Winsok-Semicon-WSD30L40DN

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Winsok-Semicon-WSD30L40DN
WS
D30L40DN  
P
-Ch MOSFET  
General Description  
Product Summery  
The
WSD30L40DN
is the highest performance  
trench P-ch
 
MOSFETs with extreme high cell  
density ,
 
which provide excellent RDSON and  
gate charge
 
for most of the synchronous buck  
converter applications
 
.  
BVDSS  
RDSON  
1
1
m
Ω
 
ID  
-30V  
-4
0
A  
Applications  
The WSD30L40DN
 
meet the RoHS and Green  
Product requirement 100% EAS guaranteed  
with full
 
function reliability approved.  
z
High Frequency Point-of-Load Synchronous  
Buck Converter for MB/NB/UMPC/VGA  
z
Networking DC-DC Power System  
z
Load Switch  
Features  
z
Advanced high cell density Trench technology  
z
Super Low Gate Charge  
DFN
3
X
3
-8
Pin Configuration  
z
Excellent CdV/dt effect decline  
z
100% EAS Guaranteed  
z
Green Device Available  
Absolute Maximum Ratings  
Rating  
Symbol  
Parameter  
10s  
Steady State  
-30  
Units  
V
V

DS  

V

GS  

Drain-Source Voltage  
Gate-Sou
r
ce Voltage  
±
20  
-4
0  
V
I

D

@T

C

=25
℃  
I

D

@T

C

=100
℃  
I

D

@T

A

=25
℃  
I

D

@T

A

=70
℃  
I

DM  

Continuous Drain Current, V

GS

@ -10V

1  

Continuous Drain Current, V

GS

@ -10V

1  

Continuous Drain Current, V

GS

@ -10V

1  

Continuous Drain Current, V

GS

@ -10V

1  

Pulsed Drain Current

2  

A
–
25  
A
-1
4.5  
-1
0.5  
–
12  
A
–
9.8  
A
–
70  
81  
A
EAS  
Single Pulse Avalanche Energy

3  

mJ  
A
I

AS  

Avalanche Current  
Total Power Dissipation

4  

Total Power Dissipation

4  

–
18  
32.9  
P

D

@T

C

=25
℃  
P

D

@T

A

=25
℃  
T

STG  

W
W
℃
℃
3.6  
3.1  
Storage
T
e
mperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
T

J  

Thermal Data  
Symbol  
R

θ
JA  

Parameter  
Typ.  
—  
Max.  
Unit  
℃
/W  
℃
/W  
℃
/W  
Thermal Resistance Junction-Ambient

1  

Thermal Resistance Junction-Ambient

1

(t
≤
10s)  
Thermal Resistance Junction-Case

1  

75  
40  
R

θ
JA  

—  
3.8  
R

θ
JC  

—  
Page 1  
Dec.2014  

WS
D30L40DN  
P
-Ch MOSFET  
Electrical Characteristics (T

J

=25
℃
, unless otherwise noted)  
Symbol  
Parameter  
Conditions  
V

GS

=0V , I

D

=-250uA  
Min.  
-30  
—  
—  
—  
-1.
3
 
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
Typ.  
—  
Max.  
—  
Unit  
V
BV

DSS  

Drain-Source Breakdown Voltage  
BVDSS Temperature Coefficient  
△
BV

DSS

/△
T

J  

Reference to 25
℃
, I

D

=-1mA  
V

GS

=-10V , I

D

=-
2
0
A  
-0.0232  
11  
—  
V/
℃  
14  
R

DS(ON)  

Static Drain-Source On-Resistance

2  

m
Ω
 
18  
24  
V

GS

=-4.5V , I

D

=-
10
A  
V

GS(th)  

Gate Threshold Voltage  
-1.
8  
4.6  
—  
–
2.3  
—  
V
V

GS

=V

DS

, I

D

=-250uA  
△
V

GS(th)  

V

GS(th)

Temperature Coefficient  
mV/
℃  
V

DS

=-24V , V

GS

=0V , T

J

=25
℃  
V

DS

=-24V , V

GS

=0V , T

J

=55
℃  
-1  
I

DSS  

Drain-Source Leakage Current  
uA  
—  
-5  
V

GS

=
±
20V , V

DS

=0V  
I

GSS  

gfs  
Gate-Source Leakage Current  
Forward Transconductance  
Gate Resistance  
—  
±
100  
—  
nA  
S
15  
V

DS

=-5V , I

D

=-30A  
R

g  

V

DS

=0V , V

GS

=0V , f=1MHz  
9
—  
Ω
Q

g  

Total Gate Charge (-4.5V)  
Gate-Source Charge  
Gate-Drain Charge  
Turn-On Delay Time  
Rise Time  
30  
—  
1.2  
—  
V

DS

=-15V , V

GS

=-4.5V , I

D

=-
2
0
A  
nC  
ns  
Q

gs  

Q

gd  

T

d(on)  

T

r  

11  
11  
—  
—  
—  
—  
—  
—  
—  
—  
V

DD

=-15V , V

GS

=-10V , R

G

=
6
Ω  
I

D

=-1A
,R
L
=15Ω  
—  
11  
T

d(off)  

T

f  

Turn-Off Delay Time  
Fall Time  
—  
101  
60  
—  
—  
—  
C

iss  

C

oss  

C

rss  

Input Capacitance  
1380  
280  
217  
V

DS

=-15V , V

GS

=0V , f=1MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
—  
Guaranteed Avalanche Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
Typ.  
Max.  
Unit  
EAS  
Single Pulse Avalanche Energy

5  

V

DD

=-25V , L=0.
5
mH , I

AS

=-
18
A  
78  
—  
—  
mJ  
Diode Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
—  
Typ.  
—  
Max.  
–
20  
Unit  
A
I

S  

I

SM  

V

SD  

t

rr  

Continuous Source Current

1,6  

Pulsed Source Current

2,6  

Diode Forward Voltage

2  

Reverse Recovery Time  
Reverse Recovery Charge  
V

G

=V

D

=0V , Force Current  
–
70  
—  
—  
A
V

GS

=0V , I

S

=-1A , T

J

=25
℃  
—  
—  
—  
-1  
—  
—  
V
20  
8
nS  
nC  
I
F
=-
2
0
A
,
dI/dt=100A/µs
,
T

J

=25
℃  
Q

rr  

—  
Note :  
1.  
2
The data tested by surface mounted on a 1 inch
 
FR-4 board with 2OZ copper
,t
≦
10sec
.  
2.The data tested by pulsed , pulse width
 
≦
300us , duty cycle
 
≦
2%  
3.The EAS data shows Max. rating . The test condition is V

DD

=-25V,V

GS

=-10V,L=0.
5
mH,I

AS

=-
18
A  
4.The power dissipation is limited by 150
℃
junction temperature  
5.The Min. value is 100% EAS tested guarantee.  
6.The data is theoretically the same as I

D

and I

DM

, in real applications , should be limited by total power dissipation.  
Page
2  
Dec.2014  

WS
D30L40DN  
P
-Ch MOSFET  
Typical Characteristics  
150  
I
D
=-
20
A  
125  
100  
75  
50  
25  
0
V

GS

=-10V  
V

GS

=-7V  
V

GS

=-5V  
V

GS

=-4.5V  
V

GS

=-3V  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
-VDS ,
 
Drain-to-Source Voltage (V)  
Fig.2 On-Resistance vs. G-S Voltage  
Fig.1 Typical Output Characteristics  
12  
8
10  
8
V

DS

=-15V  
I

D

=-
2
0
A  
6
T =150  
T =25  
℃
J
℃
J
4
4
2
0
0
0.00  
0.25  
0.50  
0.75  
1.00  
0
9
18  
27  
36  
45  
-V

SD

, Source-to-Drain Voltage (V)  
Q

G

, Total Gate Charge (nC)  
Fig.4 Gate-Charge Characteristics  
Fig.3 Forward Characteristics of Reverse  
2.0  
1.5  
1.0  
0.5  
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
-50  
0
50  
100  
150  
T ,Junction
 
Temperature (  
)
℃
T ,
 
Junction Temperature (  
J
)
℃
J
Fig.5 Normalized V

GS(th)

vs. T

J  

Fig.6 Normalized R

DSON

vs. T

J  

Page
3  
Dec.2014  

WS
D30L40DN  
P
-Ch MOSFET  
1000.00  
100.00  
10.00  
1.00  
10000  
1000  
100  
F=1.0MHz  
Ciss  
10us  
100us  
1ms  
Coss  
Crss  
10ms  
100ms  
DC  
0.10  
T =25  
℃
C
Single Pulse  
0.01  
10  
0.1  
1
10  
100  
1
5
9
13  
17  
21  
25  
-V

DS

(V)  
-V

DS

, Drain to Source Voltage (V)  
Fig.7 Capacitance  
Fig.8 Safe Operating Area  
1
DUTY=0.5  
0.2  
0.1  
0.1  
0.01  
0.05  
0.02  
0.01  
P

DM  

S
I
NGLE PULSE  
T

ON  

T
D = T

ON

/T  
T

J

peak = T

C

+ P

DM

x R

θ
JC  

0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
t , Pulse Width (s)  
Fig.9 Normalized Maximum Transient Thermal Impedance  
Fig.10 Switching Time Waveform  
Fig.11 Unclamped Inductive Switching Waveform  
Page
4  
Dec.2014  

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of
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reliability,
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as
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Ͳ
support
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aircraft’s
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control
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result
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in
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serious
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Consult
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representative
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before
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in
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o
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Semiconductor
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adopt
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these
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When
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Specification”
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9,
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this
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provides
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information
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as
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of
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Sep.2014. Specifications
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and
ꢀ
information
ꢀ
herein
ꢀ
are
ꢀ
subject
ꢀ
to
ꢀ
change
ꢀ
without
ꢀ  
notice.
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