Wuxi-China-Resources-Huajing-Microelectronics-HGE055NE4A

Part #Wuxi-China-Resources-Huajing-Microelectronics-HGE055NE4A
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Wuxi-China-Resources-Huajing-Microelectronics-HGE055NE4A
Silicon N-Channel Power MOSFET  
HGE055NE4A  
R
○
General Description
:
 
V

DSS  

45  
18  
V
A
HGE055NE4A, the silicon N-channel Enhanced  
VDMOSFETs, is obtained by the high density Trench technology  
which reduce the conduction loss, improve switching  
performance and enhance the avalanche energy. The transistor  
can be used in various power switching circuit for system  
miniaturization and higher efficiency. The package form is SOP8,  
which accords with the RoHS standard.  
I

D  

P

D

(T

a

=25
℃
)  
R

DS(ON) Typ@Vgs=10V  

R

DS(ON) Typ@Vgs=4.5V  

3.1  
4.4  
6.5  
W
m
Ω
 
m
Ω  
Features
:
 
l
Fast Switching  
l
Low ON Resistance
(
Rdso
n
≤
5.5  
m
Ω
)  
l
Low Gate Charge  
l
Low Reverse transfer capacitances  
l
100% Single Pulse avalanche energy
T
e
st  
Applications
:  
l
l
Power switch circuit of adaptor and charger.  
Synchronus Rectification in DC/DC Converters  
Absolute
(
T
a
= 25
℃
unless otherwise specified
)
:  
Parameter  
Symbol  
V

DSS  

Rating  
Units  
Drain-to-Source
V
o
ltage  
45  
V
A
Continuous Drain Current  
18  
I

D  

Continuous Drain Current T

C

= 100
°
C  
Pulsed Drain Current  
11.9  
A
a1  
72  
±
18  
A
I

DM  

Gate-to-Source
V
o
ltage  
V

GS  

V
a2  
Single Pulse Avalanche Energy  
Power Dissipation  
115.5  
mJ  
W
℃
E

AS  

3.1  
P

D  

Operating Junction and Storage Temperature Range  
T

J

,
T

stg  

150
,
–
55 to 150  
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age 1 of 10  
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HGE055NE4A  
R
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Electrical Characteristics
(
T
a
= 25
℃
unless otherwise specified
)
:  
OFF Characteristics  
Rating  
Typ.  
—  
Symbol  
V

DSS  

Parameter  
Test Conditions  
Units  
Min.  
45  
Max.  
—  
V

GS

=0
V
,
I

D

=250
µ
A  
Drain to Source Breakdown
V
o
ltage  
V
V

DS

=450
V
,
V

GS

= 0
V
,  
T
A
= 25
℃
 
V

DS

=36
V
,
V

GS

= 0
V
,  
—  
—  
—  
1
Drain to Source Leakage Current  
µ
A  
I

DSS  

—  
100  
T

A

= 125
℃  
V

GS

=+18V  
V

GS

=-18V  
Gate to Source Forward Leakage  
Gate to Source Reverse Leakage  
nA  
nA  
I

GSS(F)  

I

GSS(R)  

—  
—  
—  
—  
100  
-100  
ON Characteristics  
Rating  
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
—  
Typ. Max.  
V

GS

=10
V
,
I

D

=18A  
4.4  
6.5  
5.5  
8.2  
m
Ω  
m
Ω  
V
Drain-to-Source On-Resistance  
Gate Threshold
V
o
ltage  
R

DS(ON)  

V

GS(TH)  

V

GS

=4.5
V
,
I

D

=14A  
V

DS

= V

GS

, I

D

= 250
µ
A  
—  
1.0 1.75 2.5  
Pulse width tp
≤
300
µ
s,
δ≤
2%  
Dynamic Characteristics  
Rating  
Parameter  
Test Conditions  
Symbol  
Units  
Min.  
—  
Typ.  
2
Max.  
—  
f=1MHz  
Gate resistance  
R

g  

Ω
Input Capacitance  
C

iss  

C

oss  

C

rss  

—  
—  
1156  
493  
32  
V

GS

= 0V V

DS

= 25V  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
—  
—  
pF  
—  
—  
Resistive Switching Characteristics  
Rating  
Parameter  
Test Conditions  
Symbol  
Units  
ns  
Min. Typ. Max.  
Turn-on Delay Time  
Rise Time  
t

d(ON)  

tr  
t

d(OFF)  

t

f  

—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
10.4  
6
V

DD

=25
V
,
I

D

= 19A,  
V

G

=10 V R

G

= 3
Ω  
Turn-Off Delay Time  
Fall Time  
30.8  
6.4  
24  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain (
“
Miller
”
)Charge  
Q

g  

V

GS

=10
V
,
V

DD

=25
V
,  
I

D

=19A  
Q

gs  

Q

gd  

3.2  
6.7  
nC  
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age 2 of 10  
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HGE055NE4A  
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○
Source-Drain Diode Characteristics  
Rating  
Test  
Conditions  
Parameter  
Symbol  
Units  
Min. Typ. Max.  
Continuous Source Current (Body Diode)  
Maximum Pulsed Current (Body Diode)  
Diode Forward
V
o
ltage  
I

S  

—  
—  
—  
—  
—  
—  
—  
18  
72  
A
A
T

C

= 25
°
C  
I

SM  

V

SD  

trr  
I

S

=18A,V

GS

=0V  
—  
1.2  
V
Reverse Recovery Time  
41.9  
40  
ns  
nC  
di/dt=100A/us  
IF=20A  
Reverse Recovery Charge  
Qrr  
Pulse width tp
≤
300
µ
s,
δ≤
2%  
Parameter  
Max.  
40  
Symbol  
Units  
Junction-to-Ambient  
R
℃
/W  

θ

JA  
Notes
:  

a1

:
Repetitive rating; pulse width limited by maximum junction temperature  

a2

:
L=0.5mH, I

D

=21.5A, Start T

J

=25
℃  

a3

:
Recommend soldering temperature defined by IPC/JEDEC J-STD 020  
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HGE055NE4A  
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○
Characteristics Curve
:
 
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age 4 of 10  
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HGE055NE4A  
R
○
100  
10  
100  
Note:  
1.V

DS

=5V  
2.250us Pulse Test  
10  
1
Tj=150
℃
 
Tj=150
℃  
1
Tj=25
℃  
Tj=25
℃  
0.1  
0.01  
0.1  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1
1.5  
2
2.5  
3
3.5  
4
V

SD  

,
Source-to-Drain Voltage[V]  
V

GS

,Gate-to-Source Voltage[V]  
Figure 7 Typical
 
Body Diode Transfer  
Characteristics  
Figure 6 Typical
 
Transfer Characteristics  
8.0  
1.8  
1.6  
1.4  
1.2  
1
PULSED TEST  
T = 25
℃
 
j
VGS=10V  
ID=18A  
7.0  
6.0  
5.0  
4.0  
3.0  
2.0  
VGS=4.5V  
ID=14A  
V

GS

= 4.5V  
0.8  
0.6  
0.4  
0.2  
V

GS

= 10V  
0
5
10  
15  
20  
0
-50  
0
50  
100  
150  
I

D

,Drain Current,A  
T

J

,Junction Temperature(  
℃
)
Figure 9. Normalized On Resistance vs  
Junction Temperature  
Figure 8. Drain-to-Source On Resistance vs  
Drain Current  
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age 5 of 10  
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HGE055NE4A  
R
○
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age 6 of 10  
2019V01  

HGE055NE4A  
R
○
T
e
st Circuit and Waveform  
Figure 14. Gate Charge Test Circuit  
Figure 15. Gate Charge
W
a
veforms  
Figure 16. Resistive Switching Test Circuit  
Figure 17. Resistive Switching Waveforms  
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age 7 of 10  
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HGE055NE4A  
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○
Figure 18. Diode Reverse Recovery Test Circuit  
Figure 19. Diode Reverse Recovery Waveform  
Figure20.Unclamped Inductive Switching Test Circuit  
Figure21.Unclamped Inductive Switching
W
a
veform  
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age 8 of 10  
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HGE055NE4A  
R
○
Package Information
:  
D
c
L
b
e
V
a
lues(mm)  
Items  
MIN  
1.30  
MAX  
1.80  
A
A1  
A2  
E
0.10  
1.30  
5.80  
3.80  
4.80  
0.40  
0.25  
1.50  
6.20  
4.00  
5.00  
0.90  
E1  
D
L
e
1.27 TYP  
0.20 TYP  
b
0.37  
0.47  
c
0
°  
8
°  
θ
3  
SOP8
Package  
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2019V01  

HGE055NE4A  
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○
The name and content of poisonous and harmful material in products  
Hazardous Substance  
Part
’
s Name  
Pb  
≤
Hg  
≤
Cd  
≤
Cr(VI)  
PBB  
PBDE  
DIBP  
DEHP  
DBP  
BBP  
Limit  
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%
≤
0.1%  
0.1%  
○
○
○
○
×
0.1%  
○
○
○
○
○
0.01%  
○
Lead Frame  
Molding  
Chip  
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
○
Wire Bonding  
Solder  
○
○
○
:
Means the hazardous material is under the criterion of
2011/65/EU
.  
×
:
Means the hazardous material exceeds the criterion of
2011/65/EU
.  
Note  
The plumbum element of solder exist in products presently, but within the allowed range  
of Eurogroup
’
s RoHS.  
Warnings  
1.
Exceeding the maximum ratings of the device in performance may cause damage to the device,  
even the permanent failure, which may affect the dependability of the machine. It is suggested  
to be used under 80 percent of the maximum ratings of the device.  
2.
When installing the heat sink, please pay attention to the torsional moment and the smoothness  
of the heat sink.  
3.
VDMOSFETs is the device which is sensitive to the static electricity, it is necessary to protect  
the device from being damaged by the static electricity when using it.  
4.
This publication is made by Huajing Microelectronics and subject to regular change without  
notice.  
WUXI CHINA RESOURCES HUAJING MICROELECTRONICS CO., LTD.  
Add
:
No.14 Liangxi RD. Wuxi, Jiangsu, China
 
Mail:214061  
H
T
U
UTH  
Tel: +86 0510-85807228
 
Fax: +86- 0510-85800864  
Marketing Part
:  
Post
:
214061  
Tel
:
+86 0510-81805277/81805336  
Fax: +86
 
0510-85800360/85803016  
Application and Service
:
Post
:
214061
T
el
 
/ Fax
:
+86- 0510-81805243/81805110  
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age 10 of 10  
2019V01