WUXI-UNIGROUP-MICRO-TTD20N04AT

Part #WUXI-UNIGROUP-MICRO-TTD20N04AT
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WUXI-UNIGROUP-MICRO-TTD20N04AT
TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
40V N-Channel Trench MOSFET(Preliminary)  
General Description  
Product Summary  
Trench Power technology  
Low R

DS(ON)  

V

DS  

40V  
I

D

(at V

GS

=10V)  
20A  
Low Gate Charge  
R

DS(ON)

(at V

GS

=10V)  
R

DS(ON)

(at V

GS

=4.5V)  
<23m
Ω  
<28m
Ω  
Optimized for
 
fast-switching applications  
Applications  
100% UIS Tested  
Synchronous Rectification
 
in DC/DC and AC/DC Converters  
Isolated DC/DC Converters in Telecom and Industrial  
TO-252  
Part Number  
Package Type  
Form  
Marking  
TTD20N04AT  
TO-252  
Tape&Reel  
TTD20N04AT  
Absolute Maximum Ratings (T

A

=25ºC unless otherwise noted)  
Parameter  
Symbol  
V

DS  

Maximum  
40  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
V
V
V

GS  

±
20  
T

C

=25ºC  
20  
17  
B
Continuous Drain Current  
I

D  

A
T

C

=100ºC  
A
Pulsed Drain Current  
I

DM  

I

AS  

60  
13  
A
A
A
Avalanche Current  
A
Single Pulse Avalanche Energy  
L =0.3mH  
T

C

=25ºC  
E

AS  

25  
mJ  
W
W
ºC  
28.8  
C
Power Dissipation  
P

D  

T

C

=100ºC  
14.4  
Junction and Storage Temperature Range  
Thermal Characteristics  
Parameter  
T

J

, T

STG  

-55 to
 
175  
Symbol  
R

Ɵ
JC  

Maximum  
5.2  
Units  
Maximum Junction-to-Case  
Steady-State  
Steady-State  
ºC /W  
Maximum Junction-to-Ambient  
R

Ɵ
JA  

100  
V1.0  
1

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
Electrical Characteristics(T

J

=25ºC unless otherwise noted)  
Value  
Typ  
Symbol  
Parameter  
Conditions  
Units  
Min  
Max  
STATIC PARAMETERS  
BV

DSS

Drain-Source Breakdown Voltage  
I

D

=250µA,V

GS

=0V  
V

DS

=40V, V

GS

=0V  
40  
V
T

J

=25ºC  
1
I

DSS  

Zero Gate Voltage Drain Current  
μA  
T

J

=125ºC  
100  
I

GSS  

Gate-Body Leakage
 
Current  
Gate Threshold
 
Voltage  
V

DS

=0V, V

GS

=
±
20V  
V

DS

=V

GS

, I

D

=250µA  
V

GS

=10V, I

D

=20A  
V

GS

=4.5V, I

D

=16A  
V

DS

=5V, I

D

=20A  
±
100  
2
nA  
V
V

GS(th)  

1
1.4  
18  
23  
mΩ  
mΩ  
S
R

DS(ON)  

Static Drain-Source On-Resistance  
21.5  
19  
28  
g

FS  

V

SD  

I

S  

Forward Transconductance  
Diode Forward Voltage  
I

S

=20A, V

GS

=0V  
1
V
B
Maximum Body-Diode Continuous Current  
20  
A
DYNAMIC PARAMETERS  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
659  
70  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
V

GS

=0V, V

DS

=20V, f =1MH

Z  

pF  
62  
f =1MH

Z  

1.2  
Ω
SWITCHING PARAMETERS  
Q

g

(10V)  
Q

g

(4.5V)  
Q

gs  

Total Gate Charge  
16.7  
9
Total Gate Charge  
V

GS

=10V,V

DS

=20V, I

D

=20A  
nC  
ns  
Gate Source Charge  
1.9  
4.5  
31  
Q

gd  

Gate Drain Charge  
t

D(on)  

t

r  

T

D(off)  

t

f  

Turn-On Delay Time  
Turn-On Rise Time  
3.6  
46  
V

GS

=10V,V

DS

=20
V
,
I

D

=20A,  
R

G

=1.8
Ω  
Turn-Off Delay Time  
Turn-Off Fall Time  
2.8  
18.3  
4
t

rr  

Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
I

F

=20A, di/dt =100A/μs  
Q

rr  

nC  
A. Single
 
pulse width limited by maximum junction temperature.  
B. The
 
maximum current rating is package limited.  
C. The power dissipation P

D

is based on T

J(MAX)

=175ºC , using junction-to-case thermal resistance, and is more useful in setting  
the upper dissipation limit for cases where additional heatsinking is used.  
V1.0  
2

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
V

DS

(Volts)  
V

GS

(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
I

D

(A)  
V

DS

(Volts)  
Figure 3: On-Resistance vs. Drain Current  
Figure 4: Capacitance Characteristics  
Q

g

(nC)  
V

SD

(Volts)  
Figure 5: Gate Charge Characteristics  
Figure 6: Body Diode Forward Voltage  
V1.0  
3

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
Temperature(ºC)  
Temperature(ºC)  
Figure 7: On-Resistance vs. Junction Temperature  
Figure 8: Vgs(th)
 
vs. Junction Temperature  
Temperature(ºC)  
V

GS

(Volts)  
Figure 9: BV

DSS

vs. Junction Temperature  
Figure 10: On-Resistance vs. Gate-Source Voltage  
Pulse Width (s)  
V

DS

(Volts)  
Figure 11: Normalized Transient
 
Thermal Resistance  
Figure 12: Safe Operating Area  
V1.0  
4

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
Figure A
:
Gate Charge Test Circuit and Waveforms  
Figure B
:
Resistive Switching Test Circuit and Waveforms  
Figure C
:
Unclamped Inductive Switching (UIS) Test Circuit and Waveforms  
V1.0  
5

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
TO-252(
集佳
)  
V1.0  
6
6

TTD20N04
A
T  
Wuxi Unigroup Microelectronics CO.,LTD.  
Disclaimer  
All product specifications and data are subject to change without notice.  
For documents and material available from this datasheet, Wuxi Unigroup does not warrant or assume  
any legal liability or responsibility for the accuracy, completeness of any product or technology  
disclosed hereunder.  
No license, express or implied, by estoppels or otherwise, to any intellectual property rights is granted  
by this document or by any conduct of Wuxi Unigroup.  
The products shown herein are not designed for use in medical, life-saving, or life-sustaining  
applications. Customers using or selling Wuxi Unigroup products not expressly indicated for use in  
such applications do so entirely at their own risk and agree to fully indemnify Wuxi Unigroup for any  
damages arising or resulting from such use or sale.  
Wuxi Unigroup disclaims any and all liability arising out of the use or application of any product  
described herein or of any information provided herein to the maximum extent permitted by law. The  
product specifications do not expand or otherwise modify Wuxi
Unigroup’s
terms and conditions of  
purchase, including but not limited to the warranty expressed therein, which apply to these products.  
Wuxi Unigroup Microelectronics CO., LTD. strives to supply high-quality high-reliability products.  
However, any and all semiconductor products fail with some probability. It is possible that these  
probabilistic failures could give rise to accidents or events that could endanger human lives that could  
give rise to smoke or fire, or that could cause damage to other property. When designing equipment,  
adopt safety measures so that these kinds of accidents or events cannot occur. Such measures  
include but are not limited to protective circuits and error prevention circuits for safe design, redundant  
design, and structural design.  
In the event that any or all Wuxi Unigroup products (including technical data, services) described or  
contained herein are controlled under any of applicable local export control laws and regulations, such  
products must not be exported without obtaining the export license from the authorities concerned in  
accordance with the above law.  
Information (including circuit diagrams and circuit parameters) herein is for example only. It is not  
guaranteed for volume production. Wuxi Unigroup believes information herein is accurate and reliable,  
but no guarantees are made or implied regarding its use or any infringements of intellectual property  
rights or other rights of third parties.  
V1.0  
7