Winsok-Semicon-WSP4099

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Winsok-Semicon-WSP4099
WS
P
4099  
Dual
P
-Channel MOSFET  
Product Summery  
General Description  
The
WSP4099
is the highest performance  
trench P-ch
 
MOSFETs with extreme high  
cell density ,
 
which provide excellent  
RDSON and gate charge
 
for most of the  
synchronous buck converter
 
applications .  
BVDSS  
RDSON  
3
0
m
Ω
 
ID  
-40V  
–
6.5
A  
Applications  
The
WSP4099
meet the RoHS and Green  
Product requirement
 
, 100% EAS  
guaranteed with full
 
function reliability  
approved.  
z
High Frequency Point-of-Load Synchronous  
Buck Converter for MB/NB/UMPC/VGA  
z
Networking DC-DC Power System  
z
Load Switch  
Features  
SOP
–
8 Pin Configuration  
z
Advanced high cell density Trench technology  
z
Super Low Gate Charge  
z
Excellent CdV/dt effect decline  
z
100% EAS Guaranteed  
z
Green Device Available  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
-40  
Units  
V
V

DS  

Drain-Source Voltage  
Gate-Sou
r
ce Voltage  
Continuous Drain Current, -V

GS

@ -10V

1  

Continuous Drain Current, -V

GS

@ -10V

1  

Pulsed Drain Current

2  

V

GS  

I

D

@T

C

=25
℃  
I

D

@T

C

=100
℃  
I

DM  

±
20  
–
6.5  
–
4
.
5  
–
22  
V
A
A
A
EAS  
Single Pulse Avalanche Energy

3  

25  
mJ  
A
–
10  
I

AS  

Avalanche Current  
Total Power Dissipation

4  

W
℃
℃
2.0  
P

D

@T

C

=25
℃  
T

STG  

Storage
T
e
mperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
T

J  

Thermal Data  
Symbol  
R

θ
JA  

Parameter  
Typ.  
—  
Max.  
110  
50  
Unit  
℃
/W  
℃
/W  
Thermal Resistance Junction-Ambient

1  

Thermal Resistance Junction-Case

1  

R

θ
JC  

—  
Dec.2014  
Page 1  

WS
P
4099  
Dual
P
-Channel MOSFET  
Electrical Characteristics (T

J

=25
℃
, unless otherwise noted)  
Symbol  
Parameter  
Conditions  
V

GS

=0V , I

D

=-250uA  
Min.  
-40  
—  
Typ.  
—  
Max.  
Unit  
V
BV

DSS  

Drain-Source Breakdown Voltage  
BV

DSS

Temperature Coefficient  
—  
—  
△
BV

DSS

/△
T

J  

Reference to 25
℃
, I

D

=-1mA  
V

GS

=-10V , I

D

=-
6.5
A  
-0.02  
30  
V/
℃  
38  
—  
R

DS(ON)  

Static Drain-Source On-Resistance

2  

m
Ω
 
46  
62  
V

GS

=-4.5V , I

D

=-
4
.5
A  
—  
V

GS(th)  

Gate Threshold Voltage  
-1.
5  
—  
–
2.0  
3.72  
—  
-2.5  
—  
V
V

GS

=V

DS

, I

D

=-250uA  
△
V

GS(th)  

V

GS(th)

Temperature Coefficient  
V/
℃  
V

DS

=-32V , V

GS

=0V , T

J

=25
℃  
—  
1
I

DSS  

Drain-Source Leakage Current  
uA  
V

DS

=-32V , V

GS

=0V , T

J

=55
℃  

GS

=
±
20V , V

DS

=0V  
—  
—  
5
V
I

GSS  

gfs  
Gate-Source Leakage Current  
Forward Transconductance  
Total Gate Charge (-4.5V)  
Gate-Source Charge  
Gate-Drain Charge  
—  
—  
±
100  
—  
nA  
S
V

DS

=-5V , I

D

=-
4
A  
—  
8
Q

g  

—  
—  
7.5  
2.4  
3.5  
8.7  
7
V

DS

=-
20
V , V

GS

=-4.5V , I

D

=-
6.5
A  
nC  
Q

gs  

Q

gd  

T

d(on)  

T

r  

—  
—  
—  
—  
Turn-On Delay Time  
Rise Time  
—  
—  
V

DD

=-15V , V

GS

=-10V , R

G

=
6
Ω
,  
I

D

=-1A
,R
L
=20Ω  
—  
—  
ns  
T

d(off)  

T

f  

Turn-Off Delay Time  
Fall Time  
—  
31  
17  
—  
—  
—  
668  
98  
C

iss  

C

oss  

C

rss  

Input Capacitance  
—  
—  
V

DS

=-15V , V

GS

=0V , f=1MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
—  
—  
72  
—  
—  
Guaranteed Avalanche Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
Typ.  
Max.  
Unit  
EAS  
Single Pulse Avalanche Energy

5  

V

DD

=-25V , L=0.
5
mH , I

AS

=-
1
0A  
20  
—  
—  
mJ  
Diode Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
—  
Typ.  
—  
Max.  
Unit  
A
Continuous Source Current

1,6  

Pulsed Source Current

2,6  

Diode Forward Voltage

2  

–
2  
I

S  

V

G

=V

D

=0V , Force Current  
I

SM  

V

SD  

—  
—  
–
22  
A
V

GS

=0V , I

S

=-1A , T

J

=25
℃  
—  
—  
-1.
0  
V
Note :  
1.The data tested by surface mounted on a 1 inch

2

FR-4 board with 2OZ copper
,t<10sec
.  
2.The data tested by pulsed , pulse width
 
≦
300us , duty cycle
 
≦
2%  
3.
The EAS data shows Max. rating . The test condition is VDD=-25V,VGS=-10V,L=0.5mH,IAS=-10A  
4.The power dissipation is limited by 150
℃
junction temperature  
5.The Min. value is 100% EAS tested guarantee.  
6.The data is theoretically the same as I

D

and I

DM

, in real applications , should be limited by total power dissipation.  
Dec.2014  
Page 1  

WS
P
4099  
Dual
P
-Channel MOSFET  
Typical Characteristics  
5
5  
4
5  
3
5  
25  
12  
10  
I

D

=-
6.5
A  
V

GS

=-10V  
8
6
4
2
0
V

GS

=-7V  
V

GS

=-5V  
V

GS

=-4.5V  
V

GS

=-3V  
0
0.5  
1
1.5  
2
4
6
8
10  
-V

GS

(V)  
-V

D
S

, Drain-to-Source Voltage (V)  
Fig.2 On-Resistance v.s Gate-Source  
Fig.1 Typical Output Characteristics  
8
10  
V

DS

=-20V  
I

D

=-
6.5
A  
6
4
2
0
7.5  
5
T =150  
T =25  
℃
J
℃
J
2.5  
0
0.2  
0.4  
0.6  
0.8  
1
0
5
10  
15  
20  
25  
-V

SD

S
ource-to-Drain Voltage (V)  
Q

G

, Total Gate Charge (nC)  
Fig.4 Gate Charge Characteristics  
Fig.3 Forward Characteristics Of Reverse  
2.0  
1.5  
1.0  
0.5  
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
-50  
0
50  
100  
150  
T ,Junction
 
Temperature (  
J
)
℃
T

J

, Junction Temperature (
℃
)  
Fig.5 Normalized V

GS(th)

v.s T

J  

Fig.6 Normalized R

DSON

v.s T

J  

Dec.2014  
Page 1  

WS
P
4099  
Dual
P
-Channel MOSFET  
1
000  
3
00  
8
0  
100.00  
10.00  
1.00  
F=1.0
M
Hz  
Ciss  
100us  
1ms  
Coss  
Crss  
10ms  
100ms  
0.10  
DC  
Tc=25

o

C  
Single Pulse  
0.01  
10  
0.1  
1
10  
100  
1
5
9
13  
17  
21  
25  
-V

DS

(V)  
-V

DS

, Drain to Source Voltage(V)  
Fig.7 Capacitance  
Fig.8 Safe Operating Area  
1
DUTY=0.5  
0.2  
0.1  
0.1  
P

DM  

0.05  
0.02  
T

ON  

T
D =
T

ON

/T  
0.01  
T

Jpeak

=
T

C

+P

D
M

XR

θ
JC  

SINGLE  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
t , Pulse Width (s)  
Fig.9 Normalized Maximum Transient Thermal Impedance  
Fig.10 Switching Time Waveform  
Fig.11 Unclamped Inductive Waveform  
Dec.2014  
Page 1  

Attention
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1,
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Any
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all
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that
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can
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handle
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applications
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that
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require
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extremely
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high
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levels
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of
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reliability,
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such
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as
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life
Ͳ
support
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systems,
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aircraft’s
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control
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systems,
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or
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other
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whose
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failure
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can
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reasonably
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expected
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to
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result
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in
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serious
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physical
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and/or
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damage.
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Consult
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with
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your
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representative
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nearest
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you
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before
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o
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Semiconductor
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adopt
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so
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that
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these
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due
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improvement,etc.
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When
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refer
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to
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the
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“Delivery
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Specification”
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for
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Intend
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9,
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this
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as
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of
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Sep.2014. Specifications
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and
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information
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herein
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are
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subject
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to
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change
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notice.
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