSS  

I

AS  

I

D  

R

G  

V

DD  

I

D

(t)  
V

DS

(t)  
V

DD  

DUT  
10V  
t

p  

t

p  

Time  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
5

WGF12N60SE  
600V N-Channel MOSFET  
Peak Diode Recovery dv/dt Test Circuit & Waveforms  
+
DUT  
V

DS  

I

SD  

L
Driver  
R

G  

Same Type  
as DUT  
V

DD  

V

GS  

• dv/dt controlled by R

G  

• I

SD

controlled by pulse period  
Gate Pulse Width  
————————–  
Gate Pulse Period  
D =  
V

GS  

10V  
( Driver  
)
I

FM

, Body Diode Forward Current  
I

SD  

di/dt  
( DUT )  
I

RM  

Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V

SD  

V

DS  

( DUT )  
V

DD  

Body Diode  
Forward Voltage Drop  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
6

WGF12N60SE  
600V N-Channel MOSFET  
Package Dimension  
TO-220F  
Unit: mm  
Size  
Size  
Size  
Max  
12.78 13.18  
Size  
Symbol  
Symbol  
Symbol  
Symbol  
Min  
Max  
Min  
Max  
Min  
Min  
Max  
W
9.96  
10.36  
W4  
L
L1  
L2  
0.25  
15.67  
6.48  
0.45  
16.07  
6.88  
L3  
T
T1  
T2  
T3  
G(Φ)  
0.45  
3.08  
0.60  
3.28  
W1  
W2  
W3  
2.54 (TYP)  
4.50  
2.34  
2.56  
4.90  
2.74  
2.96  
0.70  
1.24  
0.90  
1.47  
3.20  
3.40  
WildGoose Semiconductor
 
Rev. A1.0, 2018  
7