Wuxi-China-Resources-Huajing-Microelectronics-CS3N90A3H1-G

Part #Wuxi-China-Resources-Huajing-Microelectronics-CS3N90A3H1-G
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Wuxi-China-Resources-Huajing-Microelectronics-CS3N90A3H1-G
Silicon N-Channel Power MOSFET  
CS3N90 A3H1-G  
R
○
General Description
:
 
V

DSS  

900  
3
V
A
CS3N90 A3H1-
G
,
t
he silicon N-channel Enhanced  
VDMOSFETs, is obtained by the self-aligned planar Technology  
which reduce the conduction loss, improve switching  
performance and enhance the avalanche energy. The transistor  
can be used in various power switching circuit for system  
miniaturization and higher efficiency. The package form is  
TO-251, which accords with the RoHS standard.  
Features
:
 
I

D  

P

D

(T

C

=25
℃
)  
R

DS(ON)Typ  

75  
5
W
Ω
Fast Switching  
Low ON Resistance(
Rdson≤5.5Ω
)  
Low Gate Charge
 
(
T
ypical Data:16nC
)  
Low Reverse transfer capacitances
(Typical:6.5pF)  
100% Single Pulse avalanche energy Test  
Applications
:  
Automotive
、
DC Motor Control and Class D Amplifier.  
Absolute
(
Tc= 25
℃
unless otherwise specified
)
:  
Parameter  
Symbol  
V

DSS  

Rating  
Units  
Drain-to-Source
V
o
ltage  
900  
V
A
Continuous Drain Current  
3
I

D  

Continuous Drain Current T

C

= 100 °C  
Pulsed Drain Current  
1.9  
A
a1  
12  
A
I

DM  

Gate-to-Source
V
o
ltage  
V

GS  

±30  
V
a2  
Single Pulse Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation  
125  
mJ  
V/ns  
W
E

AS  

a3  
5.0  
dv/dt  
75  
P

D  

Derating Factor above 25°C  
Operating Junction and Storage Temperature Range  
Maximum Temperature for Soldering  
0.6  
150
,
–
55 to 150  
300  
W/
℃  
℃
T

J

,
T

stg  

T

L  

℃
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CS3N90 A3H1-G  
R
○
Electrical Characteristics
(
Tc= 25
℃
unless otherwise specified
)
:  
OFF Characteristics  
Rating  
Typ.  
—  
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
900  
—  
Max.  
—  
V

GS

=0
V
,
I

D

=250µA  
Drain to Source Breakdown
V
o
ltage  
Bvdss Temperature Coefficient  
V
V

DSS  

ID=250uA,Reference25
℃
 
V/
℃
 
ΔBV

DSS

/ΔT

J  

0.61  
—  
—  
V

DS

= 900
V
,
V

GS

= 0
V
,  
T

a

= 25
℃  
—  
25  
V

DS

=720
V
,
V

GS

= 0
V
,  
Drain to Source Leakage Current  
µA  
I

DSS  

—  
—  
250  
T

a

= 125
℃  
V

GS

=+30V  
V

GS

=-30V  
Gate to Source Forward Leakage  
Gate to Source Reverse Leakage  
nA  
nA  
I

GSS(F)  

I

GSS(R)  

—  
—  
—  
—  
100  
-100  
ON Characteristics  
Rating  
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
—  
Typ. Max.  
V

GS

=10
V
,
I

D

=1.5A  
Drain-to-Source On-Resistance  
Gate Threshold
V
o
ltage  
R

DS(ON)  

V

GS(TH)  

5
5.5  
4.0  
Ω
V

DS

= V

GS

, I

D

= 250µA  
2.0  
V
Pulse width tp≤3
00µ
s,δ≤2%  
Dynamic Characteristics  
Rating  
Typ.  
5
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
Max.  
V

DS

=15
V
,
I

D

=3A  
f = 1.0MHz  
Forward Trans conductance  
Gate resistance  
g

fs  

—  
—  
S
R

g  

3.1  
Ω
Input Capacitance  
C

iss  

C

oss  

C

rss  

—  
—  
—  
630  
44  
—  
—  
—  
V

GS

= 0V V

DS

= 25V  
f = 1.0MHz  
Output Capacitance  
pF  
Reverse Transfer Capacitance  
6.5  
Resistive Switching Characteristics  
Rating  
Typ.  
13  
Parameter  
Test Conditions  
Symbol  
Units  
ns  
Min.  
—  
Max.  
—  
Turn-on Delay Time  
Rise Time  
t

d(ON)  

tr  
t

d(OFF)  

t

f  

—  
32  
—  
I

D

=3A  
V

DD

= 450V  
V

GS

= 10V
 
R

G

=25Ω  
Turn-Off Delay Time  
Fall Time  
—  
25  
—  
—  
40  
—  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain (“Miller”)Charge  
Q

g  

—  
16  
I

D

=3A V

DD

=450V  
V

GS

= 10V  
Q

gs  

Q

gd  

—  
4
—  
—  
nC  
—  
7
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CS3N90 A3H1-G  
R
○
Source-Drain Diode Characteristics  
Rating  
Typ.  
—  
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
—  
Max.  
3
Continuous Source Current (Body Diode)  
Maximum Pulsed Current (Body Diode)  
Diode Forward
V
o
ltage  
I

S  

A
A
I

SM  

V

SD  

trr  
—  
—  
12  
I

S

=3A,V

GS

=0V  
—  
—  
1.5  
V
Reverse Recovery Time  
I

S

=3A,T

j

= 25°C  
—  
820  
2.7  
ns  
µ
C  
dI

F

/dt=100A/us,  
V

GS

=0V  
Reverse Recovery Charge  
Qrr  
—  
Pulse width tp≤3
00µ
s,δ≤2%  
Parameter  
Max.  
1.67  
62.5  
Symbol  
Units  
Junction-to-Case  
R

θJC  

R

θJA  

℃
/W  
℃
/W  
Junction-to-Ambient  

a1

:
Repetitive rating; pulse width limited by maximum junction temperature  

a2

:
L=10.0mH, I

D

=4.9A, Start T

J

=25
℃  

a3

:
I

SD

=
3A,di/dt ≤100A/us,V

DD

≤BV

DS,

Start T

J

=25
℃  
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CS3N90 A3H1-G  
R
○
Characteristics Curve
:
 
80  
70  
60  
50  
40  
30  
20  
10  
0
0
25  
50  
75  
100  
125  
150  
TC , Case Temperature , C  
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CS3N90 A3H1-G  
R
○
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CS3N90 A3H1-G  
R
○
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CS3N90 A3H1-G  
R
○
T
e
st Circuit and Waveform  
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CS3N90 A3H1-G  
R
○
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CS3N90 A3H1-G  
R
○
Package Information  
V
a
lues(mm)  
Items  
MIN  
MAX  
A
6.30  
5.70  
0.70  
6.90  
2.10  
0.20  
0.30  
0.30  
0.50  
0.30  
0.70  
1.60  
0.25  
7.50  
5.10  
2.09  
6.90  
6.40  
1.30  
7.30  
2.50  
0.40  
0.50  
0.60  
0.70  
0.60  
1.00  
2.40  
0.45  
9.80  
5.50  
2.49  
B
B1  
B2  
C
C1  
C2  
D
E
F
G
H
H1  
L*  
M
N
*
:
adjustable  
TO-251 (251L-1)
Package  
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CS3N90 A3H1-G  
R
○
The name and content of poisonous and harmful material in products  
Hazardous Substance  
Part’s Name  
Pb  
≤
0.1%  
○
Hg  
≤
0.1%  
○
Cd  
≤
Cr(VI)  
PBB  
PBDE  
DIBP  
DEHP  
DBP  
BBP  
Limit  
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%  
0.01%  
○
Lead Frame  
Molding  
Chip  
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
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○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
Wire Bonding  
Solder  
○
○
○
×
○
○
○
:
Means the hazardous material is under the criterion of
2011/65/EU
.  
×
:
Means the hazardous material exceeds the criterion of
2011/65/EU
.  
Note  
The plumbum element of solder exist in products presently, but within the allowed range  
of Eurogroup’s RoHS.  
Warnings  
1.
Exceeding the maximum ratings of the device in performance may cause damage to the device,  
even the permanent failure, which may affect the dependability of the machine. It is suggested  
to be used under 80 percent of the maximum ratings of the device.  
2.
When installing the heatsink, please pay attention to the torsional moment and the smoothness  
of the heatsink.  
3.
VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect  
the device from being damaged by the static electricity when using it.  
4.
This publication is made by Huajing Microelectronics and subject to regular change without  
notice.  
WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD.  
Add
:
No.14 Liangxi RD. Wuxi, Jiangsu, China
 
Mail:214061  
Tel: +86 0510-85807228
 
Fax: +86- 0510-85800864  
Marketing Part
:  
Post
:
214061  
T
e
l
:
+86 0510-81805277/81805336  
Fax: +86
 
0510-85800360/85803016  
Application and Service
:
Post
:
214061
T
e
l
 
/ Fax
:
+86- 0510-81805243/81805110  
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