Wuxi-China-Resources-Huajing-Microelectronics-CS3N90A3H1-G
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Silicon N-Channel Power MOSFET
CS3N90 A3H1-G
R
○
General Description
:
V
DSS
900
3
V
A
CS3N90 A3H1-
G
,
t
he silicon N-channel Enhanced
VDMOSFETs, is obtained by the self-aligned planar Technology
which reduce the conduction loss, improve switching
performance and enhance the avalanche energy. The transistor
can be used in various power switching circuit for system
miniaturization and higher efficiency. The package form is
TO-251, which accords with the RoHS standard.
Features
:
I
D
P
D
(T
C
=25
℃
)
R
DS(ON)Typ
75
5
W
Ω
Fast Switching
Low ON Resistance(
Rdson≤5.5Ω
)
Low Gate Charge
(
T
ypical Data:16nC
)
Low Reverse transfer capacitances
(Typical:6.5pF)
100% Single Pulse avalanche energy Test
Applications
:
Automotive
、
DC Motor Control and Class D Amplifier.
Absolute
(
Tc= 25
℃
unless otherwise specified
)
:
Parameter
Symbol
V
DSS
Rating
Units
Drain-to-Source
V
o
ltage
900
V
A
Continuous Drain Current
3
I
D
Continuous Drain Current T
C
= 100 °C
Pulsed Drain Current
1.9
A
a1
12
A
I
DM
Gate-to-Source
V
o
ltage
V
GS
±30
V
a2
Single Pulse Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
125
mJ
V/ns
W
E
AS
a3
5.0
dv/dt
75
P
D
Derating Factor above 25°C
Operating Junction and Storage Temperature Range
Maximum Temperature for Soldering
0.6
150
,
–
55 to 150
300
W/
℃
℃
T
J
,
T
stg
T
L
℃
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CS3N90 A3H1-G
R
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Electrical Characteristics
(
Tc= 25
℃
unless otherwise specified
)
:
OFF Characteristics
Rating
Typ.
—
Parameter
Test Conditions
Symbol
Units
Min.
900
—
Max.
—
V
GS
=0
V
,
I
D
=250µA
Drain to Source Breakdown
V
o
ltage
Bvdss Temperature Coefficient
V
V
DSS
ID=250uA,Reference25
℃
V/
℃
ΔBV
DSS
/ΔT
J
0.61
—
—
V
DS
= 900
V
,
V
GS
= 0
V
,
T
a
= 25
℃
—
25
V
DS
=720
V
,
V
GS
= 0
V
,
Drain to Source Leakage Current
µA
I
DSS
—
—
250
T
a
= 125
℃
V
GS
=+30V
V
GS
=-30V
Gate to Source Forward Leakage
Gate to Source Reverse Leakage
nA
nA
I
GSS(F)
I
GSS(R)
—
—
—
—
100
-100
ON Characteristics
Rating
Parameter
Test Conditions
Symbol
Units
Min.
—
Typ. Max.
V
GS
=10
V
,
I
D
=1.5A
Drain-to-Source On-Resistance
Gate Threshold
V
o
ltage
R
DS(ON)
V
GS(TH)
5
5.5
4.0
Ω
V
DS
= V
GS
, I
D
= 250µA
2.0
V
Pulse width tp≤3
00µ
s,δ≤2%
Dynamic Characteristics
Rating
Typ.
5
Parameter
Test Conditions
Symbol
Units
Min.
Max.
V
DS
=15
V
,
I
D
=3A
f = 1.0MHz
Forward Trans conductance
Gate resistance
g
fs
—
—
S
R
g
3.1
Ω
Input Capacitance
C
iss
C
oss
C
rss
—
—
—
630
44
—
—
—
V
GS
= 0V V
DS
= 25V
f = 1.0MHz
Output Capacitance
pF
Reverse Transfer Capacitance
6.5
Resistive Switching Characteristics
Rating
Typ.
13
Parameter
Test Conditions
Symbol
Units
ns
Min.
—
Max.
—
Turn-on Delay Time
Rise Time
t
d(ON)
tr
t
d(OFF)
t
f
—
32
—
I
D
=3A
V
DD
= 450V
V
GS
= 10V
R
G
=25Ω
Turn-Off Delay Time
Fall Time
—
25
—
—
40
—
Total Gate Charge
Gate to Source Charge
Gate to Drain (“Miller”)Charge
Q
g
—
16
I
D
=3A V
DD
=450V
V
GS
= 10V
Q
gs
Q
gd
—
4
—
—
nC
—
7
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CS3N90 A3H1-G
R
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Source-Drain Diode Characteristics
Rating
Typ.
—
Parameter
Test Conditions
Symbol
Units
Min.
—
Max.
3
Continuous Source Current (Body Diode)
Maximum Pulsed Current (Body Diode)
Diode Forward
V
o
ltage
I
S
A
A
I
SM
V
SD
trr
—
—
12
I
S
=3A,V
GS
=0V
—
—
1.5
V
Reverse Recovery Time
I
S
=3A,T
j
= 25°C
—
820
2.7
ns
µ
C
dI
F
/dt=100A/us,
V
GS
=0V
Reverse Recovery Charge
Qrr
—
Pulse width tp≤3
00µ
s,δ≤2%
Parameter
Max.
1.67
62.5
Symbol
Units
Junction-to-Case
R
θJC
R
θJA
℃
/W
℃
/W
Junction-to-Ambient
a1
:
Repetitive rating; pulse width limited by maximum junction temperature
a2
:
L=10.0mH, I
D
=4.9A, Start T
J
=25
℃
a3
:
I
SD
=
3A,di/dt ≤100A/us,V
DD
≤BV
DS,
Start T
J
=25
℃
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R
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Characteristics Curve
:
80
70
60
50
40
30
20
10
0
0
25
50
75
100
125
150
TC , Case Temperature , C
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CS3N90 A3H1-G
R
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CS3N90 A3H1-G
R
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CS3N90 A3H1-G
R
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T
e
st Circuit and Waveform
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R
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CS3N90 A3H1-G
R
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Package Information
V
a
lues(mm)
Items
MIN
MAX
A
6.30
5.70
0.70
6.90
2.10
0.20
0.30
0.30
0.50
0.30
0.70
1.60
0.25
7.50
5.10
2.09
6.90
6.40
1.30
7.30
2.50
0.40
0.50
0.60
0.70
0.60
1.00
2.40
0.45
9.80
5.50
2.49
B
B1
B2
C
C1
C2
D
E
F
G
H
H1
L*
M
N
*
:
adjustable
TO-251 (251L-1)
Package
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CS3N90 A3H1-G
R
○
The name and content of poisonous and harmful material in products
Hazardous Substance
Part’s Name
Pb
≤
0.1%
○
Hg
≤
0.1%
○
Cd
≤
Cr(VI)
PBB
PBDE
DIBP
DEHP
DBP
BBP
Limit
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
0.01%
○
Lead Frame
Molding
Chip
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
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○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
Wire Bonding
Solder
○
○
○
×
○
○
○
:
Means the hazardous material is under the criterion of
2011/65/EU
.
×
:
Means the hazardous material exceeds the criterion of
2011/65/EU
.
Note
The plumbum element of solder exist in products presently, but within the allowed range
of Eurogroup’s RoHS.
Warnings
1.
Exceeding the maximum ratings of the device in performance may cause damage to the device,
even the permanent failure, which may affect the dependability of the machine. It is suggested
to be used under 80 percent of the maximum ratings of the device.
2.
When installing the heatsink, please pay attention to the torsional moment and the smoothness
of the heatsink.
3.
VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect
the device from being damaged by the static electricity when using it.
4.
This publication is made by Huajing Microelectronics and subject to regular change without
notice.
WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD.
Add
:
No.14 Liangxi RD. Wuxi, Jiangsu, China
Mail:214061
Tel: +86 0510-85807228
Fax: +86- 0510-85800864
Marketing Part
:
Post
:
214061
T
e
l
:
+86 0510-81805277/81805336
Fax: +86
0510-85800360/85803016
Application and Service
:
Post
:
214061
T
e
l
/ Fax
:
+86- 0510-81805243/81805110
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